Number of records found: 8873
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Monte Carlo model for the argon ions and fast argon atoms in a radio-frequency discharge”. Bogaerts A, Gijbels R, IEEE transactions on plasma science 27, 1406 (1999). http://doi.org/10.1109/27.799819
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A one-dimensional fluid model for an acetylene rf discharge: a study of the plasma chemistry”. Herrebout D, Bogaerts A, Gijbels R, Goedheer WJ, Vanhulsel A, IEEE transactions on plasma science 31, 659 (2003). http://doi.org/10.1109/TPS.2003.815249
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High-resolution X-ray fluorescence microtomography of homogeneous samples”. Simionovici AS, Chukalina M, Schroer C, Drakopoulos M, Snigirev A, Snigireva I, Lengeler B, Janssens K, Adams F, IEEE transactions on nuclear science 47, 2736 (2000). http://doi.org/10.1109/23.901180
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Elemental analysis of aerosols using proton-scattering”. Nelson JW, Williams I, Johansson TB, Van Grieken RE, IEEE transactions on nuclear science Ns21, 618 (1974). http://doi.org/10.1109/TNS.1974.4327522
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High-resolution electron microscopy : from imaging toward measuring”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D, IEEE transactions on instrumentation and measurement 51, 611 (2002). http://doi.org/10.1109/TIM.2002.802250
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Direct and indirect band-to-band tunneling in germanium-based TFETs”. Kao K-H, Verhulst AS, Vandenberghe WG, Sorée B, Groeseneken G, De Meyer K, IEEE transactions on electron devices 59, 292 (2012). http://doi.org/10.1109/TED.2011.2175228
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Optimization of gate-on-source-only tunnel FETs with counter-doped pockets”. Kao K-H, Verhulst AS, Vandenberghe WG, Sorée B, Magnus W, Leonelli D, Groeseneken G, De Meyer K, IEEE transactions on electron devices 59, 2070 (2012). http://doi.org/10.1109/TED.2012.2200489
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Signature of ballistic band-tail tunneling current in tunnel FET”. Bizindavyi J, Verhulst AS, Sorée B, Groeseneken G, Ieee Transactions On Electron Devices 67, 3486 (2020). http://doi.org/10.1109/TED.2020.3004119
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Prediction of the decomposition tendency of C5F10O on discharged metal surfaces”. Cui Z, Jafarzadeh A, Hao Y, Liu L, Li L, Zheng Y, IEEE transactions on dielectrics and electrical insulation 30, 1365 (2023). http://doi.org/10.1109/TDEI.2023.3263129
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Various compressed sensing setups evaluated against Shannon sampling under constraint of constant illumination”. Van den Broek W, Reed BW, Béché, A, Velazco A, Verbeeck J, Koch CT, IEEE transactions on computational imaging 5, 502 (2019). http://doi.org/10.1109/TCI.2019.2894950
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Modeling of electroporation induced by pulsed electric fields in irregularly shaped cells”. Mescia L, Chiapperino MA, Bia P, Gielis J, Caratelli D, IEEE transactions on biomedical engineering 65, 414 (2018). http://doi.org/10.1109/TBME.2017.2771943
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Transmission electron microscopy on interface engineered superconducting thin films”. Bals S, Van Tendeloo G, Rijnders G, Huijben M, Leca V, Blank DHA, IEEE transactions on applied superconductivity 13, 2834 (2003). http://doi.org/10.1109/TASC.2003.812023
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Reduced Anisotropy and Enhanced In-Field Performance of Thick BaHfO3-Doped Films on ABAD-YSZ Templates”. Pahlke P, Lao M, Eisterer M, Meledin A, Van Tendeloo G, Hanisch J, Sieger M, Usoskin A, Stromer J, Holzapfel B, Schultz L, Huhne R, IEEE transactions on applied superconductivity 26, 1 (2016). http://doi.org/10.1109/TASC.2016.2541998
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Ba2Y(Nb/Ta)O6–Doped YBCO Films on Biaxially Textured Ni–5at.% W Substrates”. Sieger M, Pahlke P, Hanisch J, Sparing M, Bianchetti M, MacManus-Driscoll J, Lao M, Eisterer M, Meledin A, Van Tendeloo G, Nast R, Schultz L, Holzapfel B, Huhne R, IEEE transactions on applied superconductivity 26, 1 (2016). http://doi.org/10.1109/TASC.2016.2539254
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Influence of substrate tilt angle on the incorporation of BaHfO3 in thick YBa2Cu3O7-&delta, films”. Sieger M, Pahlke P, Ottolinger R, Stafford BH, Lao M, Meledin A, Bauer M, Eisterer M, Van Tendeloo G, Schultz L, Nielsch K, Hühne R, IEEE transactions on applied superconductivity 27, 1 (2016). http://doi.org/10.1109/Tasc.2016.2631587
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Tailoring microstructure and superconducting properties in thick BaHfO3 and Ba2YNb/Ta)O-6 doped YBCO films on technical templates”. Sieger M, Pahlke P, Lao M, Eisterer M, Meledin A, Van Tendeloo G, Ottolinger R, Haenisch J, Holzapfel B, Usoskin A, Kursumovic A, MacManus-Driscoll JL, Stafford BH, Bauer M, Nielsch K, Schultz L, Huehne R, IEEE transactions on applied superconductivity 27, 6601407 (2017). http://doi.org/10.1109/TASC.2016.2644858
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Inkjet printing multideposited YBCO on CGO/LMO/MgO/Y2O3/Al2O3/Hastelloy tape for 2G-coated conductors”. Roxana Vlad V, Bartolome E, Vilardell M, Calleja A, Meledin A, Obradors X, Puig T, Ricart S, Van Tendeloo G, Usoskin A, Lee S, Petrykin V, Molodyk A, IEEE transactions on applied superconductivity 28, 6601805 (2018). http://doi.org/10.1109/TASC.2018.2808403
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Thick secondary phase pinning-enhanced YBCO films on technical templates”. Sieger M, Pahlke P, Lao M, Meledin A, Eisterer M, Van Tendeloo G, Schultz L, Nielsch K, Huehne R, IEEE transactions on applied superconductivity 28, 8000505 (2018). http://doi.org/10.1109/TASC.2018.2799419
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Detection and measurement of picoseconds-pulsed laser energy using a NbTiN superconducting filament”. Harrabi K, Gasmi K, Mekki A, Bahlouli H, Kunwar S, Milošević, MV, IEEE transactions on applied superconductivity 33, 2400205 (2023). http://doi.org/10.1109/TASC.2023.3243193
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Anisotropic etching of CVD grown graphene for ammonia sensing”. Yagmurcukardes N, Bayram A, Aydin H, Yagmurcukardes M, Acikbas Y, Peeters FM, Celebi C, IEEE sensors journal 22, 3888 (2022). http://doi.org/10.1109/JSEN.2022.3146220
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A multisensor hyperspectral benchmark dataset for unmixing of intimate mixtures”. Koirala B, Rasti B, Bnoulkacem Z, de Lima Ribeiro A, Madriz Y, Herrmann E, Gestels A, De Kerf T, Lorenz S, Fuchs M, Janssens K, Steenackers G, Gloaguen R, Scheunders P, IEEE sensors journal 24, 4694 (2024). http://doi.org/10.1109/JSEN.2023.3343552
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Band-Tails Tunneling Resolving the Theory-Experiment Discrepancy in Esaki Diodes”. Bizindavyi J, Verhulst AS, Smets Q, Verreck D, Sorée B, Groeseneken G, IEEE journal of the Electron Devices Society 6, 633 (2018). http://doi.org/10.1109/JEDS.2018.2834825
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Low Loss Atomic Layer Deposited Al2O3 Waveguides for Applications in On-Chip Optical Amplifiers”. Demirtas M, Odaci C, Perkgoz NK, Sevik C, Ay F, IEEE journal of selected topics in quantum electronics 24, 3100508 (2018). http://doi.org/10.1109/JSTQE.2018.2825880
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Investigation of properties limiting efficiency in Cu2ZnSnSe4-based solar cells”. Brammertz G, Oueslati S, Buffiere M, Bekaert J, El Anzeery H, Messaoud KB, Sahayaraj S, Nuytten T, Koble C, Meuris M, Poortmans J;, IEEE journal of photovoltaics 5, 649 (2015). http://doi.org/10.1109/JPHOTOV.2014.2376053
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P-N Junction Passivation in Kesterite Solar Cells by Use of Solution-Processed TiO2 Layer”. Ranjbar S, Hadipour A, Vermang B, Batuk M, Hadermann J, Garud S, Sahayaraj S, Meuris M, Brammertz G, da Cunha AF, Poortmans J, IEEE journal of photovoltaics 7, 1130 (2017). http://doi.org/10.1109/JPHOTOV.2017.2692208
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An extensive multisensor hyperspectral benchmark datasets of intimate mixtures of mineral powders”. Koirala B, Rasti B, Bnoulkacem Z, De Lima Ribeiro A, Madriz Y, Herrmann E, Gestels A, De Kerf T, Janssens K, Steenackers G, Gloaguen R, Scheunders P, IEEE International Geoscience and Remote Sensing Symposium proceedings T2 –, IGARSS 2023 –, 2023 IEEE International Geoscience and Remote Sensing Symposium, 16-21 July 2023, Pasadena, CA, USA , 5890 (2023). http://doi.org/10.1109/IGARSS52108.2023.10281467
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Determination of ultimate leakage through rutile TiO2 and tetragonal ZrO2 from ab initio complex band calculations”. Clima S, Kaczer B, Govoreanu B, Popovici M, Swerts J, Verhulst AS, Jurczak M, De Gendt S, Pourtois G, IEEE electron device letters 34, 402 (2013). http://doi.org/10.1109/LED.2013.2238885
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Superior reliability of junctionless pFinFETs by reduced oxide electric field”. Toledano-Luque M, Matagne P, Sibaja-Hernandez A, Chiarella T, Ragnarsson L-A, Sorée B, Cho M, Mocuta A, Thean A, IEEE electron device letters 35, 1179 (2014). http://doi.org/10.1109/LED.2014.2361769
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Temperature-dependent modeling and characterization of through-silicon via capacitance”. Katti G, Stucchi M, Velenis D, Sorée B, de Meyer K, Dehaene W, IEEE electron device letters 32, 563 (2011). http://doi.org/10.1109/LED.2011.2109052
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Intrinsic tailing of resistive states distributions in amorphous <tex>HfOx </tex>, and TaOx based resistive random access memories”. Clima S, Chen YY, Fantini A, Goux L, Degraeve R, Govoreanu B, Pourtois G, Jurczak M, IEEE electron device letters 36, 769 (2015). http://doi.org/10.1109/LED.2015.2448731
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