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Electronic structure of Pd nanoparticles on carbon nanotubes”. Felten A, Ghijsen J, Pireaux J-J, Drube W, Johnson RL, Liang D, Hecq M, Van Tendeloo G, Bittencourt C, Micron 40, 74 (2009). http://doi.org/10.1016/j.micron.2008.01.013
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Focused electron beam induced deposition as a tool to create electron vortices”. Béché, A, Winkler R, Plank H, Hofer F, Verbeeck J, Micron 80, 34 (2015). http://doi.org/10.1016/j.micron.2015.07.011
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First-principles calculation of the electronic structure and energy loss near edge spectra of chiral carbon nanotubes”. Bertoni G, Calmels L, Micron 37, 486 (2006). http://doi.org/10.1016/j.micron.2005.10.011
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Functionalization of MWCNTs with atomic nitrogen”. Ruelle B, Felten A, Ghijsen J, Drube W, Johnson RL, Liang D, Erni R, Van Tendeloo G, Sophie P, Dubois P, Godfroid T, Hecq M, Bittencourt C;, Micron 40, 85 (2009). http://doi.org/10.1016/j.micron.2008.01.003
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How to optimize the experimental design of quantitative atomic resolution TEM experiments?”.Van Aert S, den Dekker AJ, van Dyck D, Micron 35, 425 (2004). http://doi.org/10.1016/j.micron.2004.01.007
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Imaging from atomic structure to electronic structure”. Xu Q, Zandbergen HW, van Dyck D, Micron 43, 524 (2012). http://doi.org/10.1016/j.micron.2011.10.024
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Model-based electron microscopy : from images toward precise numbers for unknown structure parameters”. Van Aert S, van den Broek W, Goos P, van Dyck D, Micron 43, 509 (2012). http://doi.org/10.1016/j.micron.2011.10.019
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One-step synthesis of a suspended ultrathin graphene oxide film: Application in transmission electron microscopy”. Kirilenko DA, Dideykin AT, Aleksenskiy AE, Sitnikova AA, Konnikov SG, Vul' AY, Micron 68, 23 (2015). http://doi.org/10.1016/j.micron.2014.08.006
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Study of changes in composition and EELS ionization edges upon Ni4Ti3 precipitation in a NiTi alloy”. Yang Z, Schryvers D, Micron 37, 503 (2006). http://doi.org/10.1016/j.micron.2005.08.002
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Ultrastructure and composition of cell wall appositions in the roots of Asplenium (Polypodiales)”. Leroux O, Leroux F, Bagniewska-Zadworna, Knox JP, Claeys M, Bals S, Viane RLL, Micron 42, 863 (2011). http://doi.org/10.1016/j.micron.2011.06.002
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Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach”. Samaeeaghmiyoni V, Idrissi H, Groten J, Schwaiger R, Schryvers D, Micron 94, 66 (2017). http://doi.org/10.1016/j.micron.2016.12.005
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Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope”. Cooper D, Denneulin T, Bernier N, Béché, A, Rouvière J-L, Micron 80, 145 (2016). http://doi.org/10.1016/J.MICRON.2015.09.001
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Nanoscale investigation by TEM and STEM-EELS of the laser induced yellowing”. Godet M, Vergès-Belmin V, Gauquelin N, Saheb M, Monnier J, Leroy E, Bourgon J, Verbeeck J, Andraud C, Micron 115, 25 (2018). http://doi.org/10.1016/j.micron.2018.08.006
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Effectiveness of reducing the influence of CTAB at the surface of metal nanoparticles during in situ heating studies by TEM”. De Meyer R, Albrecht W, Bals S, Micron 144, 103036 (2021). http://doi.org/10.1016/j.micron.2021.103036
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Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals”. Jain N, Hao Y, Parekh U, Kaltenegger M, Pedrazo-Tardajos A, Lazzaroni R, Resel R, Geerts YH, Bals S, Van Aert S, Micron 169, 103444 (2023). http://doi.org/10.1016/j.micron.2023.103444
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Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers”. De Gryse O, Clauws P, Rossou L, van Landuyt J, Vanhellemont J, Microelectronic engineering 45, 277 (1999). http://doi.org/10.1016/S0167-9317(99)00180-X
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Phase formation in intermixed NiGe thin films : influence of Ge content and low-temperature nucleation of hexagonal nickel germanides”. De Schutter B, Devulder W, Schrauwen A, van Stiphout K, Perkisas T, Bals S, Vantomme A, Detavernier C, Microelectronic engineering 120, 168 (2014). http://doi.org/10.1016/j.mee.2013.09.004
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Model-based quantification of EELS: is standardless quantification possible?”.Verbeeck J, Bertoni G, Microchimica acta 161, 439 (2008). http://doi.org/10.1007/s00604-008-0948-7
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Observation of Sb203 nanocrystals in SiO2 after Sb ion implantation”. Ignatova VA, Lebedev OI, Wätjen U, van Vaeck L, van Landuyt J, Gijbels R, Adams F, Microchimica acta 139, 77 (2002). http://doi.org/10.1007/s006040200043
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From olivine to ringwoodite : a TEM study of a complex process”. Pittarello L, Ji G, Yamaguchi A, Schryvers D, Debaille V, Claeys P, Meteoritics and Planetary Science 50, 944 (2015). http://doi.org/10.1111/maps.12441
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Firsto order phase transformation in the Ni-Al system”. Tanner LE, Shapiro SM, Krumhansl JA, Schryvers D, Noda Y, Yamada Y, Barsch GR, Gooding R, Moss SC, Metallurgy and Ceramics (1992)
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Precipitation behaviors in Ti-2.3 Wt Pct Cu alloy during isothermal and two-step aging”. Akamine H, Mitsuhara M, Nishida M, Samaee V, Schryvers D, Tsukamoto G, Kunieda T, Fujii H, Metallurgical And Materials Transactions A-Physical Metallurgy And Materials Science 52, 2760 (2021). http://doi.org/10.1007/S11661-021-06265-X
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Giant Pd clusters observed by high resolution electron microscopy”. Volkov VV, Van Tendeloo G, Vargaftik MN, Stolyarov IP, Moiseev II, Mendeleev communications , 187 (1993)
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Giant Pd clusters observed by HREM”. Volkov VV, Van Tendeloo G, Vargaftik MN, Stolygarov IP, Moiseev II, Mendeleev communications , 187 (1993)
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One-step synthesis of shelled PbS nanoparticles in a layered double hydroxide matrix”. Lukashin AV, Eliseev AA, Zhuravleva NG, Vertegel AA, Tretyakov YD, Lebedev OI, Van Tendeloo G, Mendeleev communications , 174 (2004). http://doi.org/10.1070/MC2004v014n04ABEH001973
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Some examples of electron microscopy studies of microstructures and phase transitions in solids”. Schryvers D, Van Tendeloo G, van Landuyt J, Amelinckx S, Meccanica 30, 433 (1995). http://doi.org/10.1007/BF01557075
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Hierarchical zeolite single-crystal reactor for excellent catalytic efficiency”. Sun M-H, Zhou J, Hu Z-Y, Chen L-H, Li L-Y, Wang Y-D, Xie Z-K, Turner S, Van Tendeloo G, Hasan T, Su B-L, Matter 3, 1226 (2020). http://doi.org/10.1016/J.MATT.2020.07.016
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FCC surface precipitation in Cu-Zn-Al after low angle GA+ ion irradiation”. Zelaya E, Schryvers D, Materials transactions 51, 2177 (2010). http://doi.org/10.2320/matertrans.M2010171
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Microstructure of a partially crystallised Ti50Ni25Cu25 melt-spun ribbon”. Santamarta R, Schryvers D, Materials transactions 44, 1760 (2003). http://doi.org/10.2320/matertrans.44.1760
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R-phase structure refinement using electron diffraction data”. Schryvers D, Potapov PL, Materials transactions 43, 774 (2002). http://doi.org/10.2320/matertrans.43.774
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