| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Zhou, C.; Ji, G.; Chen, Z.; Wang, M.; Addad, A.; Schryvers, D.; Wang, H. |
Fabrication, interface characterization and modeling of oriented graphite flakes/Si/Al composites for thermal management applications |
2014 |
Materials and design |
63 |
61 |
UA library record; WoS full record; WoS citing articles |
| Frederickx, P.; De Vis, K.; Wouters, H.; Helary, D.; Schryvers, D. |
Nanoparticles in glass and glazes |
2005 |
|
|
|
UA library record |
| Schryvers, D.; Tirry, W.; Yang, Z. |
Advanced TEM investigations on Ni-Ti shape memory material: strain and concentration gradients surrounding Ni4Ti3 precipitates |
2005 |
|
|
|
UA library record; WoS full record; |
| Schryvers, D. |
Advanced TEM studies of martensite and related phase transformations |
1999 |
|
|
|
UA library record; WoS full record; |
| Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Verschoren, G.; Lievens, P.; Hou, M.; van Swygenhoven, H. |
Atomic scale characterization of supported and assembled nanoparticles |
2001 |
|
|
|
UA library record |
| Zhurkin, E.; Hou, M.; van Swygenhoven, H.; Pauwels, B.; Yandouzi, M.; Schryvers, D.; Van Tendeloo, G.; Lievens, P.; Verschoren, G.; Kuriplach, J.; van Peteghem, S.; Segers, D.; Dauwe, C. |
Atomic scale modeling of supported and assembled nanoparticles |
2001 |
|
|
|
UA library record |
| Schryvers, D.; Seo, J.W.; Richard, O.; Vermeulen, W.; Potapov, P. |
Decomposition phenomena in Ni-Mn-Ti austenite |
1999 |
|
|
|
UA library record; WoS full record; |
| Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J. |
Electron microscopy of interfaces in new materials |
1991 |
|
|
|
UA library record |
| Oleshko, V.; Schryvers, D.; Gijbels, R.; Jacob, W. |
Investigation of Ag, Ag2S and Ag(Br,I) small particles by HREM and AEM |
1998 |
|
|
|
UA library record |
| Idrissi, H.; Schryvers, D. |
Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization |
2012 |
|
|
|
UA library record |
| Schryvers, D. |
Multiply twinned phases and microstructures in Ni-Al: a transmission electron microscopy study |
1991 |
|
|
|
UA library record |
| Frederickx, P.; Verbeeck, J.; Schryvers, D.; Helary, D.; Darque-Ceretti, E. |
Nanoparticles in lustre reconstructions |
2005 |
|
|
|
UA library record; WoS full record; WoS citing articles |
| Tian, H.; Schryvers, D.; Liu, D.; Jiang, Q.; van Humbeeck, J. |
Stability of Ni in nitinol oxide surfaces |
2011 |
Acta biomaterialia |
7 |
39 |
UA library record; WoS full record; WoS citing articles |
| Schryvers, D.; Cao, S.; Tirry, W.; Idrissi, H.; Van Aert, S. |
Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials |
2013 |
Science and technology of advanced materials |
14 |
6 |
UA library record; WoS full record; WoS citing articles |
| Zelaya, E.; Schryvers, D. |
FCC surface precipitation in Cu-Zn-Al after low angle GA+ ion irradiation |
2010 |
Materials transactions |
51 |
2 |
UA library record; WoS full record; WoS citing articles |
| Fredrickx, P.; Schryvers, D.; Janssens, K. |
Nanoscale morphology of a piece of ruby red Kunckel glass |
2002 |
Physics and chemistry of glasses |
43 |
|
UA library record; WoS full record; WoS citing articles |
| Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. |
Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study |
2000 |
|
|
|
UA library record; WoS full record; |
| Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C. |
The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals |
2000 |
|
|
|
UA library record; WoS full record; |
| Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals |
1996 |
The journal of imaging science and technology |
40 |
4 |
UA library record; WoS full record; WoS citing articles |
| van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
The influence of crystal thickness on the image tone |
2003 |
Journal of imaging science |
47 |
|
UA library record; WoS full record; WoS citing articles |
| van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Bollen, D.; de Keyzer, R.; van Roost, C. |
Influence of twinning on the morphology of AgBr and AgCl microcrystals |
2001 |
The journal of imaging science and technology |
45 |
|
UA library record; WoS full record; WoS citing articles |
| Potapov, P.L.; Schryvers, D.; Strijckers, H.; van Roost, C. |
Microstructural mechanism of development in photothermographic materials |
2003 |
The journal of imaging science and technology |
47 |
|
UA library record; WoS full record; WoS citing articles |
| Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
New method to determine the parity of the number of twin planes in tabular silver halide microcrystals from top views |
1997 |
The journal of imaging science and technology |
41 |
1 |
UA library record; WoS full record; WoS citing articles |
| van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; van Roost, C.; de Keyzer, R. |
A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals |
2001 |
The journal of imaging science and technology |
45 |
|
UA library record; WoS full record; WoS citing articles |
| Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
|
|
|
UA library record |
| Schryvers, D.; Tirry, W.; Cao, S. |
Advanced TEM and SEM methods applied to 3D nano- and microstructural investigations of Ni4Ti3 precipitates in Ni-Ti (SMA) |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
|
UA library record; WoS full record; WoS citing articles |
| Cao, S.; Nishida, M.; Schryvers, D. |
FIB/SEM applied to quantitative 3D analysis of precipitates in Ni-Ti |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
|
UA library record; WoS full record |
| Delville, R.; Shi, H.; James, R.D.; Schryvers, D. |
Special microstructures and twin features in Ti50Ni50-x(Pd,Au)x at small hysteresis |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
3 |
UA library record; WoS full record; WoS citing articles |
| Delville, R.; Malard, B.; Pilch, J.; Sittner, P.; Schryvers, D. |
Transmission electron microscopy study of microstructural evolution in nanograined Ni-Ti microwires heat treated by electric pulse |
2011 |
Diffusion and defect data : solid state data : part B : solid state phenomena |
172/174 |
3 |
UA library record; WoS full record; WoS citing articles |
| Schryvers, D.; Tirry, W.; Yang, Z. |
Ni4Ti3 precipitates and their influence on the surrounding NiTi matrix |
2005 |
|
|
|
UA library record; WoS full record; |
