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Author | Marguí, E.; Fontàs, C.; van Meel, K.; Van Grieken, R.; Queralt, I.; Hidalgo, M. | ||||
Title | High-energy polarized-beam energy-dispersive X-ray fluorescence analysis combined with activated thin layers for cadmium determination at trace levels in complex environmental liquid samples | Type | A1 Journal article | ||
Year | 2008 | Publication | Analytical chemistry | Abbreviated Journal | |
Volume | 80 | Issue | 7 | Pages | 2357-2364 |
Keywords | A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | 000254593500015 | Publication Date | 2008-03-08 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0003-2700; 5206-882x | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | Times cited | Open Access | |||
Notes | Approved | no | |||
Call Number | UA @ admin @ c:irua:68425 | Serial | 8032 | ||
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