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Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles”. Storms HM, Janssens KH, Török SB, Van Grieken RE, X-ray spectrometry 18, 45 (1989). http://doi.org/10.1002/XRS.1300180203
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Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers”. Janssens K, Vincze L, van Espen P, Adams F, X-ray spectrometry 22, 234 (1993). http://doi.org/10.1002/XRS.1300220412
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Automated matrix-correction of line ratios in energy-dispersive x-ray fluorescence spectrum deconvolution”. Van Dyck P, Van Grieken R, X-ray spectrometry 12, 111 (1983). http://doi.org/10.1002/XRS.1300120306
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Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal”. Van Dyck P, Markowicz A, Van Grieken R, X-ray spectrometry 9, 70 (1980). http://doi.org/10.1002/XRS.1300090209
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Current trends in the literature on X-ray emission spectrometry”. Van Grieken R, Markowicz A, Veny P, X-ray spectrometry 20, 271 (1991). http://doi.org/10.1002/XRS.1300200605
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Determination of barium, lanthanum, cerium and neodymium in lateritic materials by various energy-dispersive X-ray fluorescence techniques and neutron activation analysis”. Labrecque JJ, Beusen JM, Van Grieken RE, X-ray spectrometry 15, 13 (1986). http://doi.org/10.1002/XRS.1300150105
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Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation”. Araujo MF, van Espen P, Van Grieken R, X-ray spectrometry 19, 29 (1990). http://doi.org/10.1002/XRS.1300190107
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EDXRS study of aerosol composition variations in air masses crossing the North Sea”. Injuk J, van Malderen H, Van Grieken R, Swietlicki E, Knox JM, Schofield R, X-ray spectrometry 22, 220 (1993). http://doi.org/10.1002/XRS.1300220410
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Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples”. Markowicz A, Storms H, Van Grieken R, X-ray spectrometry 15, 131 (1986). http://doi.org/10.1002/XRS.1300150211
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Folding of aerosol loaded filters during X-ray fluorescence analysis”. Van Grieken RE, Adams FC, X-ray spectrometry 5, 61 (1976). http://doi.org/10.1002/XRS.1300050204
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Heterogeneity effects in direct X-ray fluorescence analysis of hair”. Török S, Van Dyck P, Van Grieken R, X-ray spectrometry 13, 27 (1984). http://doi.org/10.1002/XRS.1300130106
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Heterogeneity effects in direct XRF analysis of traces of heavy metals preconcentrated on polyurethane foam sorbents”. Török S, Braun T, Van Dyck P, Van Grieken R, X-ray spectrometry 15, 7 (1986). http://doi.org/10.1002/XRS.1300150104
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Influence of sample thickness, excitation energy and geometry on particle size effects in XRF”. Van Dyck P, Markowicz A, Van Grieken R, X-ray spectrometry 14, 183 (1985). http://doi.org/10.1002/XRS.1300140409
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Monte Carlo simulation of backscattered peaks in secondary target energy-dispersive X-ray spectra”. Van Dyck P, Török S, Van Grieken R, X-ray spectrometry 15, 231 (1986). http://doi.org/10.1002/XRS.1300150403
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Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis”. Markowicz A, Van Dyck P, Van Grieken R, X-ray spectrometry 9, 52 (1980). http://doi.org/10.1002/XRS.1300090205
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A simple absorption correction for electron probe X-ray microanalysis of bulk samples”. Markowicz A, Storms H, Van Grieken R, X-ray spectrometry 15, 115 (1986). http://doi.org/10.1002/XRS.1300150209
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M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range”. Trincavelli J, Montoro S, van Espen P, Van Grieken R, X-ray spectrometry 22, 372 (1993). http://doi.org/10.1002/XRS.1300220510
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Theoretical evaluation of the effective alpha and De Jongh approaches in X-ray fluorescence analysis of geological materials in borax glass beads”. Muia LM, Van Grieken R, X-ray spectrometry 18, 259 (1989). http://doi.org/10.1002/XRS.1300180604
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Trace analysis of estuarine brown algae by energy-dispersive X-ray fluorescence”. Sauter L, Van der Ben D, Van Grieken R, X-ray spectrometry 8, 159 (1979). http://doi.org/10.1002/XRS.1300080405
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Use of theoretical accurate binary influence coefficients with Tertian's equation in X-ray fluorescence analysis of silicate rocks in borax glass beads”. Muia LM, Van Grieken R, X-ray spectrometry 19, 141 (1990). http://doi.org/10.1002/XRS.1300190311
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Ruthenium staining as an alternative preparation method for automated EPMA of individual biogenic and organic particles”. Worobiec A, Kaplinski A, Van Grieken R, X-ray spectrometry 34, 245 (2005). http://doi.org/10.1002/XRS.807
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Optimization of experimental conditions of thin-window EPMA for ligh-element analysis of individual environmental particles”. Szalóki I, Osán J, Worobiec A, de Hoog J, Van Grieken R, X-ray spectrometry 30, 143 (2001). http://doi.org/10.1002/XRS.473.ABS
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Literature trends in x-ray emission spectrometry in the period 1990-2000: a review”. Injuk J, Van Grieken R, X-ray spectrometry 32, 35 (2003). http://doi.org/10.1002/XRS.606
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Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses”. Padilla R, van Espen P, Abrahantes A, Janssens K, X-ray spectrometry 34, 19 (2005). http://doi.org/10.1002/XRS.781
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EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments”. Fredrickx P, de Ryck I, Janssens K, Schryvers D, Petit J-P, Döcking H, X-ray spectrometry 33, 326 (2004). http://doi.org/10.1002/xrs.734
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Grazing-exit electron probe x-ray microanalysis of light elements in particles”. Spolnik Z, Tsuji K, Van Grieken R, X-ray spectrometry 33, 16 (2004). http://doi.org/10.1002/XRS.656
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Characterization of a polycapillary lens for use in micro-XANES experiments”. Proost K, Vincze L, Janssens K, Gao N, Bulska E, Schreiner M, Falkenberg G, X-ray spectrometry 32, 215 (2003). http://doi.org/10.1002/XRS.635
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Reconstruction of the three-dimensional distribution of elements in fly-ash particles by micro-XRF spectroscopy”. Rindby A, Janssens K, Osán J, X-ray spectrometry 32, 248 (2003). http://doi.org/10.1002/XRS.647
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Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563
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Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
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