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X-ray spectrometry”. Szalóki I, Török SB, Injuk J, Van Grieken RE, Analytical chemistry 74, 2895 (2002). http://doi.org/10.1021/AC020241K
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X-ray spectrometry”. Szalóki I, Török SB, Ro C-U, Injuk J, Van Grieken RE, Analytical chemistry 72, 211 (2000). http://doi.org/10.1021/A1000018H
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New developments and applications in GDMS”. Bogaerts A, Gijbels R, Fresenius' journal of analytical chemistry 364, 367 (1999). http://doi.org/10.1007/s002160051352
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Recent trends in solids mass spectrometry: GDMS and other methods”. Gijbels R, Bogaerts A, Fresenius' journal of analytical chemistry 359, 326 (1997). http://doi.org/10.1007/s002160050581
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Three-dimensional modeling of a direct current glow discharge in argon: is it better than one-dimensional modeling?”.Bogaerts A, Gijbels R, Fresenius' journal of analytical chemistry 359, 331 (1997). http://doi.org/10.1007/s002160050582
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The non-destructive determination of REE in fossilized bone using synchrotron radiation induced K-line X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Williams CT, Radtke M, Haller M, Knöchel A, Fresenius' journal of analytical chemistry 363, 413 (1999). http://doi.org/10.1007/S002160051212
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Performance of total reflection and grazing emission X-ray fluorescence spectrometry for the determination of trace metals in drinking water in relation to other analytical techniques”. Hołynska B, Olko M, Ostachowicz B, Ostachowicz J, Wegrzynek D, Claes M, Van Grieken R, de Bokx P, Kump P, Necemer M, Fresenius' journal of analytical chemistry 362, 294 (1998). http://doi.org/10.1007/S002160051077
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A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence”. Kempenaers L, Janssens K, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Simionovici AS, Adams F, Analytical chemistry 74, 5017 (2002). http://doi.org/10.1021/AC025662G
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Design and development of a new program for data processing of mass spectra acquired by means of a high-resolution double-focusing glow-discharge mass spectrometer”. Robben J, Dufour D, Gijbels R, Fresenius' journal of analytical chemistry 370, 663 (2001). http://doi.org/10.1007/s002160100881
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Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS)”. Lenaerts J, Verlinden G, Ignatova VA, van Vaeck L, Gijbels R, Geuens I, Fresenius' journal of analytical chemistry 370, 654 (2001). http://doi.org/10.1007/s002160100880
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Micro-heterogeneity study of trace elements in BCR CRM 680 by means of synchrotron micro-XRF”. Kempenaers L, de Koster C, van Borm W, Janssens K, Fresenius' journal of analytical chemistry 369, 733 (2001). http://doi.org/10.1007/S002160000679
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A Monte Carlo program for quantitative electron-induced x-ray analysis of individual particles”. Ro C-U, Osán J, Szalóki I, de Hoog J, Worobiec A, Van Grieken R, Analytical chemistry 75, 851 (2003). http://doi.org/10.1021/AC025973R
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An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data”. Ro C-U, Kim HK, Van Grieken R, Analytical chemistry 76, 1322 (2004). http://doi.org/10.1021/AC035149I
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Applications of micro-analysis to individual environmental particles”. Jambers W, de Bock L, Van Grieken R, Fresenius' journal of analytical chemistry 355, 521 (1996). http://doi.org/10.1007/S0021663550521
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The use of a secondary cathode to analyse solid non-conducting samples with direct current glow discharge mass spectrometry: potential and restrictions”. Schelles W, de Gendt S, Maes K, Van Grieken R, Fresenius' journal of analytical chemistry 355, 858 (1996). http://doi.org/10.1007/S0021663550858
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Speciation of aerosols by combining bulk ion chromatography and thin-window electron probe micro analysis”. Eyckmans K, de Hoog J, van der Auwera L, Van Grieken R, International journal of environmental analytical chemistry 83, 777 (2003). http://doi.org/10.1080/0306731031000118934
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Atomic spectroscopy”. Bings NH, Bogaerts A, Broekaert JAC, Analytical chemistry 76, 3313 (2004). http://doi.org/10.1021/ac040052x
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 76, 3445 (2004). http://doi.org/10.1021/AC0400820
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Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images”. van Put A, Vertes A, Wegrzynek D, Treiger B, Van Grieken R, Fresenius' journal of analytical chemistry 350, 440 (1994). http://doi.org/10.1007/BF00321787
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Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields”. Adriaensen L, Vangaever F, Gijbels R, Analytical chemistry 76, 6777 (2004). http://doi.org/10.1021/ac049108d
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Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging”. Vincze L, Vekemans B, Brenker FE, Falkenberg G, Rickers K, Somogyi A, Kersten M, Adams F, Analytical chemistry 76, 6786 (2004). http://doi.org/10.1021/AC049274L
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Influence of axial and radial diffusion processes on the analytical performance of a glow discharge cell”. van Straaten M, Gijbels R, Vertes A, Analytical chemistry 64, 1855 (1992). http://doi.org/10.1021/ac00041a021
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Absorption correction for X-ray-fluorescence analysis of aerosol loaded filters”. Adams FC, Van Grieken RE, Analytical chemistry 47, 1767 (1975). http://doi.org/10.1021/AC60361A040
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Absorption correction in electron probe x-ray microanalysis of thin samples”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 58, 1282 (1986). http://doi.org/10.1021/AC00298A003
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Absorption correction via scattered radiation in energy-dispersive X-ray fluorescence analysis for samples of variable composition and thickness”. Van Dyck PM, Van Grieken RE, Analytical chemistry 52, 1859 (1980). http://doi.org/10.1021/AC50062A020
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Atomic number correction in electron probe X-ray microanalysis of curved samples and particles”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2798 (1984). http://doi.org/10.1021/AC00278A036
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Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 57, 2885 (1985). http://doi.org/10.1021/AC00291A032
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Characterization of a 2,2'-diaminodiethylamine-cellulose filter toward metal cation extraction”. Smits JA, Van Grieken RE, Analytical chemistry 52, 1479 (1980). http://doi.org/10.1021/AC50059A022
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Chelex-100 ion-exchange filter membranes for preconcentration in x-ray-fluorescence analysis of water”. Van Grieken RE, Bresseleers CM, Vanderborght BM, Analytical chemistry 49, 1326 (1977). http://doi.org/10.1021/AC50017A011
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Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2049 (1984). http://doi.org/10.1021/AC00276A016
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