Home | << 1 >> |
Record | |||||
---|---|---|---|---|---|
Author | Luyten, W.; Van Tendeloo, G.; Amelinckx, S.; Collins, J.L. | ||||
Title | Electron microscopy study of defects in synthetic diamond layers | Type | A1 Journal article | ||
Year | 1992 | Publication | Philosophical magazine: A: physics of condensed matter: defects and mechanical properties | Abbreviated Journal | |
Volume | 66 | Issue | 6 | Pages | 899-915 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | London | Editor | ||
Language | Wos | A1992KC54700003 | Publication Date | 2007-07-08 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0141-8610;1460-6992; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | Times cited | 36 | Open Access | ||
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:4446 | Serial | 970 | ||
Permanent link to this record |