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Author Title Year Publication Volume Times cited Additional Links
Batenburg, K.J.; Bals, S.; Sijbers, J.; Kübel, C.; Midgley, P.A.; Hernandez, J.C.; Kaiser, U.; Encina, E.R.; Coronado, E.A.; Van Tendeloo, G. 3D imaging of nanomaterials by discrete tomography 2009 Ultramicroscopy 109 220 UA library record; WoS full record; WoS citing articles
Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. DART explained: how to carry out a discrete tomography reconstruction 2008 UA library record
Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples 2014 UA library record