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Structure and magnetotransport properties of La2/3Ca1/3MnO3 thin films prepared by pulsed laser deposition”. Lebedev OI, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier HU, Phillipp F, Materials Research Society symposium proceedings T2 –, Symposium on Advances in Laser Ablation of Materials at the 1998 MRS, Spring Meeting, April 13-16, 1998, San Francisco, Calif. , 219 (1998). http://doi.org/10.1557/PROC-526-219
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The isotope effect in hydrogen-bonded systems”. Bussmann-Holder A, Michel KH, International journal of modern physics: B: condensed matter physics, statistical physics, applied physics T2 –, 1st International Conference on New Theories, Discoveries, and, Applications of Superconductors and Related Materials (New3SC-1), FEB 19-24, 19 12, 3406 (1998). http://doi.org/10.1142/S021797929800274X
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Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials”. Schryvers D, Cao S, Tirry W, Idrissi H, Van Aert S, Science and technology of advanced materials 14, 014206 (2013). http://doi.org/10.1088/1468-6996/14/1/014206
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FCC surface precipitation in Cu-Zn-Al after low angle GA+ ion irradiation”. Zelaya E, Schryvers D, Materials transactions 51, 2177 (2010). http://doi.org/10.2320/matertrans.M2010171
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Fabrication, interface characterization and modeling of oriented graphite flakes/Si/Al composites for thermal management applications”. Zhou C, Ji G, Chen Z, Wang M, Addad A, Schryvers D, Wang H, Materials and design 63, 719 (2014). http://doi.org/10.1016/j.matdes.2014.07.009
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Theoretical study of silicene and germanene”. Houssa M, van den Broek B, Scalise E, Pourtois G, Afanas'ev VV, Stesmans A, Graphene, Ge/iii-v, And Emerging Materials For Post Cmos Applications 5 (2013). http://doi.org/10.1149/05301.0051ECST
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Stabilization of mercury-based superconductors by foreign cations”. Raveau B, Michel C, Hervieu M, Van Tendeloo G, Maignan A, Annales de chimie (1914) T2 –, 4th North-African Materials Science Symposium (JMSM 94), NOV 23-24, 1994, CASABLANCA, MOROCCO 19, 487 (1994)
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Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy”. Hens S, van Landuyt J, Bender H, Boullart W, Vanhaelemeersch S, Materials science in semiconductor processing 4, 109 (2001). http://doi.org/10.1016/S1369-8001(00)00147-5
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The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures”. Stuer C, van Landuyt J, Bender H, Rooyackers R, Badenes G, Materials science in semiconductor processing 4, 117 (2001). http://doi.org/10.1016/S1369-8001(00)00110-4
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Nanostructured materials for solid-state hydrogen storage : a review of the achievement of COST Action MP1103”. Callini E, Aguey-Zinsou KF, Ahuja R, Ares JR, Bals S, Biliškov N, Chakraborty S, Charalambopoulou G, Chaudhary AL, Cuevas F, Dam B, de Jongh P, Dornheim M, Filinchuk Y, Grbović, Novaković, J, Hirscher M, Jensen TR, Jensen PB, Novaković, N, Lai Q, Leardini F, Gattia DM, Pasquini L, Steriotis T, Turner S, Vegge T, Züttel A, Montone A, International journal of hydrogen energy T2 –, E-MRS Fall Meeting / Symposium C on Hydrogen Storage in Solids -, Materials, Systems and Aplication Trends, SEP 15-18, 2015, Warsaw, POLAND 41, 14404 (2016). http://doi.org/10.1016/j.ijhydene.2016.04.025
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Crystal structure and magnetic properties of the Cr-doped spiral antiferromagnet BiMnFe2O6”. Batuk D, de Dobbelaere C, Tsirlin AA, Abakumov AM, Hardy A, van Bael MK, Greenblatt M, Hadermann J, Materials research bulletin 48, 2993 (2013). http://doi.org/10.1016/j.materresbull.2013.04.038
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Crystal structure and properties of the new complex vanadium oxide K2SrV3O9”. Tsirlin AA, Chernaya VV, Shpanchenko RV, Antipov EV, Hadermann J, Materials research bulletin 40, 800 (2005). http://doi.org/10.1016/j.materresbull.2005.02.004
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Crystal structures of superconducting sodium intercalates of hafnium nitride chloride”. Oró-Solé, J, Frontera C, Beltrán-Porter D, Lebedev OI, Van Tendeloo G, Fuertes A, Materials research bulletin 41, 934 (2006). http://doi.org/10.1016/j.materresbull.2006.03.018
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Electron microscopy and diffraction study of the composition dependency of the 3R microtwinned martensite in Ni-Al”. Schryvers D, de Saegher B, van Landuyt J, Materials research bulletin 26, 57 (1991)
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Fluorine intercalation in the n=1 and n=2 layered manganites Sr2MnO3.5+x and Sr3Mn2O6”. Sullivan E, Gillie LJ, Hadermann J, Greaves C, Materials research bulletin 48, 1598 (2013). http://doi.org/10.1016/j.materresbull.2012.12.073
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Fluorite-like phases in the BaF2-BiF3-Bi2O3 system-synthesis, conductivity and defect clustering”. Serov TV, Dombrovski EN, Ardashnikova EI, Dolgikh VA, el Omari M, el Omari M, Abaouz A, Senegas J, Chaban NG, Abakumov AM, Van Tendeloo G, Materials research bulletin 40, 821 (2005). http://doi.org/10.1016/j.materresbull.2005.02.007
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In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates”. Ghica C, Nistor L, Bender H, Steegen A, Lauwers A, Maex K, van Landuyt J, Journal of materials research 16, 701 (2001). http://doi.org/10.1557/JMR.2001.0121
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Increasing the solubility limit for tetrahedral aluminium in ZnO:Al nanorods by variation in synthesis parameters”. Kelchtermans A, Adriaensens P, Slocombe D, Kuznetsov VL, Hadermann J, Riskin A, Elen K, Edwards PP, Hardy A, Van Bael MK, Journal of nanomaterials 2015, 1 (2015). http://doi.org/10.1155/2015/546041
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Influence of laser and isothermal treatments on microstructural properties of SnO2 films”. Rembeza ES, Richard O, van Landuyt J, Materials research bulletin 34, 1527 (1999). http://doi.org/10.1016/S0025-5408(99)00188-9
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Microstructural investigation of BaTiO3 thin films deposited on (001) MgO”. Lei CH, Van Tendeloo G, Siegert M, Schubert J, Journal of materials research 17, 1923 (2002). http://doi.org/10.1557/JMR.2002.0285
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New lead vanadium phosphate with langbeinite-type structure: Pb1.5V2(PO4)3”. Shpanchenko RV, Lapshina OA, Antipov EV, Hadermann J, Kaul EE, Geibel C, Materials research bulletin 40, 1569 (2005). http://doi.org/10.1016/j.materresbull.2005.04.037
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Preparation of nanocrystalline titania powder via aerosol pyrolysis of titanium tetrabutoxide”. Ahonen PP, Kauppinen EI, Joubert JC, Deschanvres JL, Van Tendeloo G, Journal of materials research 14, 3938 (1999). http://doi.org/10.1557/JMR.1999.0533
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Properties and thermal stability of solution processed ultrathin, high-k bismuth titanate (Bi2Ti2O7) films”. Hardy A, Van Elshocht S, De Dobbelaere C, Hadermann J, Pourtois G, De Gendt S, Afanas'ev VV, Van Bael MK, Materials research bulletin 47, 511 (2012). http://doi.org/10.1016/j.materresbull.2012.01.001
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Structural phase transition at low temperature, corresponding to charge ordering in the CMR perovskites LN0.5A0.5MNO3”. Laffez P, Van Tendeloo G, Millange F, Caignaert V, Hervieu M, Raveau B, Materials research bulletin 31, 905 (1996). http://doi.org/10.1016/S0025-5408(96)00090-6
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Structural studies of diamond thin films grown from the arc plasma”. Nistor LC, van Landuyt J, Journal of materials research 12, 2533 (1998)
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Structure and magnetic properties of a new anion-deficient perovskite Pb2Ba2BiFe4ScO13 with crystallographic shear structure”. Batuk M, Tyablikov OA, Tsirlin AA, Kazakov SM, Rozova MG, Pokholok KV, Filimonov DS, Antipov EV, Abakumov AM, Hadermann J, Materials research bulletin 48, 3459 (2013). http://doi.org/10.1016/j.materresbull.2013.05.028
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Structure of the hexagonal 16l perovskites Ba4Ca0.9Mn3.1O11.3 and Ba4Ca0.5Mn3Cu0.5O12-\delta by high-resolution electron microscopy”. Schuddinck W, Van Tendeloo G, Hervieu M, Floros N, Raveau B, Materials research bulletin 36, 2689 (2001). http://doi.org/10.1016/S0025-5408(01)00744-9
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TEM study of laser induced phase transition in iron thin films”. Teodorescu VS, Nistor LC, van Landuyt J, Dinescu M, Materials research bulletin 29, 63 (1994). http://doi.org/10.1016/0025-5408(94)90106-6
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:Ba2.1Bi0.9(O, F)6.8-\delta: a new ordered anion-excess fluorite”. Prituzhalov VA, Abakumov AM, Ardashnikova EI, Dolgikh VA, Van Tendeloo G, Materials research bulletin 42, 861 (2007). http://doi.org/10.1016/j.materresbull.2006.08.023
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Thermal stability of atomic layer deposited Zr:Al mixed oxide thin films: an in situ transmission electron microscopy study”. Nistor LC, Richard O, Zhao C, Bender H, Van Tendeloo G, Journal of materials research 20, 1741 (2005). http://doi.org/10.1557/JMR.2005.0217
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