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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Bending, S.J.; Milošević, M.V.; Moshchalkov, V.V. |
Polarity-dependent vortex pinning and spontaneous vortex-antivortex structures in superconductor/ferromagnet hybrids |
2010 |
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UA library record |
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Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
2008 |
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UA library record |
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Neyts, E.; Mao, M.; Eckert, M.; Bogaerts, A. |
Modeling aspects of plasma-enhanced chemical vapor deposition of carbon-based materials |
2012 |
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UA library record |
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Colomer, J.-F.; Van Tendeloo, G. |
Electron diffraction and microscopy of single-walled carbon nanotube bundles |
2003 |
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UA library record |
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Seo, J.W.; Schryvers, D.; Potapov, P. |
Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9 |
1998 |
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UA library record; WoS full record; |
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Lebedev, O.; Van Tendeloo, G.; Amelinckx, S.; Leibold, B.; Habermeier, H.U. |
HREM investigation of La(1-x)Ca(x)MnO3-delta thin films |
1998 |
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UA library record; WoS full record; |
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Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques |
1998 |
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UA library record; WoS full record; |
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Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
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UA library record; WoS full record; |
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Oleshko, V.P.; van Daele, A.J.; Gijbels, R.H.; Jacob, W.A. |
Study of electron excitations in Ag(Br,I) nanocrystals by cryo-AEM techniques |
1998 |
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UA library record; WoS full record; |
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Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. |
Application of trace element analysis to geothermal waters |
1977 |
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UA library record |
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Veldeman, E.; Van 't dack, L.; Gijbels, R.; Campbell, M.; Vanhaecke, F.; Vanhoe, H.; Vandecasteele, C. |
Analysis of thermal waters by ICP-MS |
1991 |
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UA library record |
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van Straaten, M.; Gijbels, R. |
Fundamental aspects of an analytical glow discharge |
1993 |
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UA library record; WoS full record; |
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Van Tendeloo, G.; Krekels, T. |
Identification of new superconducting compounds by electron microscopy |
2000 |
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UA library record |
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Devreese, J.T.; Verbist, G.; Peeters, F.M. |
Large bipolarons and high-Tc materials |
1995 |
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UA library record |
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van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C. |
Defect related growth of tabular AgCl(100) crystals: a TEM study |
1998 |
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UA library record; WoS full record; |
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Nistor, L.C.; van Landuyt, J.; Dincã, G. |
HREM of defects in cubic boron nitride single crystals |
1998 |
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UA library record; WoS full record; |
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Remond, G.; Gijbels, R.; Levenson, L.L.; Shimizu, R. |
Physics of generation and detection of signals used for microcharacterization |
1994 |
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UA library record |
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Bogaerts, A.; Schelles, W.; van Grieken, R. |
Analysis of nonconducting materials by dc glow discharge spectrometry |
2003 |
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UA library record |
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van Straaten, M.; Butaye, L.; Gijbels, R. |
Depth profiling of coated steel wires by GDMS |
1992 |
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UA library record |
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
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UA library record |
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Geuens, I.; Gijbels, R.; Jacob, W. |
Depth profiling of silver halide microcrystals |
1991 |
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UA library record |
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Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
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UA library record |
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Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
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UA library record |
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van Roy, W.; Struyf, H.; van Vaeck, L.; Gijbels, R.; Caravatti, P. |
A Fourier transform laser microprobe mass spectrometer with external ion source for organic and inorganic surface and micro-analysis |
1994 |
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UA library record |
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Steiner, R.E.; Barshick, C.M.; Bogaerts, A. |
Glow discharge optical spectroscopy and mass spectrometry |
2009 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. |
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals |
1998 |
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UA library record |
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Adams, F.; Gijbels, R.; Jambers, W.; van Grieken, R. |
Mass spectrometry, inorganic |
1998 |
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UA library record |
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de Witte, H.; Vandervorst, W.; Gijbels, R. |
Modeling of bombardment induced oxidation of silicon with and without oxygen flooding |
1998 |
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UA library record |
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Bogaerts, A.; Gijbels, R. |
Numerical modelling of analytical glow discharges |
2003 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Photographic materials |
2001 |
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UA library record |
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