Number of records found: 9
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Citations
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Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison”. Alfeld M, Vekemans B, Janssens K, Falkenberg G, Broekaert JAC, Gao N, Gibson D (2007).
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Electron energy-loss spectroscopy and its application to individual particle analysis”. Xhoffer C, Jacob W, Van Grieken R, Broekaert JAC, Buseck P, (1992)
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 85, 670 (2013). http://doi.org/10.1021/ac3031459
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 80, 4317 (2008). http://doi.org/10.1021/ac8006297
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 78, 3917 (2006). http://doi.org/10.1021/ac060597m
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 76, 3313 (2004). http://doi.org/10.1021/ac040052x
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 74, 2691 (2002). http://doi.org/10.1021/ac020190r
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Atomic spectroscopy: a review”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 82, 4653 (2010). http://doi.org/10.1021/ac1010469
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Mobile depth profiling and sub-surface imaging techniques for historical paintings : a review”. Alfeld M, Broekaert JAC, Spectrochimica acta: part B : atomic spectroscopy 88, 211 (2013). http://doi.org/10.1016/J.SAB.2013.07.009
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