Author |
Title |
Year |
Publication ![sorted by Publication field, ascending order (up)](img/sort_asc.gif) |
Volume |
Times cited |
Additional Links |
de Backer, A.; Martinez, G.T.; Rosenauer, A.; Van Aert, S. |
Atom counting in HAADF STEM using a statistical model-based approach : methodology, possibilities, and inherent limitations |
2013 |
Ultramicroscopy |
134 |
48 |
UA library record; WoS full record; WoS citing articles |
den Dekker, A.J.; Gonnissen, J.; de Backer, A.; Sijbers, J.; Van Aert, S. |
Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits? |
2013 |
Ultramicroscopy |
134 |
31 |
UA library record; WoS full record; WoS citing articles |
Dunin-Borkowski, R.E.; Lichte, H.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. |
Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays |
2013 |
Ultramicroscopy |
134 |
1 |
UA library record; WoS full record; WoS citing articles |
Heidari, H.; van den Broek, W.; Bals, S. |
Quantitative electron tomography : the effect of the three-dimensional point spread function |
2013 |
Ultramicroscopy |
135 |
6 |
UA library record; WoS full record; WoS citing articles |
Lichtert, S.; Verbeeck, J. |
Statistical consequences of applying a PCA noise filter on EELS spectrum images |
2013 |
Ultramicroscopy |
125 |
54 |
UA library record; WoS full record; WoS citing articles |
Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. |
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography |
2013 |
Ultramicroscopy |
131 |
73 |
UA library record; WoS full record; WoS citing articles |
Vanmeert, F.; Mudronja, D.; Fazinic, S.; Janssens, K.; Tibljas, D. |
Semi-quantitative analysis of the formation of a calcium oxalate protective layer for monumental limestone using combined micro-XRF and micro-XRPD |
2013 |
X-ray spectrometry |
42 |
5 |
UA library record; WoS full record; WoS citing articles |
Van Grieken, R. |
Editorial : award for best X-Ray Spectrometry referee during 2011-2012 |
2013 |
X-ray spectrometry |
42 |
|
UA library record; WoS full record |
Van Grieken, R. |
Editorial : introducing Dr Markowicz as X-Ray Spectrometry's new associate editor for Europe |
2013 |
X-ray spectrometry |
42 |
|
UA library record; WoS full record |
Van Grieken, R. |
New members of the editorial board of X-ray Spectrometry |
2013 |
X-ray spectrometry |
42 |
|
UA library record; WoS full record |
Van Rompaey, S.; Dachraoui, W.; Turner, S.; Podyacheva, O.Y.; Tan, H.; Verbeeck, J.; Abakumov, A.; Hadermann, J. |
Layered oxygen vacancy ordering in Nb-doped SrCo1-xFexO3-\delta perovskite |
2013 |
Zeitschrift für Kristallographie |
228 |
9 |
UA library record; WoS full record; WoS citing articles |