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Development and application of a predictive modelling approach for household packaging waste flows in sorting facilities”. Kleinhans K, Hallemans M, Huysveld S, Thomassen G, Ragaert K, Van Geem KM, Roosen M, Mys N, Dewulf J, De Meester S, Waste Management 120, 290 (2021). http://doi.org/10.1016/j.wasman.2020.11.056
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The effect of plastic packaging recycling policy interventions as a complement to extended producer responsibility schemes : a partial equilibrium model”. Larraín M, Billen P, Van Passel S, Waste Management 153, 355 (2022). http://doi.org/10.1016/J.WASMAN.2022.09.012
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Proof of concept of high-rate decentralized pre-composting of kitchen waste : optimizing design and operation of a novel drum reactor”. Sakarika M, Spiller M, Baetens R, Donies G, Vanderstuyf J, Vinck K, Vrancken KC, Van Barel G, Du Bois E, Vlaeminck SE, Waste management 91, 20 (2019). http://doi.org/10.1016/J.WASMAN.2019.04.049
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Biocatalyzed vinyl laurate transesterification in natural deep eutectic solvents”. Kovács A, Janssens N, Mielants M, Cornet I, Neyts EC, Billen P, Waste and biomass valorization , 1 (2023). http://doi.org/10.1007/S12649-023-02331-0
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Effect of high-frequency electromagnetic field on Te+-implanted (001) Si</tex>”. Kalitzova M, Vlakhov E, Marinov Y, Gesheva K, Ignatova VA, Lebedev O, Muntele C, Gijbels R, Vacuum: the international journal and abstracting service for vacuum science and technology 76, 325 (2004). http://doi.org/10.1016/j.vacuum.2004.07.055
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Van Oijstaeijen W, Finizola e Silva M, Back P, Collins A, Verheyen K, De Beelde R, Cools J, Van Passel S (2023) The Nature Smart Cities business model : a rapid decision-support and scenario analysis tool to reveal the multi-benefits of green infrastructure investments. 127923–14
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Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging”. Chen JH, van Dyck D, op de Beeck M, van Landuyt J, Ultramicroscopy 69, 219 (1997)
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Creating arrays of electron vortices”. Niermann T, Verbeeck J, Lehmann M, Ultramicroscopy 136, 165 (2014). http://doi.org/10.1016/j.ultramic.2013.10.002
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Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography”. Kruse P, Schowalter M, Lamoen D, Rosenauer A, Gerthsen D, Ultramicroscopy 106, 105 (2006). http://doi.org/10.1016/j.ultramic.2005.06.057
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Direct space structure solution from precession electron diffraction data: resolving heavy and light scatterers in Pb13Mn9O25”. Hadermann J, Abakumov AM, Tsirlin AA, Filonenko VP, Gonnissen J, Tan H, Verbeeck J, Gemmi M, Antipov EV, Rosner H, Ultramicroscopy 110, 881 (2010). http://doi.org/10.1016/j.ultramic.2010.03.012
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Dynamic scattering theory for dark-field electron holography of 3D strain fields”. Lubk A, Javon E, Cherkashin N, Reboh S, Gatel C, Hytch M, Ultramicroscopy 136, 42 (2014). http://doi.org/10.1016/j.ultramic.2013.07.007
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Dynamical effects in strain measurements by dark-field electron holography”. Javon E, Lubk, Cours R, Reboh S, Cherkashin N, Houdellier F, Gatel C, Hytch MJ, Ultramicroscopy 147, 70 (2014). http://doi.org/10.1016/j.ultramic.2014.06.005
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An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images”. Croitoru MD, van Dyck D, Van Aert S, Bals S, Verbeeck J, Ultramicroscopy 106, 933 (2006). http://doi.org/10.1016/j.ultramic.2006.04.006
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Electron tomography based on highly limited data using a neural network reconstruction technique”. Bladt E, Pelt DM, Bals S, Batenburg KJ, Ultramicroscopy 158, 81 (2015). http://doi.org/10.1016/j.ultramic.2015.07.001
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An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy”. Rosenauer A, Schowalter M, Titantah JT, Lamoen D, Ultramicroscopy 108, 1504 (2008). http://doi.org/10.1016/j.ultramic.2008.04.002
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Homogeneity and composition of AlInGaN : a multiprobe nanostructure study”. Krause FF, Ahl JP, Tytko D, Choi PP, Egoavil R, Schowalter M, Mehrtens T, Müller-Caspary K, Verbeeck J, Raabe D, Hertkorn J, Engl K, Rosenauer A, Ultramicroscopy 156, 29 (2015). http://doi.org/10.1016/j.ultramic.2015.04.012
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Is magnetic chiral dichroism feasible with electron vortices?”.Schattschneider P, Löffler S, Stöger-Pollach M, Verbeeck J, Ultramicroscopy 136, 81 (2014). http://doi.org/10.1016/j.ultramic.2013.07.012
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Measurement of specimen thickness by phase change determination in TEM”. Croitoru MD, van Dyck D, Liu YZ, Zhang Z, Ultramicroscopy 108, 1616 (2008). http://doi.org/10.1016/j.ultramic.2008.06.002
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Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials”. Van Eyndhoven G, Kurttepeli M, van Oers CJ, Cool P, Bals S, Batenburg KJ, Sijbers J, Ultramicroscopy 148, 10 (2015). http://doi.org/10.1016/j.ultramic.2014.08.008
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Prospects for versatile phase manipulation in the TEM : beyond aberration correction”. Guzzinati G, Clark L, Béché, A, Juchtmans R, Van Boxem R, Mazilu M, Verbeeck J, Ultramicroscopy 151, 85 (2015). http://doi.org/10.1016/j.ultramic.2014.10.007
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Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy”. Bertoni G, Beyers E, Verbeeck J, Mertens M, Cool P, Vansant EF, Van Tendeloo G, Ultramicroscopy 106, 630 (2006). http://doi.org/10.1016/j.ultramic.2006.03.006
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Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, van Dyck D, Van Tendeloo G, Ultramicroscopy 109, 1236 (2009). http://doi.org/10.1016/j.ultramic.2009.05.010
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Real space maps of magnetic moments on the atomic scale: theory and feasibility”. Schattschneider P, Ennen I, Stoger-Pollach M, Verbeeck J, Mauchamp V, Jaouen M, Ultramicroscopy 110, 1038 (2010). http://doi.org/10.1016/j.ultramic.2009.11.020
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Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data”. Müller K, Schowalter M, Jansen J, Tsuda K, Titantah J, Lamoen D, Rosenauer A, Ultramicroscopy 109, 802 (2009). http://doi.org/10.1016/j.ultramic.2009.03.029
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Structures and phase transitions in C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S, Muto S, Verheijen MA, van Loosdrecht PHM, Meijer G, Ultramicroscopy 51, 168 (1993). http://doi.org/10.1016/0304-3991(93)90145-N
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Sub-nanometer free electrons with topological charge”. Schattschneider P, Stöger-Pollach M, Löffler S, Steiger-Thirsfeld A, Hell J, Verbeeck J, Ultramicroscopy 115, 21 (2012). http://doi.org/10.1016/j.ultramic.2012.01.010
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Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy”. Muller-Caspary K, Krause FF, Grieb T, Loffler S, Schowalter M, Béché, A, Galioit V, Marquardt D, Zweck J, Schattschneider P, Verbeeck J, Rosenauer A, Ultramicroscopy 178, 62 (2016). http://doi.org/10.1016/j.ultramic.2016.05.004
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Three dimensional mapping of Fe dopants in ceria nanocrystals using direct spectroscopic electron tomography”. Goris B, Meledina M, Turner S, Zhong Z, Batenburg KJ, Bals S, Ultramicroscopy 171, 55 (2016). http://doi.org/10.1016/j.ultramic.2016.08.017
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Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy”. Martinez GT, van den Bos KHW, Alania M, Nellist PD, Van Aert S, Ultramicroscopy 187, 84 (2018). http://doi.org/10.1016/j.ultramic.2018.01.005
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Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure”. Alania M, Altantzis T, De Backer A, Lobato I, Bals S, Van Aert S, Ultramicroscopy 177, 36 (2016). http://doi.org/10.1016/j.ultramic.2016.11.002
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