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“Micro-heterogeneity study of trace elements in USGS, MPI-DING and glass reference materials by means of synchrotron micro-XRF”. Kempenaers L, Janssens K, Jochum KP, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Adams F, Journal of analytical atomic spectrometry 18, 350 (2003). http://doi.org/10.1039/B212196D
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