Record |
Author |
Hendrich, C.; Favre, L.; Ievlev, D.N.; Dobrynin, A.N.; Bras, W.; Hörmann, U.; Piscopiello, E.; Van Tendeloo, G.; Lievens, P.; Temst, K. |
Title |
Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering |
Type |
A1 Journal article |
Year |
2007 |
Publication ![sorted by Publication field, ascending order (up)](img/sort_asc.gif) |
Applied physics A : materials science & processing |
Abbreviated Journal |
Appl Phys A-Mater |
Volume |
86 |
Issue |
4 |
Pages |
533-538 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Heidelberg |
Editor |
|
Language |
|
Wos |
000243802400021 |
Publication Date |
2007-01-11 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0947-8396;1432-0630; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.455 |
Times cited |
11 |
Open Access |
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Notes |
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Approved |
Most recent IF: 1.455; 2007 IF: 1.857 |
Call Number |
UA @ lucian @ c:irua:63036 |
Serial |
1964 |
Permanent link to this record |