“Hole-induced spontaneous mutual annihilation of dislocation pairs”. Wu Y, Chen G, Yu J, Wang D, Ma C, Li C, Pennycook SJ, Yan Y, Wei S-H, The journal of physical chemistry letters 10, 7421 (2019). http://doi.org/10.1021/ACS.JPCLETT.9B02918
Abstract: Dislocations are always observed during crystal growth, and it is usually desirable to reduce the dislocation density in high-quality crystals. Here, the annihilation process of the 30 degrees Shockley partial dislocation pairs in CdTe is studied by first-principles calculations. We found that the dislocations can glide relatively easily due to the weak local bonding. Our systematic study of the slipping mechanism of the dislocations suggests that the energy barrier for the annihilation process is low. Band structure calculations reveal that the band bending caused by the charge transfer between the two dislocation cores depends on the core-core distance. A simple linear model is proposed to describe the mechanism of formation of the dislocation pair. More importantly, we demonstrate that hole injection can affect the core structure, increase the mobility, and eventually trigger a spontaneous mutual annihilation, which could be employed as a possible facile way to reduce the dislocation density.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 9.353
DOI: 10.1021/ACS.JPCLETT.9B02918
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“Two-Dimensional CdSe-PbSe Heterostructures and PbSe Nanoplatelets: Formation, Atomic Structure, and Optical Properties”. Salzmann BBV, Wit J de, Li C, Arenas-Esteban D, Bals S, Meijerink A, Vanmaekelbergh D, The journal of physical chemistry: C : nanomaterials and interfaces 126, 1513 (2022). http://doi.org/10.1021/acs.jpcc.1c09412
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 3.7
Times cited: 12
DOI: 10.1021/acs.jpcc.1c09412
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“A simple method to clean ligand contamination on TEM grids”. Li C, Tardajos AP, Wang D, Choukroun D, Van Daele K, Breugelmans T, Bals S, Ultramicroscopy 221, 113195 (2021). http://doi.org/10.1016/j.ultramic.2020.113195
Abstract: Colloidal nanoparticles (NPs) including nanowires and nanosheets made by chemical methods involve many organic ligands. When the structure of NPs is investigated via transmission electron microscopy (TEM), the organic ligands act as a source for e-beam induced deposition and this causes substantial build-up of carbon layers in the investigated areas, which is typically referred to as “contamination” in the eld of electron mi- croscopy. This contamination is often more severe for scanning TEM, a technique that is based on a focused electron beam and hence higher electron dose rate. In this paper, we report a simple and effective method to clean drop-cast TEM grids that contain NPs with ligands. Using a combination of activated carbon and ethanol, this method effectively reduces the amount of ligands on TEM grids, and therefore greatly improves the quality of electron microscopy images and subsequent analytical measurements. This ef cient and facile method can be helpful during electron microscopy investigation of different kinds of nanomaterials that suffer from ligand- induced contamination.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT); Applied Electrochemistry & Catalysis (ELCAT)
Impact Factor: 2.843
Times cited: 10
DOI: 10.1016/j.ultramic.2020.113195
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