Author |
Title |
Year |
Publication ![sorted by Publication field, ascending order (up)](img/sort_asc.gif) |
Volume |
Times cited |
Additional Links |
Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Blom, F.; Verbeeck, J.; Koster, G.; Houwman, E.P.; Rijnders, G. |
Interface degradation and field screening mechanism behind bipolar-cycling fatigue in ferroelectric capacitors |
2021 |
Apl Materials |
9 |
5 |
UA library record; WoS full record; WoS citing articles |
Chen, B.; Gauquelin, N.; Strkalj, N.; Huang, S.; Halisdemir, U.; Nguyen, M.D.; Jannis, D.; Sarott, M.F.; Eltes, F.; Abel, S.; Spreitzer, M.; Fiebig, M.; Trassin, M.; Fompeyrine, J.; Verbeeck, J.; Huijben, M.; Rijnders, G.; Koster, G. |
Signatures of enhanced out-of-plane polarization in asymmetric BaTiO3 superlattices integrated on silicon |
2022 |
Nature communications |
13 |
11 |
UA library record; WoS full record; WoS citing articles |
Wang, J.; Nguyen, M.D.; Gauquelin, N.; Verbeeck, J.; Do, M.T.; Koster, G.; Rijnders, G.; Houwman, E. |
On the importance of the work function and electron carrier density of oxide electrodes for the functional properties of ferroelectric capacitors |
2020 |
Physica Status Solidi-Rapid Research Letters |
14 |
6 |
UA library record; WoS full record; WoS citing articles |
Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Wang, J.; Verbeeck, J.; Blom, F.; Koster, G.; Houwman, E.P.; Rijnders, G. |
Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors |
2020 |
Scientific Reports |
10 |
18 |
UA library record; WoS full record; WoS citing articles |