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Two phase intergrowth in Bi2Sr2Ca0.6Y0.4Cu2Oy single crystals”. Zhang XF, Van Tendeloo G, Ge SL, Emmen JHPM, Brabers VAM, Physica: C : superconductivity 215, 39 (1993). http://doi.org/10.1016/0921-4534(93)90362-T
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A 2a2a3c superstructure in hexagonal Ni1-xS : a study by means of electron-diffraction and HRTEM”. Lioutas CB, Manolikas C, Van Tendeloo G, van Landuyt J, Journal of crystal growth 126, 457 (1993). http://doi.org/10.1016/0022-0248(93)90051-W
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Carbon nano-tubes: their formation process and observation by electron microscopy”. Zhang XF, Zhang XB, Van Tendeloo G, Amelinckx S, op de Beeck M, van Landuyt J, Journal of crystal growth 130, 368 (1993). http://doi.org/10.1016/0022-0248(93)90522-X
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Conical, helically woud, graphite whiskers: a limliting member of the “fullerenes”?”.Amelinckx S, Luyten W, Krekels T, Van Tendeloo G, van Landuyt J, Journal of crystal growth 121, 543 (1992). http://doi.org/10.1016/0022-0248(92)90561-V
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High-resolution electron microscopy observations of large Pd clusters”. Volkov VV, Van Tendeloo G, Vargaftik MN, Moiseev II, Journal of crystal growth 132, 359 (1993). http://doi.org/10.1016/0022-0248(93)90059-6
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Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry”. Vanhellemont J, Maes HE, Schaekers M, Armigliato A, Cerva H, Cullis A, de Sande J, Dinges H, Hallais J, Nayar V, Pickering C, Stehlé, JL, Van Landuyt J, Walker C, Werner H, Salieri P;, Applied surface science T2 –, SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63, 45 (1993). http://doi.org/10.1016/0169-4332(93)90062-G
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Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM”. de Gryse O, Clauws P, Lebedev O, van Landuyt J, Vanhellemont J, Claeys C, Simoen E, Physica: B : condensed matter T2 –, 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308, 294 (2001). http://doi.org/10.1016/S0921-4526(01)00801-8
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Comparison of modeling calculations with experimental results for rf glow discharge optical emission spectrometry”. Bogaerts A, Wilken L, Hoffmann V, Gijbels R, Wetzig K, Spectrochimica acta: part B : atomic spectroscopy 57, 109 (2002). http://doi.org/10.1016/S0584-8547(01)00357-3
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Electron and hole localization in coupled InP/InGaP self-assembled quantum dots”. Tadić, M, Peeters FM, Partoens B, Janssens KL, Physica. E: Low-dimensional systems and nanostructures 13, 237 (2002). http://doi.org/10.1016/S1386-9477(01)00528-8
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Electronic structure of the valence band in cylindrical strained InP/InGaP quantum dots in an external magnetic field”. Tadic, Peeters FM, Physica. E: Low-dimensional systems and nanostructures T2 –, 14th International Conference on the Electronic Properties of, Two-Dimensional Systems, July 30-August 03, 2001, Prague, Czech Republic 12, 880 (2002). http://doi.org/10.1016/S1386-9477(01)00445-3
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Gas discharge plasmas and their applications”. Bogaerts A, Neyts E, Gijbels R, van der Mullen J, Spectrochimica acta: part B : atomic spectroscopy 57, 609 (2002). http://doi.org/10.1016/S0584-8547(01)00406-2
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Hybrid model for a cylindrical hollow cathode glow discharge and comparison with experiments”. Baguer N, Bogaerts A, Gijbels R, Spectrochimica acta: part B : atomic spectroscopy 57, 311 (2002). http://doi.org/10.1016/S0584-8547(01)00385-8
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Joule heat in a two-dimensional electron gas exposed to a normal non-homogeneous magnetic field of a 'chess' configuration”. Badalyan SM, Peeters FM, Physica: B : condensed matter 316, 216 (2002). http://doi.org/10.1016/S0921-4526(02)00462-3
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Magnetic confinement of electrons into quantum wires and dots on a liquid helium surface”. Freire JAK, Studart N, Peeters FM, Farias GA, Freire VN, Physica. E: Low-dimensional systems and nanostructures T2 –, 14th International Conference on the Electronic Properties of, Two-Dimensional Systems, July 30-August 03, 2001, Prague, Czech Republic 12, 946 (2002). http://doi.org/10.1016/S1386-9477(01)00416-7
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Quantum transport in a cylindrical sub-0.1 μm silicon-based MOSFET”. Balaban SN, Pokatilov EP, Fomin VM, Gladilin VN, Devreese JT, Magnus W, Schoenmaker W, van Rossum M, Sorée B, Solid-State Electronics 46, 435 (2002). http://doi.org/10.1016/S0038-1101(01)00117-4
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Quenching of the Hall effect in localised high magnetic field regions”. Novoselov KS, Geim AK, Dubonos SV, Cornelissens YG, Peeters FM, Maan JC, Physica. E: Low-dimensional systems and nanostructures 12, 244 (2002). http://doi.org/10.1016/S1386-9477(01)00364-2
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Spin-engineered quantum dots”. Fleurov V, Ivanov VA, Peeters FM, Vagner ID, Physica. E: Low-dimensional systems and nanostructures 14, 361 (2002). http://doi.org/10.1016/S1386-9477(01)00487-8
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Theory of trions in quantum wells”. Riva C, Peeters FM, Varga K, Physica. E: Low-dimensional systems and nanostructures T2 –, 14th International Conference on the Electronic Properties of, Two-Dimensional Systems, JUL 30-AUG 03, 2001, PRAGUE, CZECH REPUBLIC 12, 543 (2002). http://doi.org/10.1016/S1386-9477(01)00484-2
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X-ray analysis of riverbank sediment of the Tisza (Hungary): identification of particles from a mine pollution event”. Osán J, Kurunczi S, Török S, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 57, 413 (2002). http://doi.org/10.1016/S0584-8547(01)00405-0
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Can plasma spectrochemistry assist in improving the accuracy of chemical analysis?”.Adams F, Adriaens A, Bogaerts A, Analytica chimica acta 456, 63 (2002). http://doi.org/10.1016/S0003-2670(02)00010-7
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Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy”. Hens S, van Landuyt J, Bender H, Boullart W, Vanhaelemeersch S, Materials science in semiconductor processing 4, 109 (2001). http://doi.org/10.1016/S1369-8001(00)00147-5
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Microstructures and interfaces in Ni-Al martensite: comparing HRTEM observations with continuum theories”. Schryvers D, Boullay P, Potapov PL, Kohn RV, Ball JM, International journal of solids and structures 39, 3543 (2002). http://doi.org/10.1016/S0020-7683(02)00167-1
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The influence of the h-BN morphology and structure on the c-BN growth”. Nistor L, Teodorescu V, Ghica C, van Landuyt J, Dinca G, Georgeoni P, Diamond and related materials T2 –, 11th European Conference on Diamond, Diamond-like Materials, Carbon, Nanotubes, Nitrides and Silicon Carbide (Diamond 2000), SEP 03-08, 2000, OPORTO, PORTUGAL 10, 1352 (2001). http://doi.org/10.1016/S0925-9635(00)00377-0
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The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures”. Stuer C, van Landuyt J, Bender H, Rooyackers R, Badenes G, Materials science in semiconductor processing 4, 117 (2001). http://doi.org/10.1016/S1369-8001(00)00110-4
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Characterisation of aerosol particles in the São Paulo Metropolitan Area”. de Miranda RM, de Fátima Andrade M, Worobiec A, Van Grieken R, Atmospheric environment : an international journal 36, 345 (2002). http://doi.org/10.1016/S1352-2310(01)00363-6
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Preconcentration methods for the analysis of water by X-ray spectrometric techniques”. Van Grieken R, Analytica chimica acta 143, 3 (1982). http://doi.org/10.1016/S0003-2670(01)95486-8
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Structural transitions in a classical two-dimensional molecule system”. Ferreira WP, Farias GA, Carmona HA, Peeters FM, Solid state communications 122, 665 (2002). http://doi.org/10.1016/S0038-1098(02)00157-6
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Synthesis, structure and properties of layered bismuthates: (Ba,K)3Bi2O7 and (Ba,K)2BiO4”. Khasanova NR, Kovba ML, Putilin SN, Antipov EV, Lebedev OI, Van Tendeloo G, Solid state communications 122, 189 (2002). http://doi.org/10.1016/S0038-1098(02)00096-0
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Characterisation of wood combustion particles using electron probe microanalysis”. Osán J, Alföldy B, Török S, Van Grieken R, Atmospheric environment : an international journal 36, 2207 (2002). http://doi.org/10.1016/S1352-2310(02)00153-X
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Anion ordering in fluorinated La2CuO4”. Abakumov AM, Hadermann J, Van Tendeloo G, Shpanchenko RV, Oleinikov PN, Antipov EV, Journal of solid state chemistry 142, 311 (1999). http://doi.org/10.1006/jssc.1998.8064
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