| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. |
S-SIMS and MetA-SIMS study of organic additives in thin polymer coatings |
2006 |
Applied surface science |
252 |
3 |
UA library record; WoS full record; WoS citing articles |
| Martin, J.M.L.; François, J.P.; Gijbels, R.; Almlöf, J. |
Structure and infrared spectroscopy of the C11 molecule |
1991 |
Chemical physics letters |
187 |
42 |
UA library record; WoS full record; WoS citing articles |
| Slanina, Z.; Martin, J.M.L.; François, J.P.; Gijbels, R. |
The structure, energetics, and harmonic vibrations of B3N |
1993 |
Chemical physics letters |
201 |
20 |
UA library record; WoS full record; WoS citing articles |
| Martin, J.M.L.; El-Yazal, J.; François, J.P.; Gijbels, R. |
Structures and thermochemistry of B3N3 and B4N4 |
1995 |
Chemical physics letters |
232 |
35 |
UA library record; WoS full record; WoS citing articles |
| de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Study of oxynitrides with dual beam TOF-SIMS |
2000 |
|
|
|
UA library record |
| Vandecasteele, C.; van Grieken, R.; Gijbels, R.; Speecke, A. |
Systematic errors in 14-MeV neutron activation analysis for oxygen : part 1 : neutron and γ-ray attenuation effects |
1973 |
Analytica chimica acta |
64 |
11 |
UA library record; WoS full record; WoS citing articles |
| Vandecasteele, C.; van Grieken, R.; Gijbels, R.; Speecke, A. |
Systematic errors in 14-MeV neutron activation analysis for oxygen : part 2 : a general standardization method for the determination of oxygen |
1973 |
Analytica chimica acta |
65 |
12 |
UA library record; WoS full record; WoS citing articles |
| Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates |
2000 |
|
|
|
UA library record |
| Vandelannoote, R.; Blommaert, W.; Sadurski, A.; Van 'T Dack, L.; Gijbels, R.; Van Grieken, R.; Bosch, B.; Leleu, M.; Rochon, J.; Sarcia, C.; Sureau, J.F.; |
Trace-elemental anomalies in surface water near a small lead-zinc mineralization at Menez-Albot (Brittany, France) |
1984 |
Journal of geochemical exploration |
20 |
4 |
UA library record; WoS full record; WoS citing articles |
| de Witte, H.; Conard, T.; Sporken, R.; Gouttebaron, R.; Magnee, R.; Vandervorst, W.; Caudano, R.; Gijbels, R. |
XPS study of ion induced oxidation of silicon with and without oxygen flooding |
2000 |
|
|
|
UA library record |
| van Cleempoel, A.; Gijbels, R.; van den Heuvel, H.; Claeys, M. |
Analysis of C60 and C70 oxides by HPLC and low- and high-energy collision-induced dissocation tandem mass spectrometry |
1997 |
Proceedings Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials, 191th Meeting of the Electrochemical Society, Montreal, Canada, 4-9 May 1997 |
4 |
1 |
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Analytical electron microscopy of silver halide photographic systems |
2000 |
Micron |
31 |
8 |
UA library record; WoS full record; WoS citing articles |
| Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. |
Application of neural networks in image analysis: the classification of geometrical shapes |
1993 |
CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology |
10 |
|
UA library record |
| Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Adams, F. |
Capabilities and limitations of Fourier transform laser microprobe mass spectrometry for molecular analysis of solids |
2002 |
Vacuum |
69 |
4 |
UA library record; WoS full record; WoS citing articles |
| Jenett, H.; Grallath, E.; Riedel, R.; Strecker, K.; Gijbels, R.; Kennis, P. |
Comparative bulk, surface and depth profile analyses on AIN and SiC-coated B4C powders |
1991 |
Fres J. Anal. Chem. |
341 |
2 |
UA library record; WoS full record; WoS citing articles |
| Pentcheva, E.; Van 't dack, L.; Veldeman, E.; Gijbels, R. |
Corrélations chimiques-géothermométriques des paramètres microchimiques des hydrothermes profonds |
1996 |
Comptes rendus de l'Académie bulgare des sciences |
49 |
|
UA library record |
| Shimizu, K.; Habazaki, H.; Bender, H.; Gijbels, R. |
The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES |
2004 |
Engineering materials |
52 |
|
UA library record |
| Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Determination of the silver sulphide cluster size distribution via computer simulations |
2000 |
|
|
|
UA library record; WoS full record; |
| Gijbels, R. |
Development of a Fourier transform laser microprobe mass spectrometer with external ion source |
1993 |
ICR/Ion trap newsletter |
30 |
|
UA library record |
| Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and photographic sensitivity |
2000 |
Zhurnal nauchnoj prikladnoj fotografii i kinematografii |
45 |
|
UA library record |
| Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I.; Callant, P. |
Exchange of fluorinated cyanine dyes between different types of silver halide microcrystals studied by imaging time-of-flight secondary ion mass spectrometry |
2001 |
Langmuir |
17 |
8 |
UA library record; WoS full record; WoS citing articles |
| Gijbels, R.; Bogaerts, A. |
Modeling of glow discharge ion sources for mass spectrometry: potentials and limitations |
1997 |
Spectroscopy |
9 |
|
UA library record |
| Bogaerts, A.; Gijbels, R. |
Modeling of glow discharge sources with flat and pin cathodes and implications for mass spectrometric analysis |
1997 |
Journal of the American Society of Mass Spectrometry |
8 |
15 |
UA library record; WoS full record; WoS citing articles |
| Bogaerts, A.; Gijbels, R. |
Modeling of glow discharges: what can we learn from it? |
1997 |
Analytical chemistry A-pages |
69 |
|
UA library record |
| Bogaerts, A.; Gijbels, R. |
Modeling of radio-frequency and direct current glow discharges in argon |
2000 |
Journal of technical physics |
41 |
|
UA library record |
| Herrebout, D.; Bogaerts, A.; Gijbels, R. |
Modelleren van plasmas gebruikt voor de afzetting van dunne lagen |
2004 |
Chemie magazine |
|
|
UA library record |
| Van 't dack, L.; Gijbels, R.; Walker, C.T. |
Modern developments and applications in microbeam analysis: proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6-10, 2007 |
2008 |
Microchimica acta |
161 |
1 |
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A. |
On estimation of the dielectric function of Ag(Br,I) nanocrystals by cryo-EELS (addendum) |
1999 |
Nanostructered materials |
11 |
|
UA library record |
| Neyts, E.; Yan, M.; Bogaerts, A.; Gijbels, R. |
PIC-MC simulation of an RF capacitively coupled Ar/H2 discharge |
2003 |
Nuclear instruments and methods in physics research: B |
202 |
8 |
UA library record; WoS full record; WoS citing articles |
| Blommaert, W.; Vandelannoote, R.; Van 't dack, L.; Gijbels, R.; van Grieken, R. |
Relative evaluation of neutron activation, X-ray fluorescence and spark source mass spectrometry for multi-element analysis of geothermal waters |
1980 |
Journal of radioanalytical chemistry |
57 |
|
UA library record |
