Number of records found: 157
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Citations
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Magnetoplasma excitations in vertically coupled quantum dot systems”. Partoens B, Matulis A, Peeters FM, Materials science forum 297/298, 225 (1999)
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Martensitic transformations and microstructures in splat-cooled Ni-Al”. Schryvers D, Holland-Moritz D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 273/275, 697 (1999). http://doi.org/10.1016/S0921-5093(99)00399-8
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Influence of laser and isothermal treatments on microstructural properties of SnO2 films”. Rembeza ES, Richard O, van Landuyt J, Materials research bulletin 34, 1527 (1999). http://doi.org/10.1016/S0025-5408(99)00188-9
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Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation”. van Vaeck L, Adriaens A, Gijbels R, Mass spectrometry reviews 18, 1 (1999)
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Single particle characterisation of inorganic and organic North Sea suspension”. Jambers W, Dekov V, Van Grieken R, Marine chemistry 67, 17 (1999). http://doi.org/10.1016/S0304-4203(99)00046-8
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Crystalline structure of very hard tungsten carbide thin films obtained by reactive pulsed laser deposition”. Mihailescu IN, Gyorgy E, Marin G, Popescu M, Teodorescu VS, van Landuyt J, Grivas C, Hatziapostolou A, Journal of vacuum science and technology: A: vacuum surfaces and films 17, 249 (1999). http://doi.org/10.1116/1.581579
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Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals”. Verlinden G, Gijbels R, Geuens I, Journal of the American Society for Mass Spectrometry 10, 1016 (1999). http://doi.org/10.1016/S1044-0305(99)00064-1
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Anion ordering in fluorinated La2CuO4”. Abakumov AM, Hadermann J, Van Tendeloo G, Shpanchenko RV, Oleinikov PN, Antipov EV, Journal of solid state chemistry 142, 311 (1999). http://doi.org/10.1006/jssc.1998.8064
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Structural determination of the charge ordering process in Nd0.5Ca0.5Mn1-xCrxO3 manganites”. Schuddinck W, Van Tendeloo G, Barnabé, A, Hervieu M, Raveau B, Journal of solid state chemistry 148, 333 (1999). http://doi.org/10.1006/jssc.1999.8457
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Structural transformations in the fluorinated T* phase”. Hadermann J, Abakumov AM, Lebedev OI, Van Tendeloo G, Rozova MG, Shpanchenko RV, Pavljuk BP, Kopnin EM, Antipov EV, Journal of solid state chemistry 147, 647 (1999). http://doi.org/10.1006/jssc.1999.8438
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Electron microprobe analysis of suspended matter in the Angola Basin”. Bernard P, Eisma D, Van Grieken R, Journal of sea research 41, 19 (1999). http://doi.org/10.1016/S1385-1101(98)00043-4
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Single particle analysis of suspended matter in the Makasar Strait and Flores Sea with particular reference to tin-bearing particles”. Dekov VM, van Put A, Eisma D, Van Grieken R, Journal of sea research 41, 35 (1999). http://doi.org/10.1016/S1385-1101(98)00035-5
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Non monotonic behavior of the energy levels of quantum wells with a large mass mismatch in the presence of an in-plane magnetic field”. de Meester RHJ, Peeters FM, Journal of physics : condensed matter 11, 6207 (1999)
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Preparation of nanocrystalline titania powder via aerosol pyrolysis of titanium tetrabutoxide”. Ahonen PP, Kauppinen EI, Joubert JC, Deschanvres JL, Van Tendeloo G, Journal of materials research 14, 3938 (1999). http://doi.org/10.1557/JMR.1999.0533
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Zr substituted bismuth uranate”. Vannier R-N, Théry O, Kinowski C, Huvé, M, Van Tendeloo G, Suard E, Abraham F, Journal of materials chemistry 9, 435 (1999). http://doi.org/10.1039/a805829f
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Microstructure and phase transitions in Pb(Sc0.5Ta0.5)O3”. Lemmens H, Richard O, Van Tendeloo G, Bismayer U, Journal of electron microscopy 48, 843 (1999). http://doi.org/10.1093/oxfordjournals.jmicro.a023756
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Microstructure of tough polycrystalline natural diamond”. Chen JH, Van Tendeloo G, Journal of electron microscopy 48, 121 (1999). http://doi.org/10.1093/oxfordjournals.jmicro.a023658
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Growth of pure and doped Rb2ZnCl4and K2ZnCl4 single crystals by Czochralski technique”. Stefan M, Nistor SV, Mateescu DC, Abakumov AM, Journal of crystal growth 200, 148 (1999). http://doi.org/10.1016/S0022-0248(98)01247-0
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Multiply twinned C60 and C70 nanoparticles”. Pauwels B, Bernaerts D, Amelinckx S, Van Tendeloo G, Joutsensaari J, Kauppinen EI, Journal of crystal growth 200, 126 (1999). http://doi.org/10.1016/S0022-0248(98)01285-8
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Trace-level microanalysis of Roman glass from Khirbet Qumran, Israel”. Aerts A, Janssens K, Adams F, Journal of archaeological science 26, 883 (1999). http://doi.org/10.1006/JASC.1999.0397
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Distribution of fields and charge carriers in cylindrical nanosize silicon-based metal-oxide-semiconductor structures”. Pokatilov EP, Fomin VM, Balaban SN, Gladilin VN, Klimin SN, Devreese JT, Magnus W, Schoenmaker W, Collaert N, van Rossum M, de Meyer K, Journal Of Applied Physics 85, 6625 (1999). http://doi.org/10.1063/1.370171
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High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructurs”. Buschmann V, Rodewald M, Fuess H, Van Tendeloo G, Schäffer C, Journal of applied physics 85, 2119 (1999). http://doi.org/10.1063/1.369512
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Modeling of ionization of argon in an analytical capacitively coupled radio-frequency glow discharge”. Bogaerts A, Yan M, Gijbels R, Goedheer W, Journal of applied physics 86, 2990 (1999). http://doi.org/10.1063/1.371159
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Role of Ar2+ and Ar+2 ions in a direct current argon glow discharge: a numerical description”. Bogaerts A, Gijbels R, Journal of applied physics 86, 4124 (1999). http://doi.org/10.1063/1.371337
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Analyses of petrified wood by electron, X-ray and optical microprobes”. Kuczumov A, Vekemans B, Schalm O, Dorriné, W, Chevallier P, Dillmann P, Ro C-U, Janssens K, Van Grieken R, Journal of analytical atomic spectroscopy 14, 435 (1999). http://doi.org/10.1039/A806748A
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Compositional distinctions between 16th century “Façon-de-Venise&rdquo, and Venetian glass vessels, excavated in Antwerp, Belgium”. Deraedt I, Janssens K, Veeckman J, Journal of analytical atomic spectroscopy 14, 483 (1999). http://doi.org/10.1039/A808385A
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Special issue: Proceedings of the 15th International Congress on X-ray Optics and Microanalysis”. Janssens K, Journal of analytical atomic spectroscopy 14, 357 (1999)
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Characterization of AgxAuy nano particles by TEM and STEM”. de Vyt A, Gijbels R, Davock H, van Roost C, Geuens I, Journal of analytical atomic spectrometry 14, 499 (1999). http://doi.org/10.1039/a807695b
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The glow discharge: an exciting plasma”. Bogaerts A, Journal of analytical atomic spectrometry 14, 1375 (1999). http://doi.org/10.1039/a900772e
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Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, Journal of analytical atomic spectrometry 14, 429 (1999). http://doi.org/10.1039/a807276k
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