Number of records found: 849
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Gijbels R, van Grieken R (1985) Trace element geochemistry in thermal waters from the Eastern Pyrenees. S.l
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Adams F, Gijbels R, Van Grieken R, Dachang Z (1993) Inorganic mass spectrometry. Fudan University Press, Shanghai, 391 p
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“Inorganic mass spectrometry”. Adams F, Gijbels R, Van Grieken R Wiley, Chichester, page 404 p. (1988).
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“Art 2002 : 7th International Conference on Non-destructive Testing and Microanalysisfor the Diagnostics and Conservation of the Cultural and Environmental Heritage, 2-6 June 2002, Congress Centre Elzenveld, Antwerp, Belgium”. Van Grieken R, Janssens K, Van 't dack L, Meersman G page 780 p. (2002).
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Van Grieken R, Janssens K (2005) Cultural heritage conservation and environmental impact assessment by non-destructive testing and micro-analysis. 336 p
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“High-resolution X-ray fluorescence micro-tomography on single sediment particles”. Vincze L, Vekemans B, Szalóki I, Janssens K, Van Grieken R, Feng H, Jones KW, Adams F page 240 (2002).
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“Introduction and overview”. Janssens K, Van Grieken R page 1 (2004).
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“Non-destructive micoranalysis of cultural heritage materials”. Janssens K, Van Grieken R page 800 p. (2004).
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“Novel quantitative procedures for in-situ X-ray fluorescence analysis”. Van Grieken R, Janssens K, van Espen P, Injuk J, Padilla R, Vittiglio G, Potgieter JH page 45 (2005).
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“Novel quantitative procedures for in-situ X-ray fluorescence analysis”. Injuk J, Janssens K, van Espen P, Van Grieken R, (2001)
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“Preface”. Van Grieken R, Janssens K page vii-viii (2005).
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“Preface”. Janssens K, Van Grieken R page xxvii-xxviii (2004).
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“Risks of atmospheric aerosol for cultural heritage assets in Granada (Spain)”. Cardell C, Urosevic M, Sebastián-Pardo E, Horemans B, Kontozova-Deutsch V, Potgieter-Vermaak S, Bencs L, Anaf KW, De Wael K, Van Grieken R page 45 (2013).
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“Aerosol composition studies using accelerator proton bombardment”. Van Grieken R, (1974)
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“Air pollution and preventive conservation in some European museums”. Van Grieken R, , 19 (2014)
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“Analisis cuantitativo sin estandares de particulas individuales mediante microsonda de electrones”. Trincavelli JC, Van Grieken R page 273 (1996).
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Van Grieken R (1973) Analyse van ferro-metalen door activering met 14 MeV neutronen. 128 p
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“Analysis of heterogeneous CaCO3-CaSO4 single particles using ultra-thin window EPMA”. Ro C-U, Oh K-Y, Van Grieken RE, (2000)
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“Analysis of individual environmental particles using ultra-thin window EPXMA”. Ro C-U, Osán J, Van Grieken R, (1998)
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“Analytical electron microscopy of single particles”. Markowicz A, Raeymaekers B, Van Grieken R, Adams F page 173 (1986).
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“Analytical methods to study atmospheric pollution and weathering of materials”. Van Grieken R, Cardell C, Delalieux F, Eyckmans K page 163 (2001).
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Van Grieken R, Hoste J (1972) Annotated bibliography on 14 MeV neutron activation analysis. 293 p
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“Anorganische sporenanalyse voor milieuonderzoek”. Van Grieken R, (1986)
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“Application of combined SEM/EDX and μ-Raman approaches for the chemical and structural characterisation of fine particulates”. de Maeyer-Worobiec A, Stefaniak EA, Brooker A, Van Grieken R, (2007)
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“Application of laser microprobe mass analysis (LAMMA) to problems in nephrology”. Verbueken AH, Van de Vyver FL, Visser WJ, de Broe ME, Van Grieken RE page 987 (1986).
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“Application of light beams with non-zero angular momentum in optical study of micrometer-size aerosol particles”. Bekshaev A, Kontush S, Popov A, Van Grieken R, , 288 (2001). http://doi.org/10.1117/12.428282
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“Application of proton induced X-ray emission analysis to the St. Louis regional air pollution study”. Akselsson R, Orsini C, Meinert DL, Johansson TB, Van Grieken RE, Kaufmann HC, Chapman KR, Nelson JW, Winchester JW, (1976)
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“Assessment of air pollutant levels in some European museums and churches”. Kontozova V, Spolnik Z, Worobiec A, Godoi R, Van Grieken R, Deutsch F, Bencs L page 245 (2005).
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Van Grieken R, Delalieux F, Potgieter S (2003) Assessment of damage caused by air pollution. 35 p
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“Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis”. Ro C-U, Hoornaert S, Van Grieken R page 17 (2002).
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