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“Analytical electron microscopy of silver halide photographic systems”. Oleshko VP, Gijbels RH, Jacob WA, Micron 31, 55 (2000). http://doi.org/10.1016/S0968-4328(99)00055-4
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 1.98
Times cited: 8
DOI: 10.1016/S0968-4328(99)00055-4
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“Atomic structure of alloys close to phase transitions”. Van Tendeloo G, Schryvers D, Nucleation and growth processes in materials 580, 283 (2000)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
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“Determination of the silver sulphide cluster size distribution via computer simulations”. Charlier E, Gijbels R, Van Doorselaer M, De Keyzer R page 85 (2000).
Abstract: Addition of a labile sulphur donor to light sensitive silver halide microcrystals results in the formation of a distribution of silver sulphide clusters on the crystal surface. These silver sulphide clusters enhance the efficiency of image formation during the photographic process. Their activity towards the capturing of light photons, however, is very critical to their size (aggregation number) and concentration. By incorporating gold ions into silver sulphide clusters it was possible to monitor the size distribution by measuring the amount of gold reacted. From these experiments, no evidence was found for aggregation of the reacted sulphur entities on the surface. The uptake of gold ions at different sulphur concentrations could well be fitted with a simulated size distribution when a catalyzed deposition of sulphur was assumed, with a reactivity of the surface equal to 1.0 % for the microcrystals studied. From a simulation of the silver sulphide cluster size distribution a correlation could also be found between increasing aggregation numbers and the absorption at increasing wavelengths in diffuse reflectance spectroscopy.
Keywords: H1 Book chapter; Engineering sciences. Technology; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
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“Evolution of impurity clusters and photographic sensitivity”. Oleshko VP, Gijbels RH, Bilous VM, Jacob WA, Alfimov MV, Zhurnal nauchnoj prikladnoj fotografii i kinematografii 45, 1 (2000)
Keywords: A3 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
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“In situ HREM irradiation study of point-defect clustering in MBE-grown strained Si1-xGex/(001)Si structures”. Fedina L, Lebedev OI, Van Tendeloo G, van Landuyt J, Mironov OA, Parker EHC, Physical review : B : condensed matter and materials physics 61, 10336 (2000). http://doi.org/10.1103/PhysRevB.61.10336
Abstract: We present a detailed analysis of the point-defect clustering in strained Si/Si(1-x)Ge(x)/(001)Si structures, including the interaction of the point defects with the strained interfaces and the sample surface during 400 kV electron irradiation at room temperature. Point-defect cluster formation is very sensitive to the type and magnitude of the strain in the Si and Si(1-x)Ge(x) layers. A small compressive strain (-0.3%) in the SiGe alloy causes an aggregation of vacancies in the form of metastable [110]-oriented chains. They are located on {113} planes and further recombine with interstitials. Tensile strain in the Si layer causes an aggregation of interstitial atoms in the forms of additional [110] rows which are inserted on {113} planes with [001]-split configurations. The chainlike configurations are characterized by a large outward lattice relaxation for interstitial rows (0.13 +/-0.01 nm) and a very small inward relaxation for vacancy chains (0.02+/-0.01 nm). A compressive strain higher than -0.5% strongly decreases point-defect generation inside the strained SiGe alloy due to the large positive value of the formation volume of a Frenkel pair. This leads to the suppression of point-defect clustering in a strained SiGe alloy so that SiGe relaxes via a diffusion of vacancies from the Si layer, giving rise to an intermixing at the Si/SiGe interface. In material with a 0.9% misfit a strongly increased flow of vacancies from the Si layer to the SiGe layer and an increased biaxial strain in SiGe bath promote the preferential aggregation of vacancies in the (001) plane, which relaxes to form intrinsic 60 degrees dislocation loops.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 27
DOI: 10.1103/PhysRevB.61.10336
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“Modeling of radio-frequency and direct current glow discharges in argon”. Bogaerts A, Gijbels R, Journal of technical physics 41, 183 (2000)
Keywords: A3 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
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“Non-quantized penetration of magnetic field in the vortex state of superconductors”. Geim AK, Dubonos SV, Grigorieva IV, Novoselov KS, Peeters FM, Schweigert VA, Nature 407, 55 (2000). http://doi.org/10.1038/35024025
Keywords: A1 Journal article; Condensed Matter Theory (CMT)
Impact Factor: 40.137
Times cited: 155
DOI: 10.1038/35024025
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“Synthesis and crystal structure of a new complex oxyfluoride La0.813Sr0.187Cu(o,F)3-\delta”. Abakumov AM, Hadermann J, Rozova MG, Pavljuk BP, Antipov EV, Lebedev OI, Van Tendeloo G, Journal of solid state cemistry 149, 189 (2000). http://doi.org/10.1006/jssc.1999.8521
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.299
Times cited: 8
DOI: 10.1006/jssc.1999.8521
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“TEM of phase transitions in tridymite and cristobalite based materials”. Van Tendeloo G, Microscoy and microanalysis 6 (2000)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
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“Analysis of the composition of glass objects from Qumran, Israel and the comparison with other Roman glass from western Europe”. Aerts A, Janssens K, Velde B, Adams F, Wouters H page 113 (2000).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Applications in art and archaeology”. Janssens K, Adams F page 290 (2000).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Comparison with other microanalytical techniques”. Janssens K page 211 (2000).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Composition of facon-de-venise and Venetian glass from Antwerp and the Southern Netherlands”. de Raedt I, Janssens K, Veeckman J, Adams F page 346 (2000).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Evaluation and calibration of micro-XRF data”. Janssens K, Vincze L, Vekemans B page 155 (2000).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Future of m-XRF”. Adams F, Janssens K page 370 (2000).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Glass trade in Antwerp during the 15th through 17th century”. de Raedt I, Janssens K, Veeckman J, Adriaens A, Adams F page 38 (2000).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“High-resolution X-ray fluorescence microtomography of homogeneous samples”. Simionovici AS, Chukalina M, Schroer C, Drakopoulos M, Snigirev A, Snigireva I, Lengeler B, Janssens K, Adams F, IEEE transactions on nuclear science 47, 2736 (2000). http://doi.org/10.1109/23.901180
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.171
DOI: 10.1109/23.901180
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“Interpretation and use of inter-element correlation graphs obtained by scanning X-ray fluorescence micro-beam spectrometry from individual particles: part 1: theory”. Somogyi A, Janssens K, Vincze L, Vekemans B, Rindby A, Adams F, Spectrochimica acta: part B : atomic spectroscopy 55, 75 (2000). http://doi.org/10.1016/S0584-8547(99)00172-X
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 3.241
DOI: 10.1016/S0584-8547(99)00172-X
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“Interpretation and use of inter-element correlation graphs obtained by scanning X-ray fluorescence micro-beam spectrometry from individual particles: part 2: application”. Somogyi A, Janssens K, Vincze L, Vekemans B, Rindby A, Adams F, Spectrochimica acta: part B : atomic spectroscopy 55, 1039 (2000). http://doi.org/10.1016/S0584-8547(00)00220-2
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 3.241
DOI: 10.1016/S0584-8547(00)00220-2
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Janssens KHA, Adams FCV, Rindby A (2000) Microscopic X-ray fluorescence analysis. 419 p
Keywords: MA1 Book as author; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Multianalytical study of patina formed on archaeological metal objects from Bliesbruck-Reinheim”. Wadsak M, Constantinides I, Vittiglio G, Adriaens A, Janssens K, Schreiner M, Adams FC, Brunella P, Wuttmann M, Microchimica acta 133, 159 (2000). http://doi.org/10.1007/S006040070086
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 4.58
DOI: 10.1007/S006040070086
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“Overview”. Janssens K, Adams F page 1 (2000).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“The preparation and preliminary characterisation of eight geological MPI-DING reference glasses for in-site microanalysis”. Jochum KP, Dingwell DB, Rocholl A, Janssens K, Vincze L, et al, Geostandards newsletter 24, 87 (2000). http://doi.org/10.1111/J.1751-908X.2000.TB00590.X
Abstract: Eight silicate glasses were prepared by directly fusing and stirring 50-100 g each of basalt, andesite, komatiite, peridotite, rhyolite, and quartz-diorite. These are referred to as MPI-DING glasses and were made for the purpose of providing reference materials for geochemical, in-situ microanalytical work. Results from various analytical techniques indicate that individual glass fragments are well homogenised with respect to major and trace elements at the mu m to mm scale. Heterogeneities due to quench crystallisation of olivine have been observed in small and limited areas of the two komatiitic glasses. In order to obtain concentration values for as many elements as possible, the glasses were analysed by a variety of bulk and microanalytical methods in a number of laboratories. From the analytical data, preliminary reference values for more than sixty elements were calculated. The analytical uncertainties of most elements are estimated to be between 1% and 10%.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1111/J.1751-908X.2000.TB00590.X
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“Quantitative analysis of 16-17th century archaeological glass vessels using PLS regression of EPXMA and μ-XRF data”. Lemberge P, Deraedt I, Janssens K, van Espen P, Journal of chemometrics 14, 751 (2000). http://doi.org/10.1002/1099-128X(200009/12)14:5/6<751::AID-CEM622>3.0.CO;2-D
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)
Impact Factor: 1.884
DOI: 10.1002/1099-128X(200009/12)14:5/6<751::AID-CEM622>3.0.CO;2-D
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“Synchrotron light through ancient glass”. de Raedt I, Vekemans B, Janssens K, Adams F, Europhysics news 31, 15 (2000)
Keywords: A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Use of microscopic XRF for non-destructive analysis in art an archaeometry”. Janssens K, Vittiglio G, Deraedt I, Aerts A, Vekemans B, Vincze L, Wei F, de Ryck I, Schalm O, Adams F, Rindby A, Knöchel A, Simionovici AS, Snigirev A, X-ray spectrometry 29, 73 (2000). http://doi.org/10.1002/(SICI)1097-4539(200001/02)29:1<73::AID-XRS416>3.3.CO;2-D
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
DOI: 10.1002/(SICI)1097-4539(200001/02)29:1<73::AID-XRS416>3.3.CO;2-D
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“The use of synchrotron micro-XRF for characterisation of the micro-heterogeneity of low-Z reference materials”. Kempenaers L, Vincze L, Janssens K, Spectrochimica acta: part B : atomic spectroscopy 55, 651 (2000). http://doi.org/10.1016/S0584-8547(00)00207-X
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 3.241
DOI: 10.1016/S0584-8547(00)00207-X
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“Analysis of heterogeneous CaCO3-CaSO4 single particles using ultra-thin window EPMA”. Ro C-U, Oh K-Y, Van Grieken RE, (2000)
Keywords: P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Application of energy dispersive X-ray spectrometry for quantitative evaluation of sorption phenomena at solid-liquid interfaces”. Szalóki I, Varga K, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 55, 1031 (2000). http://doi.org/10.1016/S0584-8547(00)00175-0
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0584-8547(00)00175-0
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“Assessing the molecular weight of a conducting polymer by grazing emission XRF”. Blockhuys F, Claes M, Van Grieken R, Geise HJ, Analytical chemistry 72, 3366 (2000). http://doi.org/10.1021/AC990877K
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1021/AC990877K
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