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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 62, 101r (1990). http://doi.org/10.1021/AC00211A001
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In vivo investigation of the distribution and the local speciation of selenium in Allium cepa L. by means of microscopic X-ray absorption near-edge structure spectroscopy and confocal microscopic X-ray fluorescence analysis”. Bulska E, Wysocka IA, Wierzbicka MH, Proost K, Janssens K, Falkenberg G, Analytical chemistry 78, 7616 (2006). http://doi.org/10.1021/AC060380S
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 78, 3917 (2006). http://doi.org/10.1021/ac060597m
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Quantitative trace element analysis of individual fly ash particles by means of X-ray microfluorescence”. Vincze L, Somogyi A, Osán J, Vekemans B, Török S, Janssens K, Adams F, Analytical chemistry 74, 1128 (2002). http://doi.org/10.1021/AC010789B
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 78, 4069 (2006). http://doi.org/10.1021/AC060688J
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Quantitative determination of low-Z elements in single atmospheric particles on boron substrates by automated scanning electron microscopy: energy-dispersive X-ray spectrometry”. Choël M, Deboudt K, Osán J, Flament P, Van Grieken R, Analytical chemistry 77, 5686 (2005). http://doi.org/10.1021/AC050739X
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Effective sample weight from scatter peaks in energy-dispersive x-ray fluorescence”. van Espen P, Van 't dack L, Adams F, Van Grieken R, Analytical chemistry 51, 961 (1979). http://doi.org/10.1021/AC50043A042
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Influence of axial and radial diffusion processes on the analytical performance of a glow discharge cell”. van Straaten M, Gijbels R, Vertes A, Analytical chemistry 64, 1855 (1992). http://doi.org/10.1021/ac00041a021
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Absorption correction for X-ray-fluorescence analysis of aerosol loaded filters”. Adams FC, Van Grieken RE, Analytical chemistry 47, 1767 (1975). http://doi.org/10.1021/AC60361A040
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Absorption correction in electron probe x-ray microanalysis of thin samples”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 58, 1282 (1986). http://doi.org/10.1021/AC00298A003
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Absorption correction via scattered radiation in energy-dispersive X-ray fluorescence analysis for samples of variable composition and thickness”. Van Dyck PM, Van Grieken RE, Analytical chemistry 52, 1859 (1980). http://doi.org/10.1021/AC50062A020
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Atomic number correction in electron probe X-ray microanalysis of curved samples and particles”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2798 (1984). http://doi.org/10.1021/AC00278A036
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Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 57, 2885 (1985). http://doi.org/10.1021/AC00291A032
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Characterization of a 2,2'-diaminodiethylamine-cellulose filter toward metal cation extraction”. Smits JA, Van Grieken RE, Analytical chemistry 52, 1479 (1980). http://doi.org/10.1021/AC50059A022
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Chelex-100 ion-exchange filter membranes for preconcentration in x-ray-fluorescence analysis of water”. Van Grieken RE, Bresseleers CM, Vanderborght BM, Analytical chemistry 49, 1326 (1977). http://doi.org/10.1021/AC50017A011
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Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2049 (1984). http://doi.org/10.1021/AC00276A016
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Discrimination between coprecipitated and adsorbed lead on individual calcite particles using laser microprobe mass analysis”. Wouters LC, Van Grieken RE, Linton RW, Bauer CF, Analytical chemistry 60, 2218 (1988). http://doi.org/10.1021/AC00171A011
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Elemental trace analysis of small samples by proton-induced X-ray-emission”. Johansson TB, Van Grieken RE, Nelson JW, Winchester JW, Analytical chemistry 47, 855 (1975). http://doi.org/10.1021/AC60356A035
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Embedded ion exchange beads as standards for laser microprobe mass analysis of biological specimens”. Verbueken AH, Van Grieken RE, Paulus GJ, De Bruijn WC, Analytical chemistry 56, 1362 (1984). http://doi.org/10.1021/AC00272A036
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Enhancement effect in X-ray fluorescence analysis of environmental samples of medium thickness”. Van Dyck PM, Török SB, Van Grieken RE, Analytical chemistry 58, 1761 (1986). http://doi.org/10.1021/AC00121A036
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Laser microprobe mass spectrometric identification of sulfur species in single micrometer-size particles”. Bruynseels FJ, Van Grieken RE, Analytical chemistry 56, 871 (1984). http://doi.org/10.1021/AC00270A004
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Parameter evaluation for the analysis of oxide-based samples with radio ferquency glow discharge mass spectrometry”. de Gendt S, Van Grieken RE, Ohorodnik SK, Harrison WW, Analytical chemistry 67, 1026 (1995). http://doi.org/10.1021/AC00102A002
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Sub-part-per-billion determination of total dissolved selenium and selenite in environmental waters by X-ray fluorescence spectrometry”. Robberecht HJ, Van Grieken RE, Analytical chemistry 52, 449 (1980). http://doi.org/10.1021/AC50053A017
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 60, 28r (1988). http://doi.org/10.1021/AC00163A002
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 58, 279r (1986). http://doi.org/10.1021/AC00296A019
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Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields”. Adriaensen L, Vangaever F, Gijbels R, Analytical chemistry 76, 6777 (2004). http://doi.org/10.1021/ac049108d
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Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging”. Vincze L, Vekemans B, Brenker FE, Falkenberg G, Rickers K, Somogyi A, Kersten M, Adams F, Analytical chemistry 76, 6786 (2004). http://doi.org/10.1021/AC049274L
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 76, 3313 (2004). http://doi.org/10.1021/ac040052x
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 76, 3445 (2004). http://doi.org/10.1021/AC0400820
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An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data”. Ro C-U, Kim HK, Van Grieken R, Analytical chemistry 76, 1322 (2004). http://doi.org/10.1021/AC035149I
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