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Cation ordering in Tl- and Hg-based superconducting materials”. Van Tendeloo G, De Meulenaere P, Hervieu M, Letouze F, Martin C, (1996)
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Cation ordering in [(Tl, M)O] layers of “1202”-based cuprates : similarity to ordering in fcc-based alloys”. Van Tendeloo G, De Meulenaere P, Letouzé, F, Martin C, Hervieu M, Raveau B, Journal of solid state chemistry 132, 113 (1997). http://doi.org/10.1006/jssc.1997.7418
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Cation ordering within the perovskite block of a six-layer Ruddlesden-Popper oxide from layer-by-layer growth artificial interfaces in complex unit cells”. Yan L, Niu HJ, Duong GV, Suchomel MR, Bacsa J, Chalker PR, Hadermann J, Van Tendeloo G, Rosseinsky MJ, Chemical science 2, 261 (2011). http://doi.org/10.1039/c0sc00482k
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CdSe quantum dot formation: alternative paths to relaxation of a strained CdSe layer and influence of the capping conditions”. Robin I-C, Aichele T, Bougerol C, André, R, Tatarenko S, Bellet-Amalric E, van Daele B, Van Tendeloo G, Nanotechnology 18, 265701 (2007). http://doi.org/10.1088/0957-4484/18/26/265701
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CdSe quantum dot formation induced by amorphous Se”. Aichele T, Robin I-C, Bougerol C, André, R, Tatarenko S, Van Tendeloo G, Surface science : a journal devoted to the physics and chemistry of interfaces T2 –, International Conference on NANO-Structures Self Assembling, JUL 02-06, 2006, Aix en Provence, FRANCE 601, 2664 (2007). http://doi.org/10.1016/j.susc.2006.12.001
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Characterisation of multilayer ramp-type REBa2Cu3O7-\delta structures by scanning probe microscopy and high-resolution electron microscopy”. Blank DHA, Rijnders AJHM, Verhoeven MAJ, Bergs RMH, Rogalla H, Verbist K, Lebedev O, Van Tendeloo G, Journal of alloys and compounds T2 –, Symposium on High Temperature Superconductor Thin Films, Growth, Mechanisms, Interfaces, Multilayers, at the 1996 Spring Meeting of the European-Materials-Society, June 04-07, 1996, Strasbourg, France 251, 206 (1997). http://doi.org/10.1016/S0925-8388(96)02799-5
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Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation”. Stuer C, Steegen A, van Landuyt J, Bender H, Maex K, Institute of physics conference series , 481 (2001)
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Characteristic mosaic texture related to orderingin AuCu-9at.%Ag pseudobinary alloy”. Yasuda K, Hisatsune K, Udoh K, Tanaka Y, Van Tendeloo G, van Landuyt J, Dentistry in Japan 29, 91 (1992)
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d' Hondt H (2011) Characterization of anion deficient perovskites. Antwerpen
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Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging”. Goessens C, Schryvers D, van Landuyt J, Amelinckx S, Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, (1991)
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Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry”. Goessens C, Schryvers D, van Landuyt J, Amelinckx S, Verbeeck A, de Keyzer R, Journal of crystal growth 110, 930 (1991)
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Kirilenko D (2012) Characterization of graphene by electron diffraction. Antwerpen
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Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas”. Volkov VV, van Landuyt J, Marushkin KM, Gijbels R, Férauge C, Vasilyev MG, Shelyakin AA, Sokolovsky AA, Journal of crystal growth 173, 285 (1997)
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Wiktor C (2014) Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy. Antwerpen
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Characterization of MO derived nanostructured titania powders”. Ahonen PP, Kauppinen EI, Tapper U, Nenonen P, Joubert JC, Deschanvres JL, Van Tendeloo G, Electron microscopy: vol. 2 , 373 (1998)
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Characterization of nano-crystalline diamond films grown under continuous DC bias during plasma enhanced chemical vapor deposition”. Mortet V, Zhang L, Echert M, Soltani A, d' Haen J, Douheret O, Moreau M, Osswald S, Neyts E, Troadec D, Wagner P, Bogaerts A, Van Tendeloo G, Haenen K, Materials Research Society symposium proceedings (2009). http://doi.org/10.1557/PROC-1203-J05-03
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Characterization of NbC and (Nb, Ti)N nanoprecipitates in TRIP assisted multiphase steels”. Tirumalasetty GK, van Huis MA, Fang CM, Xu Q, Tichelaar FD, Hanlon DN, Sietsma J, Zandbergen HW, Acta materialia 59, 7406 (2011). http://doi.org/10.1016/j.actamat.2011.08.012
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Characterization of nickel silicides using EELS-based methods”. Verleysen E, Bender H, Richard O, Schryvers D, Vandervorst W, Journal of microscopy 240, 75 (2010). http://doi.org/10.1111/j.1365-2818.2010.03391.x
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Characterization of single-wall carbon nanotubes produced by CCVD method”. Colomer J-F, Benoit J-M, Stephan C, Lefrant S, Van Tendeloo G, Nagy JB, Chemical physics letters 345, 11 (2001). http://doi.org/10.1016/S0009-2614(01)00841-7
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Leroux F (2012) Characterization of soft-hard matter composite materials by advanced transmission electron microscopy. Universiteit Antwerpen, EMAT, Antwerpen
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Charcaterization by high-resolution transmission electron microscopy”. van Landuyt J, Van Tendeloo G Stt, Den Haag, page 187 (1998).
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Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties”. Hervieu M, Martin C, Van Tendeloo G, Mercey B, Maignan A, Jirak Z, Raveau B s.l., page 179 (2000).
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Charge ordering-disordering in Th-doped CaMnO3”. Hervieu M, Martin C, Maignan A, Van Tendeloo G, Raveau B, European physical journal : B : condensed matter and complex systems 10, 397 (1999). http://doi.org/10.1007/s100510050869
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Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy”. Hens S, van Landuyt J, Bender H, Boullart W, Vanhaelemeersch S, Materials science in semiconductor processing 4, 109 (2001). http://doi.org/10.1016/S1369-8001(00)00147-5
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Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy”. De Gryse O, Clauws P, Vanhellemont J, Lebedev O, van Landuyt J, Simoen E, Claeys C, , 183 (2002)
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Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM”. de Gryse O, Clauws P, Lebedev O, van Landuyt J, Vanhellemont J, Claeys C, Simoen E, Physica: B : condensed matter T2 –, 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308, 294 (2001). http://doi.org/10.1016/S0921-4526(01)00801-8
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Chemical solution deposition: a path towards low cost coated conductors”. Obradors X, Puig T, Pomar A, Sandiumenge F, Piñol S, Mestres N, Castaño O, Coll M, Cavallaro A, Palau A, Gázquez J, González JC, Gutiérrez J, Romá, N, Ricart S, Moretó, JM, Rossell MD, Van Tendeloo G, Superconductor science and technology 17, 1055 (2004). http://doi.org/10.1088/0953-2048/17/8/020
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Chemical, structural and electrical characterizations in the BIZNVOX family”. Vernochet C, Vannier R-N, Huvé, M, Pirovano C, Nowogrocki G, Mairesse G, Van Tendeloo G, Journal of materials chemistry 10, 2811 (2000). http://doi.org/10.1039/b006157n
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Chemistry and structure of anion-deficient perovskites with translational interfaces”. Abakumov AM, Hadermann J, Van Tendeloo G, Antipov EV, Journal of the American Ceramic Society 91, 1807 (2008). http://doi.org/10.1111/j.1551-2916.2008.02351.x
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Chemistry of trimethyl aluminum: a spontaneous route to thermally stable 3D crystalline macroporous alumina foams with a hierarchy of pore sizes”. Li Y, Yang X-Y, Tian G, Vantomme A, Yu J, Van Tendeloo G, Su B-L, Chemistry of materials 22, 3251 (2010). http://doi.org/10.1021/cm100491r
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