Abstract: Bilayers of carbon, consisting of a layer of natural carbon and a second layer highly enriched in 13C, were investigated with the LAMMA 500-® instrument. When such a bilayer is perforated by the laser beam, comparable amounts of 12C and 13C are evaporated and partly ionized so that geometry effects and recombination reactions during laser-induced ionization can straightforwardly be studied.

Abstract: The contamination of ground samples by a commercially available Lovibond McCrone Micronizing Mill is discussed. Tracer and weighing experiments showed that abrasion of corundum grinding elements was important, introducing 620 mg of abrasion products per minute of wet grinding. Agate grinding elements were abraded at ⩽6 mg min-1. The abrasion products and grinding elements were analyzed by x-ray fluorescence, spark-source mass spectrometry and neutron activation analysis. Contamination in trace element analysis of geological materials is likely to be negligible for agate grinding elements and, except for a few transition metals, also for corundum grinding elements. Contamination of typical biological samples is significant for a few elements even when agate elements are used, and is absolutely prohibitive for trace analysis when corundum elements are used.

Abstract: Chromium and silicon are determined simultaneously in steel by 14-MeV neutron activation analysis. The activities of 52V(Eγ=1.43 MeV,TView the MathML source=3.76 min) from 52Cr(n,p)52V and 28Al (Eγ=1.78 MeV; TView the MathML source=2.24 min) from 28Si(n,p)28Al are evaluated by mixed γ-ray spectrometry. The influence of manganese and phosphorus, the main interfering elements, is negligible for most stainless steels. The count rate should be limited, to avoid 52V pulse pile-up effects interfering in the 28Al energy region. Precisions in the 2-10% range are reached, depending on the concentrations, for a 10-min analysis time. Results for a series of steel samples are compared with industrial analyses.

Abstract: Energy-dispersive x-ray fluorescence is advantageous for trace analysis of soils present as thin films. A target thickness of about 2 mg cm-2 provides a compromise between optimal sensitivity and minimal absorption effect or optimal accuracy. Sample preparation involves only suspending the finely ground soil in water and drying this suspension on a thin mylar foil glued on a ring that fits into the x.r.f. spectrometer. The effective sample weight present in the exciting beam area is computed from the scatter peaks, a method that cancels out target heterogeneity problems. High accuracy is demonstrated for many elements in reference soil and rock materials; a precision around 5% and a detection limit around 10 ppm can be achieved. As an illustration, results for 16 trace elements and preliminary interpretation are given for a series of pedologically important soil samples from Brasil.

Abstract: Ammonia is important in the atmosphere because it neutralizes acidic species. The relative importance of different inorganic ammonium compounds (chloride, nitrate and sulfate) in marine air chemistry was studied by single-particle characterization with the laser microprobe mass analyser. Standard aerosols were generated as a reference for compound identification, based on the fingerprint spectra obtained, and calculation of the relative sensitivity achieved for different ions in a marine aerosol matrix. The relative sensitivity for ammonium was low. Aerosol samples were collected in the Southern Bight of the North Sea under different meteorological conditions and examined for their ammonium compounds. Samples collected during an inversion period with continental influences showed a much higher content in all particles than samples collected under different meteorological conditions, where ammonium was mostly detected in the submicrometer particle-size range.

Abstract: Control of the texture and the biaxial alignment of sputter deposited films has provoked a great deal of interest due to its technological importance. indeed, many physical properties of thin films are influenced by the biaxial alignment. In this context, extensive research has been established to understand the growth mechanism of biaxially aligned Yttria Stabilized Zirconia (YSZ) as a buffer layer for high temperature superconducting copper oxides. In this work, the growth mechanism in general and the mechanism responsible of the biaxial alignment in detail were investigated for thin films of YSZ and TiN deposited by unbalanced magnetron sputtering using non-aligned polycrystalline stainless steel substrates. The mechanism responsible for the preferential out-of-plane alignment has been investigated by performing depositions on a non-tilted substrate. However, to study the in-plane alignment a tilted substrate was used. The microstructure of the deposited layers was characterised by Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM). The crystallographic alignment has been investigated by X-ray diffraction (XRD) (angular scans and pole figures) and by Selective Area Diffraction (SAD). It was observed that the deposited layers show a zone T or zone II structure and the layers with a zone T structure consist of faceted grains. There seems to be a correlation between the crystal habit of these faceted grains and the measured biaxial alignment. A model for the preferential out-of-plane orientation, the in-plane alignment and the correlation between the microstructure and the biaxial alignment is proposed.