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“Texture-dependent twin formation in nanocrystalline thin Pd films”. Wang B, Idrissi H, Shi H, Colla MS, Michotte S, Raskin JP, Pardoen T, Schryvers D, Scripta materialia 66, 866 (2012). http://doi.org/10.1016/j.scriptamat.2012.01.038
Abstract: Nanocrystalline Pd films were produced by electron-beam evaporation and sputter deposition. The electron-beam-evaporated films reveal randomly oriented nanograins with a relatively high density of growth twins, unexpected in view of the high stacking fault energy of Pd. In contrast, sputter-deposited films show a clear 〈1 1 1〉 crystallographic textured nanostructure without twins. These results provide insightful information to guide the generation of microstructures with enhanced strength/ductility balance in high stacking fault energy nanocrystalline metallic thin films.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 3.747
Times cited: 19
DOI: 10.1016/j.scriptamat.2012.01.038
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“Dislocation and back stress dominated viscoplasticity in freestanding sub-micron Pd films”. Lemoine G, Delannay L, Idrissi H, Colla M-S, Pardoen T, Acta materialia 111, 10 (2016). http://doi.org/10.1016/j.actamat.2016.03.038
Abstract: A dislocation-based crystal plasticity model is developed in order to study the mechanical and creep/ relaxation behaviour of polycrystalline metallic thin films. The model accounts for the confinement of plasticity due to grain boundaries and for the anisotropy of individual grains, as well as for the significant viscoplastic effects associated to dislocation dominated thermally activated mechanisms. Numerical predictions are assessed based on experimental tensile test followed by relaxation on freestanding Pd films, based on an on-chip test technique. The dislocation-based mechanism assumption captures all the experimental trends, including the stress strain response, the relaxation behaviour and the dislocation density evolution, confirming the dominance of a dislocation driven deformation mechanism for the present Pd films with high defects density. The model has also been used to address some original experimental evidences involving back stresses, Bauschinger effect, backward creep and strain recovery. (C) 2016 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 5.301
Times cited: 6
DOI: 10.1016/j.actamat.2016.03.038
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“Ultrahigh strain hardening in thin palladium films with nanoscale twins”. Idrissi H, Wang B, Colla MS, Raskin JP, Schryvers D, Pardoen T, Advanced materials 23, 2119 (2011). http://doi.org/10.1002/adma.201004160
Abstract: Nanocrystalline Pd thin films containing coherent growth twin boundaries are deformed using on-chip nanomechanical testing. A large work-hardening capacity is measured. The origin of the observed behavior is unraveled using transmission electron microscopy and shows specific dislocations and twin boundaries interactions. The results indicate the potential for large strength and ductility balance enhancement in Pd films, as needed in membranes for H technologies.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 19.791
Times cited: 57
DOI: 10.1002/adma.201004160
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