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65th birthdays of W. Owen Saxton, David J. Smith and Dirk Van Dyck / PICO 2013 From multislice to big bang”. Lichte H, Dunin-Borkowski R, Tillmann K, Van Aert S, Van Tendeloo G Amsterdam (2013).
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Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, , 213 (2000)
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The classical electron gas in artificial structures”. Peeters FM, Partoens B, Kong M, , 235 (2004)
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Colloquium Spectroscopicum Internationale 34: a collection of papers presented at the Colloquium Spectroscopicum Internationale, Antwerp, Belgium, 4-9 September 2005”. Janssens K, Bogaerts A, van Grieken R Elsevier, Amsterdam (2006).
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Colloquium Spectroscopicum Internationale 34 (CSI 34), Antwerp, Belgium, 4-9 September 2005”. Bogaerts A, Janssens K, van Grieken R Elsevier, Amsterdam (2006).
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High-resolution electron microscopy for semiconducting materials science”. van Landuyt J, Vanhellemont J Elsevier, Amsterdam, page 1109 (1994).
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On the phase-like nature of the 7m structure in ni-al”. Schryvers D, Tanner LE, , 849 (1994)
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Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
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Study of oxynitrides with dual beam TOF-SIMS”. de Witte H, Conard T, Vandervorst W, Gijbels R, , 611 (2000)
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TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates”. Lenaerts J, Verlinden G, van Vaeck L, Gijbels R, Geuens I, , 115 (2000)
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XPS study of ion induced oxidation of silicon with and without oxygen flooding”. de Witte H, Conard T, Sporken R, Gouttebaron R, Magnee R, Vandervorst W, Caudano R, Gijbels R, , 73 (2000)
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Evolution of impurity clusters and mechanism of formation of photographic sensitivity”. Oleshko VP, Gijbels RH, Bilous VM, Jacob WA, Alfimov MV Antwerp, page 275 (1998).
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Pentcheva EN, Van 't dack L, Veldeman E, Hristov V, Gijbels R (1997) Hydrochemical characteristics of geothermal systems in South Bulgaria. University of Antwerp. Department of Chemistry, Antwerp
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Influence of the temperature on the morphology of silver behenate microcrystals”. Vanwelkenhuysen I, Gijbels R, Geuens I, , 326 (1998)
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Grujić, MM (2015) Manifestations of intrinsic and induced magnetic properties of graphene nanostructures. University of Antwerp, Faculty of Sciences, Department of Physics, Antwerp
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Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1”. de Vyt A, Gijbels R, van Roost C, Geuens I, , 524 (1998)
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Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques”. Oleshko VP, Gijbels RH, Jacob WA, van Daele AJ Antwerp, page 317 (1998).
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Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS)”. Verlinden G, Gijbels R, Geuens I, de Keyzer R Antwerp, page 528 (1998).
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Meledin A (2017) Nanostructure of superconducting tapes : a study by electron microscopy. Antwerp
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Ş,entosun K (2018) 2D and 3D characterization of plasmonic and porous nanoparticles using transmission electron microscopy. Antwerp
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Berthelot A (2018) Modeling of microwave plasmas for carbon dioxide conversion. University of Antwerp, Antwerp
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Lobato I (2014) Accurate modeling of high angle electron scattering. Antwerpen
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Amin-Ahmadi B (2015) Adanced TEM investigation of the elementary plsticity mechanisms in palladium thin films at the nano scale. Antwerpen
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Goris B (2014) Advanced electron tomography : 3 dimensional structural characterisation of nanomaterials down to the atomic scale. Antwerpen
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Li B (2012) Aharonov-Bohm effect in semiconductor quantum rings. Antwerpen
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Yusupov M (2014) Atomic scale simulations for a better insight in plasma medicine. Antwerpen
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Komendová, L (2013) Characteristic length scales and vortex interactions in two-component superconducting systems. Antwerpen
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d' Hondt H (2011) Characterization of anion deficient perovskites. Antwerpen
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Kirilenko D (2012) Characterization of graphene by electron diffraction. Antwerpen
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Wiktor C (2014) Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy. Antwerpen
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