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Author |
Muto, S.; Merk, N.; Schryvers, D.; Tanner, L.E. |
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Title |
Displacive and diffusive components in the formation of the Ni2Al structure studied by HREM, SAED and micro-ED |
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A3 Journal article |
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Year |
1992 |
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Monterey Institute for Advances Studies |
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Pages |
101-106 |
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Keywords |
A3 Journal article; Electron microscopy for materials research (EMAT) |
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Wos |
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0000-00-00 |
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Call Number |
UA @ lucian @ c:irua:48355 |
Serial |
739 |
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Author |
Muto, S.; Merk, N.; Schryvers, D.; Tanner, L.E. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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Title |
Displacive-replacive phase transformation in a Ni62.5Al37.5 phase studies by HREM and microdiffraction |
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A1 Journal article |
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Year |
1993 |
Publication |
Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties |
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Volume |
67 |
Issue |
5 |
Pages |
673-689 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
The structure of the metastable Ni2Al phase, which has long been a matter of controversy, has been carefully re-examined by means of high-resolution transmission electron microscopy (HREM) and electron microdiffraction. First, it is concluded that theas-quenched NixAl100-x(60 less-than-or-equal-to x less-than-or-equal-to 65) material already exhibits a partial omega-type collapse in a one-dimensional fashion which and is consistent with the anomalous dip in the phonon dispersion curve. Ni2Al precipitates are formed on annealing by thermal decomposition of the high-temperature NixAl100-xB2 phase and still retain the small omega-type shuffle. The amount of displacement in the well developed Ni2Al phase was estimated to be between 20 and 50% of the ideal omega collapse; this was determined by means of a combined technique of HREM and microdiffraction together with dynamical calculations of HREM images and diffraction intensities. |
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London |
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A1993LF72000005 |
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2007-07-08 |
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1364-2812;1463-6417; |
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UA library record; WoS full record; WoS citing articles |
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Times cited |
16 |
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Notes ![sorted by Notes field, descending order (down)](img/sort_desc.gif) |
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Call Number |
UA @ lucian @ c:irua:6776 |
Serial |
740 |
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