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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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|
Taylor, P.R.; Martin, J.M.L.; François, J.P.; Gijbels, R. |
An ab initio study of the C3+ cation using multireference methods |
1991 |
The journal of chemical physics |
95 |
|
UA library record |
|
|
|
Adelmann, C.; Wen, L.G.; Peter, A.P.; Pourtois, G.; et al. |
Alternative metals for advanced interconnects |
2014 |
2014 Ieee International Interconnect Technology Conference / Advanced Metallization Conference (iitc/amc) |
|
|
UA library record; WoS full record; |
|
|
|
Vandelannoote, R.; Blommaert, W.; van Grieken, R.; Gijbels, R. |
L'analyse des eaux géothermales par spectrométrie de masse à étincelles |
1979 |
Spectra 2000: la revue de l'instrumentation |
53 |
|
UA library record |
|
|
|
van Cleempoel, A.; Gijbels, R.; van den Heuvel, H.; Claeys, M. |
Analysis of C60 and C70 oxides by HPLC and low- and high-energy collision-induced dissocation tandem mass spectrometry |
1997 |
Proceedings Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials, 191th Meeting of the Electrochemical Society, Montreal, Canada, 4-9 May 1997 |
4 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Schelles, W.; van Grieken, R. |
Analysis of nonconducting materials by dc glow discharge spectrometry |
2003 |
|
|
|
UA library record |
|
|
|
Geuens, I.; Gijbels, R.; Jacob, W.A.; Verbeeck, A.; de Keyzer, R. |
Analysis of silver halide microcrystals using different modes of a scanning transmission electron microscope and digital image processing |
1992 |
The journal of imaging science and technology |
36 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Veldeman, E.; Van 't dack, L.; Gijbels, R.; Campbell, M.; Vanhaecke, F.; Vanhoe, H.; Vandecasteele, C. |
Analysis of thermal waters by ICP-MS |
1991 |
|
|
|
UA library record |
|
|
|
Martin, J.M.L.; François, J.P.; Gijbels, R. |
The anharmonic force field of thioformaldehyde, H2CS |
1994 |
Journal of molecular spectroscopy |
168 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Gijbels, R.; van Grieken, R. |
Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees) |
1977 |
|
|
|
UA library record |
|
|
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Gijbels, R.; van Grieken, R.; Blommaert, W.; Van 't dack, L.; van Espen, P.; Nullens, H.; Saelens, R. |
Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges) |
1983 |
|
|
|
UA library record |
|
|
|
Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. |
Application of neural networks in image analysis: the classification of geometrical shapes |
1993 |
CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology |
10 |
|
UA library record |
|
|
|
Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. |
Application of trace element analysis to geothermal waters |
1977 |
|
|
|
UA library record |
|
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|
Gijbels, R.; Oksenoid, K.G. |
Atomic mass spectrometry |
1995 |
|
|
|
UA library record |
|
|
|
Yusupov, M. |
Atomic scale simulations for a better insight in plasma medicine |
2014 |
|
|
|
UA library record |
|
|
|
Bogaerts, A.; Gijbels, R. |
Calculation of crater profiles on a flat cathode in a direct current glow discharge, and comparison with experiment |
1997 |
Spectrochimica acta: part B : atomic spectroscopy |
52 |
42 |
UA library record; WoS full record; WoS citing articles |
|
|
|
de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution |
1999 |
|
|
|
UA library record; WoS full record; |
|
|
|
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1995 |
Microbeam analysis |
4 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1994 |
Microbeam analysis |
3 |
|
UA library record |
|
|
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
|
|
|
UA library record |
|
|
|
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. |
Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas |
1997 |
Journal of crystal growth |
173 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Cleempoel, A.; Gijbels, R.; Claeys, M.; van den Heuvel, H. |
Characterization of ozonated C60 and C70 by high performance liquid chromatography and low- and high-energy collision-induced dissociation tandem mass spectrometry |
1996 |
Rapid communications in mass spectrometry |
10 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Gijbels, R. |
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals |
1991 |
Acta technica Belgica: metallurgie |
30 |
|
UA library record |
|
|
|
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
|
|
|
UA library record |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
|
|
|
UA library record |
|
|
|
van Dijk, J.; Kroesen, G.M.W.; Bogaerts, A. |
Cluster issue on plasma modelling |
2009 |
|
|
|
UA library record |
|
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Janssens, K.; Bogaerts, A.; van Grieken, R. |
Colloquium Spectroscopicum Internationale 34: a collection of papers presented at the Colloquium Spectroscopicum Internationale, Antwerp, Belgium, 4-9 September 2005 |
2006 |
|
|
|
UA library record |
|
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|
Bogaerts, A.; Janssens, K.; van Grieken, R. |
Colloquium Spectroscopicum Internationale 34 (CSI 34), Antwerp, Belgium, 4-9 September 2005 |
2006 |
|
|
|
UA library record |
|
|
|
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Combined characterization of nanostructures by AEM and STM |
1996 |
Mikrochimica acta: supplementum |
13 |
|
UA library record; WoS full record; |
|
|
|
Oleshko, V.P.; Gijbels, R.; Jacob, W. |
Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques |
1996 |
|
|
|
UA library record |
|
|
|
Eckert, M. |
Combined molecular dynamics and Monte Carlo simulations for the deposition of (ultra)nanocrystalline diamond |
2010 |
|
|
|
UA library record |
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