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Defect structure of the low temperature α-cristobalite phase and the cristobalite <->, tridymite transformation in (Si-Ge)O2”. Lemmens H, Czank M, Van Tendeloo G, Amelinckx S, Physics and chemistry of minerals 27, 386 (2000). http://doi.org/10.1007/s002699900082
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Characterisation of individual aerosol particles for atmospheric and cultural heritage studies”. Van Grieken R, Gysels K, Hoornaert S, Joos P, Osán J, Szalóki I, Worobiec A, Water, air and soil pollution 123, 215 (2000). http://doi.org/10.1023/A:1005215304729
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Single particle analysis of aerosols, observed in the marine boundary layer during the Monterey Area Ship Tracks Experiment (MAST), with respect to cloud droplet formation”. de Bock LA, Joos PE, Noone KJ, Pockalny RA, Van Grieken RE, Journal of atmospheric chemistry 37, 299 (2000). http://doi.org/10.1023/A:1006416600722
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Multianalytical study of patina formed on archaeological metal objects from Bliesbruck-Reinheim”. Wadsak M, Constantinides I, Vittiglio G, Adriaens A, Janssens K, Schreiner M, Adams FC, Brunella P, Wuttmann M, Microchimica acta 133, 159 (2000). http://doi.org/10.1007/S006040070086
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Detection limits of grazing-exit EPMA for particle analysis”. Tsuji K, Spolnik Z, Wagatsuma K, Nullens R, Van Grieken RE, Microchimica acta 132, 357 (2000). http://doi.org/10.1007/S006040050080
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Light element analysis of individual microparticles using thin-window EPMA”. Osán J, Szalóki I, Ro C-U, Van Grieken R, Microchimica acta 132, 349 (2000). http://doi.org/10.1007/S006040050079
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Molecular information in static SIMS for the speciation of inorganic compounds”. van Ham R, Adriaens A, van Vaeck L, Gijbels R, Adams F, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 161/163, 245 (2000). http://doi.org/10.1016/S0168-583X(99)00750-8
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Electric quadrupole interactions and the γ-&alpha, phase transition in Ce: the role of conduction electrons”. Nikolaev AV, Michel KH, European physical journal : B : condensed matter and complex systems 17, 15 (2000). http://doi.org/10.1007/s100510070156
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Transmission electron microscopy of NdNiO3 thin films on silicon substrates”. Laffez P, Retoux R, Boullay P, Zaghrioui M, Lacorre P, Van Tendeloo G, European physical journal: applied physics 12, 55 (2000). http://doi.org/10.1051/epjap:2000171
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The preparation and preliminary characterisation of eight geological MPI-DING reference glasses for in-site microanalysis”. Jochum KP, Dingwell DB, Rocholl A, Janssens K, Vincze L, et al, Geostandards newsletter 24, 87 (2000). http://doi.org/10.1111/J.1751-908X.2000.TB00590.X
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Influence of the lattice symmetry on melting of the bilayer Wigner crystal”. Schweigert IV, Schweigert VA, Peeters FM, Journal de physique: 4 T2 –, International Conference on Strongly Coupled Coulomb Systems, SEP 04-10, 1999, ST MALO, FRANCE 10, 117 (2000). http://doi.org/10.1051/jp4:2000515
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Ferroelastic domains in lead phosphate-arsenate: an AFM, X-ray diffraction, TEM and raman study”. Bismayer U, Mathes D, Oroyo M, Bosbach D, Putnis A, Van Tendeloo G, Güttler B, Phase transitions 71, 243 (2000). http://doi.org/10.1080/01411590008229654
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The ferroelectric phase transition in tridymite type BaAl2O4 studied by electron microscopy”. Abakumov AM, Lebedev OI, Nistor L, Van Tendeloo G, Amelinckx S, Phase transitions 71, 143 (2000). http://doi.org/10.1080/01411590008224545
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Gradient expansion and beyond for stress tensor and tangential pressure deficit through a planar liquid-vapour interface”. Lamoen D, March NH, Physics And Chemistry Of Liquids 38, 495 (2000). http://doi.org/10.1080/00319100008030296
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High-resolution electron microscopy study of strained epitaxial La0.7Sr0.3MnO3 thin films”. Lebedev OI, Van Tendeloo G, Amelinckx S, Ju HL, Krishnan KM, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 80, 673 (2000). http://doi.org/10.1080/01418610008212075
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A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source”. van Vaeck L, van Espen P, Gijbels R, Baykut G, Laukien FH, European mass spectrometry 6, 277 (2000). http://doi.org/10.1255/ejms.342
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Microstructure of CuXMo6S8 Chevrel phase thin films on R-plane sapphire”. Richard O, Van Tendeloo G, Lemée N, le Lannic J, Guilloux-Viry M, Perrin A, Journal of electron microscopy 49, 493 (2000). http://doi.org/10.1093/oxfordjournals.jmicro.a023834
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