| Author |
Title |
Year |
Publication  |
Volume |
Times cited |
Additional Links |
| Johansson, T.B.; Nelson, J.W.; Van Grieken, R.E.; Winchester, J.W. |
Elemental analysis of aerosol-size fractions by proton-induced X-ray-emission |
1973 |
Transactions of the American Nuclear Society |
17 |
|
UA library record; WoS full record |
| Shi, P.; Liu, M.; Ratkowsky, D.A.; Gielis, J.; Su, J.; Yu, X.; Wang, P.; Zhang, L.; Lin, Z.; Schrader, J. |
Leaf area-length allometry and its implications in leaf shape evolution |
2019 |
Trees: structure and function |
33 |
|
UA library record; WoS full record; WoS citing articles |
| Lian, M.; Shi, P.; Zhang, L.; Yao, W.; Gielis, J.; Niklas, K.J. |
A generalized performance equation and its application in measuring the Gini index of leaf size inequality |
2023 |
Trees: structure and function |
37 |
|
UA library record; WoS full record; WoS citing articles |
| Janssens, K.; van Espen, P. |
A general-purpose interface between fortran and the low-level functions of the ibm-pc |
1988 |
Trends in analytical chemistry |
7 |
|
UA library record; WoS full record; WoS citing articles |
| Bertrand, L.; Schoeeder, S.; Anglos, D.; Breese, M.B.H.; Janssens, K.; Moini, M.; Simon, A. |
Mitigation strategies for radiation damage in the analysis of ancient materials |
2015 |
Trends in analytical chemistry |
66 |
35 |
UA library record; WoS full record; WoS citing articles |
| Janssens, K.; de Nolf, W.; van der Snickt, G.; Vincze, L.; Vekemans, B.; Terzano, R.; Brenker, F.E. |
Recent trends in quantitative aspects of microscopic X-ray fluorescence analysis |
2010 |
Trends in analytical chemistry |
29 |
48 |
UA library record; WoS full record; WoS citing articles |
| Jambers, W.; Van Grieken, R. |
Present and future applications of beam techniques in environmental microanalysis |
1996 |
Trends in analytical chemistry |
15 |
|
UA library record; WoS full record; WoS citing articles |
| Sui, Y.; Vlaeminck, S.E. |
Dunaliella microalgae for nutritional protein : an undervalued asset |
2020 |
Trends in biotechnology : regular edition |
38 |
2 |
UA library record; WoS full record; WoS citing articles |
| Alloul, A.; Blansaer, N.; Cabecas Segura, P.; Wattiez, R.; Vlaeminck, S.E.; Leroy, B. |
Dehazing redox homeostasis to foster purple bacteria biotechnology |
2023 |
Trends in biotechnology : regular edition |
41 |
|
UA library record; WoS full record; WoS citing articles |
| Shenderova, O.; Vargas, A.; Turner, S.; Ivanov, D.M.; Ivanov, M.G. |
Nanodiamond-based nanolubricants : investigation of friction surfaces |
2014 |
Tribology transactions |
57 |
23 |
UA library record; WoS full record; WoS citing articles |
| Hacimustafaoglu, M.; Celebi, S.; Bozdemir, S.E.; Ozgur, T.; Ozcan, I.; Guray, A.; Çakir, D. |
RSV frequency in children below 2 years hospitalized for lower respiratory tract infections |
2013 |
Turkish Journal Of Pediatrics |
55 |
|
UA library record; WoS full record; WoS citing articles |
| Yagmurcukardes, M. |
Stable anisotropic single-layer of ReTe₂ : a first principles prediction |
2020 |
Turkish Journal of Physics |
44 |
|
UA library record; WoS full record; WoS citing articles |
| Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
EM study of twinning in the Ni5Al3 bainitic phase |
1993 |
Twinning in advanced materials |
|
|
UA library record; WoS full record; |
| Verbeeck, J.; Bertoni, G.; Schattschneider, P. |
The Fresnel effect of a defocused biprism on the fringes in inelastic holography |
2008 |
Ultramicroscopy
T2 – 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN |
108 |
15 |
UA library record; WoS full record; WoS citing articles |
| van Landuyt, J. |
The evolution of HVEM application in antwerp |
1991 |
Ultramicroscopy
T2 – 2nd Osaka International Symp.on High-Voltage Electron Microscopy : New Directions and Future Aspects of High Voltage Electron Microscopy, November 8-10, 1990, Osaka University, Osaka, Japan |
39 |
|
UA library record; WoS full record |
| Batenburg, K.J.; Bals, S.; Sijbers, J.; Kübel, C.; Midgley, P.A.; Hernandez, J.C.; Kaiser, U.; Encina, E.R.; Coronado, E.A.; Van Tendeloo, G. |
3D imaging of nanomaterials by discrete tomography |
2009 |
Ultramicroscopy |
109 |
220 |
UA library record; WoS full record; WoS citing articles |
| Bertoni, G.; Verbeeck, J. |
Accuracy and precision in model based EELS quantification |
2008 |
Ultramicroscopy |
108 |
44 |
UA library record; WoS full record; WoS citing articles |
| Roelandts, T.; Batenburg, K.J.; Biermans, E.; Kübel, C.; Bals, S.; Sijbers, J. |
Accurate segmentation of dense nanoparticles by partially discrete electron tomography |
2012 |
Ultramicroscopy |
114 |
34 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Verbeeck, J.; de Backer, S.; Scheunders, P.; Schryvers, D. |
Acquisition of the EELS data cube by tomographic reconstruction |
2006 |
Ultramicroscopy |
106 |
6 |
UA library record; WoS full record; WoS citing articles |
| Goris, B.; Roelandts, T.; Batenburg, K.J.; Heidari Mezerji, H.; Bals, S. |
Advanced reconstruction algorithms for electron tomography : from comparison to combination |
2013 |
Ultramicroscopy |
127 |
63 |
UA library record; WoS full record; WoS citing articles |
| Wang, A.; Turner, S.; Van Aert, S.; van Dyck, D. |
An alternative approach to determine attainable resolution directly from HREM images |
2013 |
Ultramicroscopy |
133 |
|
UA library record; WoS full record |
| Xu, Q.; Zandbergen, H.W.; van Dyck, D. |
Applying an information transmission approach to extract valence electron information from reconstructed exit waves |
2011 |
Ultramicroscopy |
111 |
1 |
UA library record; WoS full record; WoS citing articles |
| de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. |
Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations |
2013 |
Ultramicroscopy |
134 |
48 |
UA library record; WoS full record; WoS citing articles |
| Egoavil, R.; Gauquelin, N.; Martinez, G.T.; Van Aert, S.; Van Tendeloo, G.; Verbeeck, J. |
Atomic resolution mapping of phonon excitations in STEM-EELS experiments |
2014 |
Ultramicroscopy |
147 |
22 |
UA library record; WoS full record; WoS citing articles |
| Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. |
Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging |
1997 |
Ultramicroscopy |
69 |
11 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. |
Correction of non-linear thickness effects in HAADF STEM electron tomography |
2012 |
Ultramicroscopy |
116 |
67 |
UA library record; WoS full record; WoS citing articles |
| Niermann, T.; Verbeeck, J.; Lehmann, M. |
Creating arrays of electron vortices |
2014 |
Ultramicroscopy |
136 |
9 |
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; Bertoni, G. |
Deconvolution of core electron energy loss spectra |
2009 |
Ultramicroscopy |
109 |
13 |
UA library record; WoS full record; WoS citing articles |
| Kruse, P.; Schowalter, M.; Lamoen, D.; Rosenauer, A.; Gerthsen, D. |
Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography |
2006 |
Ultramicroscopy |
106 |
50 |
UA library record; WoS full record; WoS citing articles |
| Hadermann, J.; Abakumov, A.M.; Tsirlin, A.A.; Filonenko, V.P.; Gonnissen, J.; Tan, H.; Verbeeck, J.; Gemmi, M.; Antipov, E.V.; Rosner, H. |
Direct space structure solution from precession electron diffraction data: resolving heavy and light scatterers in Pb13Mn9O25 |
2010 |
Ultramicroscopy |
110 |
24 |
UA library record; WoS full record; WoS citing articles |
