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Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe”. Janssens G, Geuens I, de Keyzer R, van Espen P, Gijbels R, Hubin A, Terryn H, Vereecken J Wiley, Chichester, page 161 (1996).
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Glow discharge optical spectroscopy and mass spectrometry”. Bogaerts A John Wiley & Sons, Chichester, page 1 (2016).
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Inorganic mass spectrometry”. Adams F, Gijbels R, Van Grieken R Wiley, Chichester, page 404 p. (1988).
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Physics of generation and detection of signals used for microcharacterization”. Remond G, Gijbels R, Levenson LL, Shimizu R Scanning Microscopy International, Chicago, Ill. (1994).
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Defect related growth of tabular AgCl(100) crystals: a TEM study”. van Renterghem W, Schryvers D, van Landuyt J, van Roost C, , 389 (1998)
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HREM of defects in cubic boron nitride single crystals”. Nistor LC, van Landuyt J, Dincã, G, , 695 (1998)
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Analysis of thermal waters by ICP-MS”. Veldeman E, Van 't dack L, Gijbels R, Campbell M, Vanhaecke F, Vanhoe H, Vandecasteele C The Royal Society of Chemistry, Cambridge, page 25 (1991).
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Fundamental aspects of an analytical glow discharge”. van Straaten M, Gijbels R Royal Society of Chemistry, Cambridge, page 130 (1993).
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Identification of new superconducting compounds by electron microscopy”. Van Tendeloo G, Krekels T Cambridge University Press, Cambridge, page 161 (2000).
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Large bipolarons and high-Tc materials”. Devreese JT, Verbist G, Peeters FM Cambridge University Press, Cambridge, page 385 (1995).
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Application of trace element analysis to geothermal waters”. Gijbels R, van Grieken R, Blommaert W, Vandelannoote R, Van 't dack L, , 429 (1977)
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Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9”. Seo JW, Schryvers D, Potapov P, , 17 (1998)
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HREM investigation of La(1-x)Ca(x)MnO3-delta thin films”. Lebedev O, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier HU, , 517 (1998)
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Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques”. Oleshko VP, Gijbels RH, Jacob WA, , 657 (1998)
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SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification”. Gijbels R, Verlinden G, Geuens I London Institute of Physics, Bristol, page 331 (2000).
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Study of electron excitations in Ag(Br,I) nanocrystals by cryo-AEM techniques”. Oleshko VP, van Daele AJ, Gijbels RH, Jacob WA, , 659 (1998)
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Electron diffraction and microscopy of single-walled carbon nanotube bundles”. Colomer J-F, Van Tendeloo G Kluwer, Boston, Mass., page 45 (2003).
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Modeling aspects of plasma-enhanced chemical vapor deposition of carbon-based materials”. Neyts E, Mao M, Eckert M, Bogaerts A CRC Press, Boca Raton, Fla, page 245 (2012).
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Correlation between a remote electron and a two-dimensional electron gas in resonant tunneling devices”. Kato H, Peeters FM, , 843 (2001)
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DART explained: how to carry out a discrete tomography reconstruction”. Batenburg KJ, Bals S, Sijbers J, Van Tendeloo G, , 295 (2008)
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Electron microscopy of C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S Springer, Berlin, page 182 (1993).
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Enhanced spin and isospin blockade in two vertically coupled quantum dots”. Partoens B, Peeters FM, , 1035 (2001)
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Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals”. Lisiecki I, Turner S, Bals S, Pileni MP, Van Tendeloo G Springer, Berlin, page 273 (2008).
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High energy transitions and phonon-assisted harmonics of a shallow magneto-donor in GaAs/AlGaAs multiple quantum wells”. Bruno-Alfonso A, Hai G-Q, Peeters FM, Yeo T, Ryu SR, McCombe BD, , 1413 (2001)
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High-resolution visualization techniques : structural aspects”. Schryvers D, Van Aert S Springer, Berlin, page 135 (2012).
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Magnetic traps for excitons in GaAs/AlxGa1-xAs quantum wells”. Freire JAK, Peeters FM, Matulis A, Freire VN, Farias GA, , 503 (2001)
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Magneto-optical spectrum of a quantum dot”. Geerinckx F, Peeters FM, Wen X, Devreese JT, (1991)
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Modeling of the magnetron discharge”. Bogaerts A, Kolev I, Buyle G Springer, Berlin, page 61 (2008).
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The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2008).
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The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2007).
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