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Ş,entosun K (2018) 2D and 3D characterization of plasmonic and porous nanoparticles using transmission electron microscopy. Antwerp
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Berthelot A (2018) Modeling of microwave plasmas for carbon dioxide conversion. University of Antwerp, Antwerp
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65th birthdays of W. Owen Saxton, David J. Smith and Dirk Van Dyck / PICO 2013 From multislice to big bang”. Lichte H, Dunin-Borkowski R, Tillmann K, Van Aert S, Van Tendeloo G Amsterdam (2013).
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Atomen tellen”. Van Aert S, Batenburg J, Van Tendeloo S, Nederlands tijdschrift voor natuurkunde (1991) 77, 292 (2011)
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Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, , 213 (2000)
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The classical electron gas in artificial structures”. Peeters FM, Partoens B, Kong M, , 235 (2004)
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Colloquium Spectroscopicum Internationale 34: a collection of papers presented at the Colloquium Spectroscopicum Internationale, Antwerp, Belgium, 4-9 September 2005”. Janssens K, Bogaerts A, van Grieken R Elsevier, Amsterdam (2006).
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Colloquium Spectroscopicum Internationale 34 (CSI 34), Antwerp, Belgium, 4-9 September 2005”. Bogaerts A, Janssens K, van Grieken R Elsevier, Amsterdam (2006).
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High-resolution electron microscopy for semiconducting materials science”. van Landuyt J, Vanhellemont J Elsevier, Amsterdam, page 1109 (1994).
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Ion beam synthesis of β-SiC at 9500C and structural characterization”. Frangis N, Nejim A, Hemment PLF, Stoemenos J, van Landuyt J, Nuclear instruments and methods in physics research B112, 325 (1996)
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Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
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Study of oxynitrides with dual beam TOF-SIMS”. de Witte H, Conard T, Vandervorst W, Gijbels R, , 611 (2000)
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TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates”. Lenaerts J, Verlinden G, van Vaeck L, Gijbels R, Geuens I, , 115 (2000)
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XPS study of ion induced oxidation of silicon with and without oxygen flooding”. de Witte H, Conard T, Sporken R, Gouttebaron R, Magnee R, Vandervorst W, Caudano R, Gijbels R, , 73 (2000)
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Structures and spectroscopic properties of sulfur-nitrogen-pnictogen chains : R2P-N=S=N-PR2 and R2P-N=S=N-AsR2”. Bal KM, Cautereels J, Blockhuys F, Journal of molecular structure 1132, 102 (2017). http://doi.org/10.1016/J.MOLSTRUC.2016.08.008
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3D reconstruction of a Ni51Ti49 alloy with precipitates by FIB-SEM alice-and-view”. Cao S, Tirry W, Schryvers D, Materia Japan 46, 803 (2007)
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Application of neural networks in image analysis: the classification of geometrical shapes”. Geuens I, Nys B, Gijbels R, Jacob W, CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology 10, 61 (1993)
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Cation ordering in Tl- and Hg-based superconducting materials”. Van Tendeloo G, De Meulenaere P, Hervieu M, Letouze F, Martin C, (1996)
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Corrélations chimiques-géothermométriques des paramètres microchimiques des hydrothermes profonds”. Pentcheva E, Van 't dack L, Veldeman E, Gijbels R, Comptes rendus de l'Académie bulgare des sciences 49, 61 (1996)
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The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES”. Shimizu K, Habazaki H, Bender H, Gijbels R, Engineering materials 52, 97 (2004)
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Defect structure of Hg-based ceramic superconductors”. Van Tendeloo G, Hervieu M, Chaillout C, Icem 13, 949 (1994)
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Destruction of magnetophonon resonance in high mobility heterojunctions from competition between elastic and inelastic scattering”. Xu W, Leadley DR, Peeters FM, Devreese JT, Nicholas RJ, Harris JJ, Foxon CT, Proceedings of the International Conference on the Physics of Semiconductors 22, 839 (1994)
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Development of a Fourier transform laser microprobe mass spectrometer with external ion source”. Gijbels R, ICR/Ion trap newsletter 30 (1993)
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Displacive and diffusive components in the formation of the Ni2Al structure studied by HREM, SAED and micro-ED”. Muto S, Merk N, Schryvers D, Tanner LE, Monterey Institute for Advances Studies , 101 (1992)
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Effects of confinement in strongly-coupled superlattices on impurity bound magneto-polarons”. Shi JM, Peeters FM, Devreese JT, Cheng J-P, Kono J, McCombe BD, Proceedings of the International Conference on the Physics of Semiconductors 22, 2267 (1994)
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Electron-electron scattering induced capture in GaAs quantum wells”. Kálna K, Mo×ko M, Peeters FM, Lithuanian journal of physics 35, 435 (1995)
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Electron-irridation-induced martensitic transformation in a Ni63Al37 observed in-situ by HREM”. Muto S, Schryvers D, MRS Japan: shape memory materials 18, 853 (1993)
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Electron mobility in Si delta-doped GaAs”. Hai GQ, Studart N, Peeters FM, Devreese JT, Koenraad PM, van de Stadt AFW, Wolter JH, Proceedings of the International Conference on the Physics of Semiconductors 22, 823 (1994)
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Enhancement of critical magnetic field in superconducting nanostructures”. Fomin VM, Devreese JT, Misko VR, 1, 134 (2002)
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Evolution of impurity clusters and photographic sensitivity”. Oleshko VP, Gijbels RH, Bilous VM, Jacob WA, Alfimov MV, Zhurnal nauchnoj prikladnoj fotografii i kinematografii 45, 1 (2000)
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