Number of records found: 3074
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Cao S (2010) Quantitative 3D analysis of Ni4Ti3 precipitate morphology and distribution in Ni-Ti by FIB/SEM slice-and-view. Antwerpen
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Wang W-C (2011) Quantitative analysis of electron exit waves with single atom sensitivity. Antwerpen
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de Backer A (2015) Quantitative atomic resolution electron microscopy using advanced statistical techniques. Antwerpen
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Quantitative EFTEM study of germanium quantum dots”. Hens S, Stuer C, Bender H, Loo R, van Landuyt J, , 345 (2001)
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Heidari Mezerji H (2012) Quantitative electron tomography of nanoparticles. Antwerpen
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Martí,nez Alanis GT (2015) Quantitative model-based high angle annular dark field scanning transmission electron microscopy. Antwerpen
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Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
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Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples”. Van Eyndhoven G, Batenburg KJ, van Oers C, Kurttepeli M, Bals S, Cool P, Sijbers J, (2014)
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The selective imaging of “substructures&rdquo, in the mixed layer compounds Ca0.85CuO2 and (Ca,Sr)14Cu24O41”. Amelinckx S, Milat O, Van Tendeloo G, , 240 (1992)
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Statistical experimental design for quantitative atomic resolution transmission electron microscopy”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D Academic Press, San Diego, Calif., page 1 (2004).
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Statistical parameter estimation theory : a tool for quantitative electron microscopy”. Van Aert S Wiley-VCH, Weinheim, page 281 (2012).
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Egoavil R (2014) STEM investigation of complex oxides at the atomic scale. Antwerpen
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Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM”. Lebedev OI, Van Tendeloo G, Amelinckx S s.l., page 201 (2000).
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Stress analysis with convergent beam electron diffraction around NMOS transistors”. Stuer G, Bender H, van Landuyt J, Eyben P, , 359 (2001)
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Structural aspects of carbon nanotubes”. Bernaerts D, Amelinckx S, Zhang XB, Van Tendeloo G, van Landuyt J, , 551 (1995)
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Structural changes in fluorinated T{'} and T* phases”. Hadermann J, Abakumov AM, Lebedev OI, Antipov EV, Van Tendeloo G, , 193 (2000)
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Structural instabilities associated with phase transitions: an electron microscopy study”. Van Tendeloo G, Schryvers D, Tanner LE, , 107 (1992)
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Structural phase transition in (La0.67Ca0.33MnO3)1-x: (MgO)x composite film”. Lebedev O, Verbeeck J, Van Tendeloo G, Shapoval O, Belenchuk A, Moshnyaga V, Damaschke B, Samwer K s.l., page 1013 (2002).
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Structural properties of Au clusters on MgO”. Pauwels B, Van Tendeloo G, Bouwen W, Kuhn LT, Lievens P, , 383 (2000)
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Structure and phase transitions in C60 and C70 fullerites”. Van Tendeloo G, Muto S, van Heurck C, Amelinckx S, , 476 (1992)
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Superconducting ceramics”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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Superconductivity in the quantum-size regime”. Shanenko AA, Croitoru MD, Peeters FM, , 79 (2008)
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TEM characterization of structural defects”. Van Tendeloo G Plenum Press, New York, page 473 (1996).
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TEM of nanostructured materials”. Van Tendeloo G, Pauwels B, Geuens P, Lebedev O, , 3 (2000)
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Wang B (2011) TEM study of plasticity mechanisms in metals : nanocrystalline Al Pd thin films and bulk bcc Nb. Antwerpen
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TEM study of the mechanism of Ni ion release from Nitinol wires with original oxides”. Tian H, Schryvers D, Shabalovskaya S, van Humbeeck J, , 05027 (2009). http://doi.org/10.1051/esomat/200905027
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A temperature study of mixed AgBr-AgBrI tabular crystals”. Goessens C, Schryvers D, van Landuyt J, Geuens I, Gijbels R, Jacob W, de Keyzer R Hawaii, page 70 (1995).
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A temperature study of mixed AgBr-AgBrI tabular crystals”. Goessens C, Schryvers D, van Landuyt J, Geuens I, Gijbels R, Jacob W, de Keyzer R, , 36 (1992)
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Ni4Ti3 precipitates and their influence on the surrounding NiTi matrix”. Schryvers D, Tirry W, Yang Z, , 205 (2005)
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The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals”. Van Renterghem W, Karthauser S, Schryvers D, van Landuyt J, De Keyzer R, Van Roost C, , 167 (2000)
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