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Author Title Year Publication (down) Volume Times cited Additional Links
Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D. Towards quantitative high resolution electron microscopy? 1995 Institute of physics conference series 147 UA library record; WoS full record;
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. High-resolution electron microscopy : from imaging toward measuring 2002 IEEE transactions on instrumentation and measurement 51 13 UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R. Electron diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals 1994 Icem 13 UA library record; WoS full record;
Pourbabak, S.; Wang, X.; Van Dyck, D.; Verlinden, B.; Schryvers, D. Ni cluster formation in low temperature annealed Ni50.6Ti49.4 2017 Functional materials letters 10 4 UA library record; WoS full record; WoS citing articles
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays 1999 Applied physics letters 75 481 UA library record; WoS full record; WoS citing articles
van Dyck, D.; Croitoru, M.D. Statistical method for thickness measurement of amorphous objects 2007 Applied physics letters 90 4 UA library record; WoS full record; WoS citing articles
Van Tendeloo, G.; Bals, S.; Van Aert, S.; Verbeeck, J.; van Dyck, D. Advanced electron microscopy for advanced materials 2012 Advanced materials 24 107 UA library record; WoS full record; WoS citing articles
Lobato Hoyos, I.P.; van Dyck, D. An accurate parameterization for scattering factors, electron densities and electrostatic potentials for neutral atoms that obey all physical constraints 2014 Acta crystallographica: section A: foundations of crystallography 70 19 UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. High resolution electron microscopy from imaging towards measuring 2001 ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 UA library record
Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate 2000 UA library record
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. Electron microscopy: principles and fundamentals 1997 UA library record
Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration 2005 UA library record
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. Handbook of microscopy: applications in materials science, solid-state physics and chemistry 1997 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2008 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2007 UA library record
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. Statistical experimental design for quantitative atomic resolution transmission electron microscopy 2004 13 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data 2008 UA library record
Proost, K.; Schalm, O.; Janssens, K.; Van Dyck, D. Investigation of the chemical state and 3D distribution of Mn in corroded glass fragments 2005 UA library record