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“Influence of axial and radial diffusion processes on the analytical performance of a glow discharge cell”. van Straaten M, Gijbels R, Vertes A, Analytical chemistry 64, 1855 (1992). http://doi.org/10.1021/ac00041a021
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“Absorption correction for X-ray-fluorescence analysis of aerosol loaded filters”. Adams FC, Van Grieken RE, Analytical chemistry 47, 1767 (1975). http://doi.org/10.1021/AC60361A040
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“Absorption correction in electron probe x-ray microanalysis of thin samples”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 58, 1282 (1986). http://doi.org/10.1021/AC00298A003
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“Absorption correction via scattered radiation in energy-dispersive X-ray fluorescence analysis for samples of variable composition and thickness”. Van Dyck PM, Van Grieken RE, Analytical chemistry 52, 1859 (1980). http://doi.org/10.1021/AC50062A020
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“Atomic number correction in electron probe X-ray microanalysis of curved samples and particles”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2798 (1984). http://doi.org/10.1021/AC00278A036
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“Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 57, 2885 (1985). http://doi.org/10.1021/AC00291A032
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“Characterization of a 2,2'-diaminodiethylamine-cellulose filter toward metal cation extraction”. Smits JA, Van Grieken RE, Analytical chemistry 52, 1479 (1980). http://doi.org/10.1021/AC50059A022
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“Chelex-100 ion-exchange filter membranes for preconcentration in x-ray-fluorescence analysis of water”. Van Grieken RE, Bresseleers CM, Vanderborght BM, Analytical chemistry 49, 1326 (1977). http://doi.org/10.1021/AC50017A011
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“Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2049 (1984). http://doi.org/10.1021/AC00276A016
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“Discrimination between coprecipitated and adsorbed lead on individual calcite particles using laser microprobe mass analysis”. Wouters LC, Van Grieken RE, Linton RW, Bauer CF, Analytical chemistry 60, 2218 (1988). http://doi.org/10.1021/AC00171A011
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“Elemental trace analysis of small samples by proton-induced X-ray-emission”. Johansson TB, Van Grieken RE, Nelson JW, Winchester JW, Analytical chemistry 47, 855 (1975). http://doi.org/10.1021/AC60356A035
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“Embedded ion exchange beads as standards for laser microprobe mass analysis of biological specimens”. Verbueken AH, Van Grieken RE, Paulus GJ, De Bruijn WC, Analytical chemistry 56, 1362 (1984). http://doi.org/10.1021/AC00272A036
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“Enhancement effect in X-ray fluorescence analysis of environmental samples of medium thickness”. Van Dyck PM, Török SB, Van Grieken RE, Analytical chemistry 58, 1761 (1986). http://doi.org/10.1021/AC00121A036
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“Laser microprobe mass spectrometric identification of sulfur species in single micrometer-size particles”. Bruynseels FJ, Van Grieken RE, Analytical chemistry 56, 871 (1984). http://doi.org/10.1021/AC00270A004
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“Parameter evaluation for the analysis of oxide-based samples with radio ferquency glow discharge mass spectrometry”. de Gendt S, Van Grieken RE, Ohorodnik SK, Harrison WW, Analytical chemistry 67, 1026 (1995). http://doi.org/10.1021/AC00102A002
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“Sub-part-per-billion determination of total dissolved selenium and selenite in environmental waters by X-ray fluorescence spectrometry”. Robberecht HJ, Van Grieken RE, Analytical chemistry 52, 449 (1980). http://doi.org/10.1021/AC50053A017
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“X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 60, 28r (1988). http://doi.org/10.1021/AC00163A002
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“X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 58, 279r (1986). http://doi.org/10.1021/AC00296A019
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“Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields”. Adriaensen L, Vangaever F, Gijbels R, Analytical chemistry 76, 6777 (2004). http://doi.org/10.1021/ac049108d
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“Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging”. Vincze L, Vekemans B, Brenker FE, Falkenberg G, Rickers K, Somogyi A, Kersten M, Adams F, Analytical chemistry 76, 6786 (2004). http://doi.org/10.1021/AC049274L
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“Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images”. van Put A, Vertes A, Wegrzynek D, Treiger B, Van Grieken R, Fresenius' journal of analytical chemistry 350, 440 (1994). http://doi.org/10.1007/BF00321787
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“Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 76, 3313 (2004). http://doi.org/10.1021/ac040052x
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“X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 76, 3445 (2004). http://doi.org/10.1021/AC0400820
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“Speciation of aerosols by combining bulk ion chromatography and thin-window electron probe micro analysis”. Eyckmans K, de Hoog J, van der Auwera L, Van Grieken R, International journal of environmental analytical chemistry 83, 777 (2003). http://doi.org/10.1080/0306731031000118934
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“Applications of micro-analysis to individual environmental particles”. Jambers W, de Bock L, Van Grieken R, Fresenius' journal of analytical chemistry 355, 521 (1996). http://doi.org/10.1007/S0021663550521
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“The use of a secondary cathode to analyse solid non-conducting samples with direct current glow discharge mass spectrometry: potential and restrictions”. Schelles W, de Gendt S, Maes K, Van Grieken R, Fresenius' journal of analytical chemistry 355, 858 (1996). http://doi.org/10.1007/S0021663550858
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“An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data”. Ro C-U, Kim HK, Van Grieken R, Analytical chemistry 76, 1322 (2004). http://doi.org/10.1021/AC035149I
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“A Monte Carlo program for quantitative electron-induced x-ray analysis of individual particles”. Ro C-U, Osán J, Szalóki I, de Hoog J, Worobiec A, Van Grieken R, Analytical chemistry 75, 851 (2003). http://doi.org/10.1021/AC025973R
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“Design and development of a new program for data processing of mass spectra acquired by means of a high-resolution double-focusing glow-discharge mass spectrometer”. Robben J, Dufour D, Gijbels R, Fresenius' journal of analytical chemistry 370, 663 (2001). http://doi.org/10.1007/s002160100881
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“Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS)”. Lenaerts J, Verlinden G, Ignatova VA, van Vaeck L, Gijbels R, Geuens I, Fresenius' journal of analytical chemistry 370, 654 (2001). http://doi.org/10.1007/s002160100880
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