| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Gijbels, R. |
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals |
1991 |
Acta technica Belgica: metallurgie |
30 |
|
UA library record |
| Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. |
Application of trace element analysis to geothermal waters |
1977 |
|
|
|
UA library record |
| Vandelannoote, R.; Van 't dack, L.; Gijbels, R. |
Trace element and micro-mineral composition of some selected anhydrite samples from the Saint Ghislain drill hole (Hainaut, Belgium) |
1986 |
Bulletin van de Belgische Vereniging voor Geologie |
95 |
|
UA library record |
| Veldeman, E.; Van 't dack, L.; Gijbels, R.; Campbell, M.; Vanhaecke, F.; Vanhoe, H.; Vandecasteele, C. |
Analysis of thermal waters by ICP-MS |
1991 |
|
|
|
UA library record |
| van Straaten, M.; Gijbels, R. |
Fundamental aspects of an analytical glow discharge |
1993 |
|
|
|
UA library record; WoS full record; |
| Oleshko, V.P.; Brichkin, S.B.; Gijbels, R.; Jacob, W.A.; Razumov, V.F. |
Observation of exciton states in silver halide nanoparticles by cryo-electron spectroscopic imaging and electron energy-loss spectroscopy |
1997 |
Mendeleev communications |
7 |
5 |
UA library record; WoS full record; WoS citing articles |
| Verlinden, G.; Gijbels, R.; Geuens, I. |
Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS |
2002 |
Microscopy and microanalysis |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
| Eeckhaoudt, S.; van Vaeck, L.; Gijbels, R.; van Grieken, R.E. |
Laser microprobe mass spectrometry in biology and biomedicine |
1994 |
Scanning microscopy |
S8 |
|
UA library record |
| Wu, S.; van Daele, A.; Jacob, W.; Gijbels, R.; Verbeeck, A.; de Keyzer, R. |
Microanalysis of individual silver halide microcrystals |
1993 |
Scanning microscopy |
7 |
7 |
UA library record; WoS full record; WoS citing articles |
| Remond, G.; Gijbels, R.; Levenson, L.L.; Shimizu, R. |
Physics of generation and detection of signals used for microcharacterization |
1994 |
|
|
|
UA library record |
| Geuens, I.; Nys, B.; Naudts, J.; Gijbels, R.; Jacob, W.; van Espen, P. |
The primary energy dependence of backscattered electron images up to 100 keV |
1991 |
Scanning microscopy |
5 |
3 |
UA library record; WoS full record; WoS citing articles |
| Vertes, A.; Gijbels, R. |
Restricted energy transfer in laser desorption of high molecular weight biomolecules |
1991 |
Scanning microscopy |
5 |
11 |
UA library record; WoS full record; WoS citing articles |
| Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
Comparative study of organic dyes with time-of-flight static secondary ion mass spectrometry and related techniques |
2005 |
Journal of mass spectrometry |
40 |
4 |
UA library record; WoS full record; WoS citing articles |
| van Straaten, M.; Butaye, L.; Gijbels, R. |
Depth profiling of coated steel wires by GDMS |
1992 |
|
|
|
UA library record |
| Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
|
|
|
UA library record |
| Geuens, I.; Gijbels, R.; Jacob, W. |
Depth profiling of silver halide microcrystals |
1991 |
|
|
|
UA library record |
| Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
|
|
UA library record |
| Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
|
|
|
UA library record |
| van Roy, W.; Struyf, H.; van Vaeck, L.; Gijbels, R.; Caravatti, P. |
A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis |
1994 |
|
|
|
UA library record |
| Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. |
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals |
1998 |
|
|
|
UA library record |
| Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
Mass spectrometry, inorganic |
1998 |
|
|
|
UA library record |
| de Witte, H.; Vandervorst, W.; Gijbels, R. |
Modeling of bombardment induced oxidation of silicon with and without oxygen flooding |
1998 |
|
|
|
UA library record |
| van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H. |
A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source |
2000 |
European mass spectrometry |
6 |
10 |
UA library record; WoS full record; WoS citing articles |
| Bogaerts, A.; Gijbels, R. |
Numerical modelling of analytical glow discharges |
2003 |
|
|
|
UA library record |
| Verlinden, G.; Gijbels, R.; Geuens, I. |
Photographic materials |
2001 |
|
|
|
UA library record |
| Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
|
|
|
UA library record |
| Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
|
|
|
UA library record |
| Adams, F.; Gijbels, R.; Van Grieken, R. |
Inorganic mass spectrometry |
1988 |
|
|
|
UA library record |
| Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1995 |
Microbeam analysis |
4 |
9 |
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1994 |
Microbeam analysis |
3 |
|
UA library record |
