Abstract: A comparison of four methods for the determination of barium, lanthanum, cerium and neodymium in lateritic materials from Brazil is presented. Three of the methods were based on x-ray fluorescence (XRF) spectroscopy: two by radioisotope excitation (Co-57 and Am-241) and one by secondary target XRF (a molybdenum target with a tungsten anode). The other method was based on neutron activation analysis employing both a Ge(Li) coaxial detector and a high-purity germanium detector. The results from these four methods were similar for lanthanum, cerium and neodymium, but for barium at low concentrations (<500 ppm) the neutron activation and the secondary target XRF methods were not suitable. Data on the precision and accuracy of these methods using a series of standard reference rocks are given. The advantages and limitations of each of these methods with respect to the analysis of lateritic materials are discussed.

Abstract: Trace amounts of heavy metals were preconcentrated on discs of polyurethane (PU) foam loaded with ammonium diethyldithiocarbamate (DDTC), to increase the sensitivity of XRF. Since the diameter of the cavities in the open-cell PU foams reaches 30300 μm, considerable heterogeneity effects might occur, which could reduce the accuracy of the method. The possible systematic error introduced by considering the sample to be homogeneous is calculated using the Berry et al. model. The calculations show that the underestimation of the absorption correction factor when considering the sample as being homogeneous is less than 2% for high-Z elements when the sample thickness is at least 2 mm. The detection limits are also around the minima for this thickness.

Abstract: A simple procedure is proposed for the calculation of the absorption correction factor in electron-probe x-ray microanalysis. It is based on the concept of an effective depth of x-ray production, assuming a rectangular depth distribution function for x-ray generation. This effective x-ray production depth is expressed as a fraction of the x-ray excitation depth given by Whelan's expression. Adequate values for this fraction are presented. Two versions are considered. In the first the effective x-ray production is a function of both the characteristic x-ray energy and the atomic numbers of the matrix elements, whereas in the second one, which is indicated for routine use, the energy dependence is neglected. Calculations pointed to satisfactory results, even for low x-ray energies and high overvoltages.