Number of records found: 78
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Citations
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Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, van Dyck D, Van Tendeloo G, Ultramicroscopy 109, 1236 (2009). http://doi.org/10.1016/j.ultramic.2009.05.010
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Throughput maximization of particle radius measurements by balancing size and current of the electron probe”. van den Broek W, Van Aert S, Goos P, van Dyck D, Ultramicroscopy 111, 940 (2011). http://doi.org/10.1016/j.ultramic.2010.11.025
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MULTEM : a new multislice program to perform accurate and fast electron diffraction and imaging simulations using graphics processing units with CUDA”. Lobato I, Van Dyck D, Ultramicroscopy 156, 9 (2015). http://doi.org/10.1016/j.ultramic.2015.04.016
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How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?”.Alania M, De Backer A, Lobato I, Krause FF, Van Dyck D, Rosenauer A, Van Aert S, Ultramicroscopy 181, 134 (2017). http://doi.org/10.1016/j.ultramic.2016.12.013
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Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution”. Robert Hl, Lobato I, Lyu Fj, Chen Q, Van Aert S, Van Dyck D, Müller-Caspary K, Ultramicroscopy 233, 113425 (2022). http://doi.org/10.1016/j.ultramic.2021.113425
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Enamels in stained glass windows: preparation, chemical composition, microstructure and causes of deterioration”. Schalm O, van der Linden V, Frederickx P, Luyten S, van der Snickt G, Caen J, Schryvers D, Janssens K, Cornelis E, van Dyck D, Schreiner M, Spectrochimica acta: part B : atomic spectroscopy 64, 812 (2009). http://doi.org/10.1016/j.sab.2009.06.005
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Energy-filtered transmission electron microscopy: an overview”. Verbeeck J, van Dyck D, Van Tendeloo G, Spectrochimica acta: part B : atomic spectroscopy 59, 1529 (2004). http://doi.org/10.1016/j.sab.2004.03.020
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Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application”. Ferroni M, Carotta MC, Guidi V, Martinelli G, Ronconi F, Richard O, van Dyck D, van Landuyt J, Sensors and actuators : B : chemical 68, 140 (2000). http://doi.org/10.1016/S0925-4005(00)00474-3
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Hollow Cone Electron Imaging for Single Particle 3D Reconstruction of Proteins”. Tsai C-Y, Chang Y-C, Lobato I, Van Dyck D, Chen F-R, Scientific reports 6, 27701 (2016). http://doi.org/10.1038/srep27701
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Modification of the multislice method for calculating coherent STEM images”. Chen JH, van Dyck D, op de Beeck M, Broeckx J, van Landuyt J, Physica status solidi: A: applied research 150, 13 (1995). http://doi.org/10.1002/pssa.2211500103
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A peculiar diffraction effect in FCC crystals of C60”. Amelinckx S, van Heurck C, van Dyck D, Van Tendeloo G, Physica status solidi: A: applied research 131, 589 (1992). http://doi.org/10.1002/pssa.2211310231
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Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals”. Goessens C, Schryvers D, van Dyck D, van Landuyt J, de Keyzer R, Physica status solidi: A 143, 277 (1994). http://doi.org/10.1002/pssa.2211430211
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Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns?”.Van Aert S, van Dyck D, Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 81, 1833 (2001). http://doi.org/10.1080/13642810108223121
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Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography”. Sentosun K, Lobato I, Bladt E, Zhang Y, Palenstijn WJ, Batenburg KJ, Van Dyck D, Bals S, Particle and particle systems characterization 34, 1700287 (2017). http://doi.org/10.1002/ppsc.201700287
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Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative”. Van Aert S, van Dyck D, den Dekker AJ, Optics express 14, 3830 (2006). http://doi.org/10.1364/OE.14.003830
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Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp”. Van Tendeloo G, Schryvers D, van Dyck D, van Landuyt J, Amelinckx S, MRS bulletin , 57 (1994)
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Obstacles on the road towards atomic resolution tomography”. van Dyck D, Van Aert S, Croitoru MD, Microscoy and microanalysis 11, 238 (2005)
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Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Bals S, Erni R, van Dyck D, Van Tendeloo G, Microscopy and microanalysis 15, 464 (2009). http://doi.org/10.1017/S1431927609093957
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Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency”. van den Broek W, Van Aert S, van Dyck D, Microscopy and microanalysis 18, 336 (2012). http://doi.org/10.1017/S1431927611012633
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Physical limits on atomic resolution”. van Dyck D, Van Aert S, den Dekker AJ, Microscopy and microanalysis 10, 153 (2004). http://doi.org/10.1017/S143192760404036X
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Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction”. Bals S, Van Aert S, Van Tendeloo G, van Dyck D, Avila-Brande D, Microscopy and microanalysis 11, 556 (2005)
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Do you believe that atoms stay in place when you observe them in HREM?”.van Dyck D, Lobato I, Chen F-R, Kisielowski C, Micron 68, 158 (2015). http://doi.org/10.1016/j.micron.2014.09.003
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How to optimize the experimental design of quantitative atomic resolution TEM experiments?”.Van Aert S, den Dekker AJ, van Dyck D, Micron 35, 425 (2004). http://doi.org/10.1016/j.micron.2004.01.007
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Imaging from atomic structure to electronic structure”. Xu Q, Zandbergen HW, van Dyck D, Micron 43, 524 (2012). http://doi.org/10.1016/j.micron.2011.10.024
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Model-based electron microscopy : from images toward precise numbers for unknown structure parameters”. Van Aert S, van den Broek W, Goos P, van Dyck D, Micron 43, 509 (2012). http://doi.org/10.1016/j.micron.2011.10.019
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An electron microscopic study of highly oriented undoped and FeCl3-doped poly (p-phenylenevinylene)”. Zhang XB, Van Tendeloo G, van Landuyt J, van Dyck D, Briers J, Bao Y, Geise HJ, Macromolecules 29, 1554 (1996). http://doi.org/10.1021/ma9513067
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High-resolution electron microscopy and electron tomography: resolution versus precision”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A, Journal of structural biology 138, 21 (2002). http://doi.org/10.1016/S1047-8477(02)00016-3
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Advanced electron crystallography through model-based imaging”. Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G, IUCrJ 3, 71 (2016). http://doi.org/10.1107/S2052252515019727
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Atomic resolution electron tomography: a dream?”.van Dyck D, Van Aert S, Croitoru M, International journal of materials research 97, 872 (2006). http://doi.org/10.3139/146.101314
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Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis”. Rosenauer A, Gerthsen D, Van Aert S, van Dyck D, den Dekker AJ, Institute of physics conference series , 19 (2003)
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