Number of records found: 71
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Citations
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Size-differentiated composition of aerosols in Khartoum, Sudan”. Eltayeb MAH, van Espen PJ, Cafmeyer J, Van Grieken RE, Maenhaut W, The science of the total environment 120, 281 (1992). http://doi.org/10.1016/0048-9697(92)90062-W
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A general-purpose interface between fortran and the low-level functions of the ibm-pc”. Janssens K, van Espen P, Trends in analytical chemistry 7, 128 (1988). http://doi.org/10.1016/0165-9936(88)87009-2
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Study of the uniformity of aerosol filters by scanning MA-XRF”. Cabal A, Legrand S, Van den Bril B, Tote K, Janssens K, van Espen P, X-ray spectrometry T2 –, 17th European Conference on X-Ray Spectrometry (EXRS), JUN 19-24, 2016, Univ Gothenburg, Univ Gothenburg, Gothenburg, SWEDEN 46, 461 (2017). http://doi.org/10.1002/XRS.2767
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Analysis of X-ray spectra by iterative least squares (AXIL): new developments”. Vekemans B, Janssens K, Vincze L, Adams F, van Espen P, X-ray spectrometry 23, 278 (1994). http://doi.org/10.1002/XRS.1300230609
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Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers”. Janssens K, Vincze L, van Espen P, Adams F, X-ray spectrometry 22, 234 (1993). http://doi.org/10.1002/XRS.1300220412
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Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses”. Padilla R, van Espen P, Abrahantes A, Janssens K, X-ray spectrometry 34, 19 (2005). http://doi.org/10.1002/XRS.781
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Comparison of x-ray absorption and emission techniques for the investigation of paintings”. Cabal A, Schalm O, Eyskens P, Willems P, Harth A, van Espen P, X-ray spectrometry 44, 141 (2015). http://doi.org/10.1002/XRS.2591
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Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation”. Araujo MF, van Espen P, Van Grieken R, X-ray spectrometry 19, 29 (1990). http://doi.org/10.1002/XRS.1300190107
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Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles”. Osán J, de Hoog J, van Espen P, Szalóki I, Ro C-U, Van Grieken R, X-ray spectrometry 30, 419 (2001). http://doi.org/10.1002/XRS.523
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Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
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M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range”. Trincavelli J, Montoro S, van Espen P, Van Grieken R, X-ray spectrometry 22, 372 (1993). http://doi.org/10.1002/XRS.1300220510
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