Tavernier S, op de Beeck W, Ghekiere J-P, Van Tendeloo G (1996) Positively charged toner for use in electrostatography : US5532097 : 07/02/1996
Keywords: Patent; Electron microscopy for materials research (EMAT)
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“Precision magnetometry on a submicron scale”. Geim AK, Lok JGS, Maan JC, Dubonos SV, Li XQ, Peeters FM, Nazarov YV, , 3311 (1996)
Keywords: P3 Proceeding; Condensed Matter Theory (CMT)
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“Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe”. Janssens G, Geuens I, de Keyzer R, van Espen P, Gijbels R, Hubin A, Terryn H, Vereecken J Wiley, Chichester, page 161 (1996).
Keywords: H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3)
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“Recent trends in solids mass spectrometry, with special emphasis on glow discharge mass spectrometry”. Gijbels R, Bogaerts A, , 71 (1996)
Keywords: P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
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“Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1996).
Keywords: H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
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“TEM characterization of structural defects”. Van Tendeloo G Plenum Press, New York, page 473 (1996).
Keywords: H1 Book chapter; Electron microscopy for materials research (EMAT)
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“X-ray microanalysis: a new tool for environmental analysis”. Adams F, Janssens K page 183 (1996).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Analisis cuantitativo sin estandares de particulas individuales mediante microsonda de electrones”. Trincavelli JC, Van Grieken R page 273 (1996).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Atmospheric aerosols and deposition near historic buildings: chemistry, sources, interrelationships and relevance”. Van Grieken R, Torfs K, (1996)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Atmospheric inputs of heavy metals into the North Sea”. Injuk J, Van Grieken R, (1996)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Chemical characterisation, source identification and quantification of the input of atmospheric particulate matter into the North Sea”. van Malderen H, de Bock L, Hoornaert S, Injuk J, Van Grieken R page 103 (1996).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Effects of marine spray and air pollution on monuments in the Mediterranean coastal environment”. Torfs K, Van Grieken R page 170 (1996).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level”. Hoornaert S, Treiger B, Van Grieken R, Valkovic V page 29 (1996).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Single particle characterisation of inorganic North Sea suspensions”. Jambers W, Van Grieken R, (1996)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Study of environmental effects on deterioration of monuments: case study the cathedral of Bari, Italy”. Zezza F, Torfs K, Van Grieken R, García Pascua N, Macri F, (1996)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Study of individual particle types and heavy metal deposition for North Sea aerosols using micro- and trace analysis techniques”. Injuk J, de Bock L, van Malderen H, Van Grieken R, (1996)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Studying the composition of atmospheric aerosols through the joint application of hierarchical, non-hierarchical and fuzzy clustering to EPXMA data sets”. Treiger B, Bondarenko I, van Malderen H, Van Grieken R, (1996)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Use of grazing emission XRF spectrometry for silicon wafer surface contamination measurements”. de Gendt S, Kenis K, Mertens PW, Heyns MM, Claes M, Van Grieken RE, Bailleul A, Knotter M, de Bokx PK, (1996)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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