Number of records found: 3074
 | 
Citations
 | 
   web
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, van Dyck D, Van Tendeloo G, Ultramicroscopy 109, 1236 (2009). http://doi.org/10.1016/j.ultramic.2009.05.010
toggle visibility
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy”. Martinez GT, Rosenauer A, de Backer A, Verbeeck J, Van Aert S, Ultramicroscopy 137, 12 (2014). http://doi.org/10.1016/j.ultramic.2013.11.001
toggle visibility
Quantitative electron tomography : the effect of the three-dimensional point spread function”. Heidari H, van den Broek W, Bals S, Ultramicroscopy 135, 1 (2013). http://doi.org/10.1016/j.ultramic.2013.06.005
toggle visibility
Quantitative STEM normalisation : the importance of the electron flux”. Martinez GT, Jones L, de Backer A, Béché, A, Verbeeck J, Van Aert S, Nellist PD, Ultramicroscopy 159, 46 (2015). http://doi.org/10.1016/j.ultramic.2015.07.010
toggle visibility
Real space maps of atomic transitions”. Schattschneider P, Verbeeck J, Hamon AL, Ultramicroscopy 109, 781 (2009). http://doi.org/10.1016/j.ultramic.2009.01.016
toggle visibility
Real space maps of magnetic moments on the atomic scale: theory and feasibility”. Schattschneider P, Ennen I, Stoger-Pollach M, Verbeeck J, Mauchamp V, Jaouen M, Ultramicroscopy 110, 1038 (2010). http://doi.org/10.1016/j.ultramic.2009.11.020
toggle visibility
Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
toggle visibility
The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects”. Zhang XB, Zhang XF, Amelinckx S, Van Tendeloo G, van Landuyt J, Ultramicroscopy 54, 237 (1994). http://doi.org/10.1016/0304-3991(94)90123-6
toggle visibility
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data”. Müller K, Schowalter M, Jansen J, Tsuda K, Titantah J, Lamoen D, Rosenauer A, Ultramicroscopy 109, 802 (2009). http://doi.org/10.1016/j.ultramic.2009.03.029
toggle visibility
Relation between structure, charge ordering and magnetotransport properties in Nd0.5Ca0.5Mn1-xCrxO3 manganites”. Schuddinck W, Van Tendeloo G, Barnabé, A, Hervieu M, Raveau B, Journal of magnetism and magnetic materials T2 –, Symposium G Material Physics Issues and Applications of Magnetic Oxides, at the E-MRS Spring Meeting, JUN 01-04, 1999, Strasbourg, France 211, 105 (2000). http://doi.org/10.1016/S0304-8853(99)00720-9
toggle visibility
Revealing the innermost nanostructure of sputtered NiCrOx solar absorber cermets”. Gaouyat L, He Z, Colomer J-F, Lambin P, Mirabella F, Schryvers D, Deparis O, Solar energy materials and solar cells 122, 303 (2014). http://doi.org/10.1016/j.solmat.2013.10.009
toggle visibility
Role of Nd/Ba substitution on the growth mode and on the structural properties of Nd-rich Re1(NdxBa2-x)Cu3O7-\delta (Re=Nd, Y) thin films”. Salluzzo M, Aruta C, Ausanio G, Bals S, d' Agostino A, Maglione MG, Physica: C : superconductivity 372-376, 675 (2002). http://doi.org/10.1016/S0921-4534(02)00828-6
toggle visibility
Role of the defect microstructure on the electrical transport properties in undoped and Si-doped GaN grown by LP-MOVPE”. Farvacque JL, Bougrioua Z, Moerman I, Van Tendeloo G, Lebedev O, Physica: B : condensed matter T2 –, 20th International Conference on Defects in Semiconductors (ICDS-20), JUL 26-30, 1999, BERKELEY, CA 273-4, 140 (1999). http://doi.org/10.1016/S0921-4526(99)00431-7
toggle visibility
Room temperature (2a x 2b) superstructure formed in Sr-submitted Bi2(Sr1.6Y0.4)CaCu2Oy single crystals”. Zhang XF, Van Tendeloo G, Hu DW, Brabers VAM, Physica: C : superconductivity 278, 31 (1997)
toggle visibility
Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry”. Vanhellemont J, Maes HE, Schaekers M, Armigliato A, Cerva H, Cullis A, de Sande J, Dinges H, Hallais J, Nayar V, Pickering C, Stehlé, JL, Van Landuyt J, Walker C, Werner H, Salieri P;, Applied surface science T2 –, SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63, 45 (1993). http://doi.org/10.1016/0169-4332(93)90062-G
toggle visibility
Selective imaging of sublattices in complex structures”. Amelinckx S, Milat O, Van Tendeloo G, Ultramicroscopy 51, 90 (1993). http://doi.org/10.1016/0304-3991(93)90138-N
toggle visibility
Selective imaging of the “substructures&rdquo, in incommensurately modulated intergrowth crystal structures”. Milat O, Van Tendeloo G, Amelinckx S, Ultramicroscopy 41, 65 (1992). http://doi.org/10.1016/0304-3991(92)90095-2
toggle visibility
Semisolid structure for M2 high speed steel prepared by cooling slope”. Amin-Ahmadi B, Aashuri H, Journal of materials processing technology 210, 1632 (2010). http://doi.org/10.1016/j.jmatprotec.2010.05.011
toggle visibility
Shape selective growth of single crystalline MnOOH multipods and 1D nanowires by a reductive hydrothermal method”. Mi Y, Zhang X, Yang Z, Li Y, Zhou S, Zhang H, Zhu W, He D, Wang J, Van Tendeloo G, Materials letters 61, 1781 (2007). http://doi.org/10.1016/j.matlet.2006.07.130
toggle visibility
A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60”. Zhang XF, Zhang XB, Bernaerts D, Van Tendeloo G, Amelinckx S, van Landuyt J, Werner H, Ultramicroscopy 55, 25 (1994). http://doi.org/10.1016/0304-3991(94)90077-9
toggle visibility
Stability of Ge12C48 and Ge20C40 heterofullerenes : a first principles molecular dynamics study”. Massobrio C, Djimbi DM, Matsubara M, Scipioni R, Boero M, Chemical physics letters 556, 163 (2013). http://doi.org/10.1016/j.cplett.2012.11.033
toggle visibility
Stability of vortex-antivortex molecules in mesoscopic superconducting triangles”. Misko VR, Fomin VM, Devreese JT, Moshchalkov VV, Physica C-Superconductivity And Its Applications 404, 251 (2004). http://doi.org/10.1016/j.physc.2003.11.043
toggle visibility
Statistical consequences of applying a PCA noise filter on EELS spectrum images”. Lichtert S, Verbeeck J, Ultramicroscopy 125, 35 (2013). http://doi.org/10.1016/j.ultramic.2012.10.001
toggle visibility
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography”. Béché, A, Rouviere JL, Barnes JP, Cooper D, Ultramicroscopy 131, 10 (2013). http://doi.org/10.1016/j.ultramic.2013.03.014
toggle visibility
Structural and optical properties of CdSe quantum dots induced by amorphous Se”. Aichele T, Robin I-C, Bougerol C, André, R, Tatarenko S, Van Tendeloo G, Journal of crystal growth 301, 281 (2007). http://doi.org/10.1016/j.jcrysgro.2006.11.077
toggle visibility
Structural and physical properties of the new superconductor Hg0.5Pb0.5Sr4-xBaxCu2(CO3)O7-\delta”. Huvé, M, Van Tendeloo G, Hervieu M, Maignan A, Raveau B, Physica: C : superconductivity 231, 15 (1994). http://doi.org/10.1016/0921-4534(94)90138-4
toggle visibility
Structural aspect of YBa2Cu3O7-x films on Sis with complex barrier layers”. Vasiliev AL, Van Tendeloo G, Amelinckx S, Boikov Y, Olsson E, Ivanov Z, Physica: C : superconductivity 244, 373 (1995). http://doi.org/10.1016/0921-4534(95)00080-1
toggle visibility
Structural characterisation of erbium silicide thin films of an Si(111) substrate”. Frangis N, Van Tendeloo G, van Landuyt J, Muret P, Nguyen TTA, Journal of alloys and compounds 234, 244 (1996). http://doi.org/10.1016/0925-8388(95)02131-0
toggle visibility
Structural characterization of Er-doped Li2O-Al2O3-SiO2 glass ceramics”. Krsmanovic R, Bals S, Bertoni G, Van Tendeloo G, Optical materials 30, 1183 (2008). http://doi.org/10.1016/j.optmat.2007.05.045
toggle visibility
Structural effects of element substitution on superconducting properties in 1-2-3 YBCO: an electron microscopy study”. Van Tendeloo G, Krekels T, Milat O, Amelinckx S, Journal of alloys and compounds 195, 307 (1993). http://doi.org/10.1016/0925-8388(93)90746-A
toggle visibility