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Author |
Osán, J.; Ro, C.-U.; Szalóki, I.; Worobiec, A.; de Hoog, J.; Joos, P.; Van Grieken, R. |
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Title |
Methodology for light element analysis of individual aerosol particles using thin-window EPMA |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
Journal of aerosol science |
Abbreviated Journal |
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Volume |
31 |
Issue |
S1 |
Pages |
765-766 |
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Keywords |
A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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ISSN |
0021-8502; 1879-1964 |
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UA library record |
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no |
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Call Number |
UA @ admin @ c:irua:31645 |
Serial |
8221 |
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Permanent link to this record |
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Author |
de Hoog, J.; Osán, J.; Worobiec, A.; Ro, C.-U.; Szalóki, I.; Joos, P.; Van Grieken, R. |
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Title |
Optimisation of light element analysis of individual particles using UTW-EPMA |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
Journal of aerosol science |
Abbreviated Journal |
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Volume |
31 |
Issue |
S1 |
Pages |
388-389 |
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Keywords |
A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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ISSN |
0021-8502; 1879-1964 |
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UA library record |
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no |
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Call Number |
UA @ admin @ c:irua:31642 |
Serial |
8336 |
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Author |
Kuczumow, A.; Claes, M.; Schmeling, M.; Van Grieken, R.; de Gendt, S. |
![find record details (via OpenURL) openurl](img/xref.gif)
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Title |
Quantification problems in light element determination by grazing emission X-ray fluorescence |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
Journal of analytical atomic spectrometry |
Abbreviated Journal |
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Volume |
15 |
Issue |
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Pages |
415-421 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000086323700017 |
Publication Date |
2002-07-26 |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0267-9477 |
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UA library record; WoS full record; WoS citing articles |
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Call Number |
UA @ admin @ c:irua:27592 |
Serial |
8437 |
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Author |
Szalóki, I.; Braun, M.; Van Grieken, R. |
![find record details (via OpenURL) openurl](img/xref.gif)
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Title |
Quantitative characterisation of the leaching of lead and other elements from glazed surfaces of historical ceramics |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
Journal of analytical atomic spectrometry |
Abbreviated Journal |
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Volume |
15 |
Issue |
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Pages |
843-850 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000088267700006 |
Publication Date |
2002-07-26 |
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Series Volume |
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Edition |
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ISSN |
0267-9477 |
ISBN |
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UA library record; WoS full record; WoS citing articles |
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no |
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Call Number |
UA @ admin @ c:irua:28426 |
Serial |
8440 |
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Permanent link to this record |
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Author |
Szalóki, I.; Osán, J.; Ro, C.-U.; Van Grieken, R. |
![find record details (via OpenURL) openurl](img/xref.gif)
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Title |
Quantitative characterization of individual aerosol particles by thin-window electron probe microanalysis combined with iterative simulation |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
Spectrochimica acta: part B : atomic spectroscopy |
Abbreviated Journal |
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Volume |
55 |
Issue |
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Pages |
1017-1030 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000088353100031 |
Publication Date |
2002-07-25 |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0584-8547; 1873-3565 |
ISBN |
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UA library record; WoS full record; WoS citing articles |
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Notes ![sorted by Notes field, ascending order (up)](img/sort_asc.gif) |
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Call Number |
UA @ admin @ c:irua:31672 |
Serial |
8441 |
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Author |
Injuk, J.; Van Grieken, R. |
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Title |
Sample preparation for X-ray fluorescence analysis |
Type |
H3 Book chapter |
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Year |
2000 |
Publication |
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Abbreviated Journal |
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Volume |
15 |
Issue |
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Pages |
13338-13347
T2 - Encyclopedia of analytical chemis |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Call Number |
UA @ admin @ c:irua:31656 |
Serial |
8495 |
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Author |
de Bock, L.A.; Joos, P.E.; Noone, K.J.; Pockalny, R.A.; Van Grieken, R.E. |
![find record details (via OpenURL) openurl](img/xref.gif)
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Title |
Single particle analysis of aerosols, observed in the marine boundary layer during the Monterey Area Ship Tracks Experiment (MAST), with respect to cloud droplet formation |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
Journal of atmospheric chemistry |
Abbreviated Journal |
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Volume |
37 |
Issue |
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Pages |
299-329 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Wos |
000089349400005 |
Publication Date |
2002-12-22 |
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Series Issue |
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Edition |
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ISSN |
0167-7764 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Notes ![sorted by Notes field, ascending order (up)](img/sort_asc.gif) |
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Call Number |
UA @ admin @ c:irua:31674 |
Serial |
8531 |
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Author |
Jambers, W.; Dekov, V.; Van Grieken, R. |
![find record details (via OpenURL) openurl](img/xref.gif)
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Title |
Single particle and inorganic characterization of rainwater collected above the North Sea |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
The science of the total environment |
Abbreviated Journal |
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Volume |
256 |
Issue |
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Pages |
133-150 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Wos |
000088065200006 |
Publication Date |
2002-07-25 |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0048-9697; 1879-1026 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Notes ![sorted by Notes field, ascending order (up)](img/sort_asc.gif) |
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Call Number |
UA @ admin @ c:irua:31673 |
Serial |
8535 |
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Author |
Smekens, A.; Berghmans, P.; Van Grieken, R. |
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Title |
The size distribution and surface area of soot emitted by different sources |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
Journal of aerosol science |
Abbreviated Journal |
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Volume |
31 |
Issue |
S1 |
Pages |
706-707 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Edition |
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ISSN |
0021-8502; 1879-1964 |
ISBN |
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Additional Links |
UA library record |
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Open Access |
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Notes ![sorted by Notes field, ascending order (up)](img/sort_asc.gif) |
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Call Number |
UA @ admin @ c:irua:31643 |
Serial |
8545 |
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Author |
van Dyck, K.; Robberecht, H.; van Cauwenbergh, R.; Deelstra, H.; Arnaud, J.; Willemyns, L.; Benijts, F.; Centeno, J.A.; Taylor, H.; Soares, M.E.; Bastos, M.L.; Ferreira, M.A.; d'Haese, P.C.; Lamberts, L.V.; Hoenig, M.; Knapp, G.; Lugowski, S.J.; Moens, L.; Riondato, J.; Van Grieken, R.; Claes, M.; Verheyen, R.; Clement, L.; Uytterhoeven, M. |
![find record details (via OpenURL) openurl](img/xref.gif)
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Title |
Spectrometric determination of silicon in food and biological samples: an interlaboratory trial |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
Journal of analytical atomic spectrometry |
Abbreviated Journal |
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Volume |
15 |
Issue |
6 |
Pages |
735-741 |
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Keywords |
A1 Journal article; Behavioural Ecology & Ecophysiology; Pathophysiology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
Accuracy and precision of silicon determination in biological matrices (serum, urine, water, beer and spinach) by spectrometric techniques (when necessary after acid destruction) were assessed by means of a collaborative interlaboratory trial. The trial was set up in accordance with ISO 5725-2 (1994). The relative overall repeatability standard deviation was acceptable. It varied between 4% for spinach powder (mean content: 176 mg kg(-1)) and 11% for serum (mean content: 5.33 mg L-1). On the other hand, the relative overall between-laboratory standard deviation was found to vary from a satisfactorily 15% for spinach after destruction (mean content: 3.32 mg L-1) to an unacceptable 107% for spinach powder (mean content: 176 mg kg(-1)). The overall conclusion of the trial was that silicon determination in biological matrices can properly be performed by spectrometric techniques. However, when sample pretreatment (i.e., acid destruction) is needed prior to silicon determination problems still remain. |
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000087419300025 |
Publication Date |
2002-07-26 |
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Abbreviated Series Title |
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Series Volume |
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Edition |
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ISSN |
0267-9477 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Notes ![sorted by Notes field, ascending order (up)](img/sort_asc.gif) |
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Call Number |
UA @ admin @ c:irua:27841 |
Serial |
8574 |
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Permanent link to this record |
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Author |
Van Grieken, R.; Injuk, J.; de Bock, L.; van Malderen, H. |
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Title |
Study of individual particle types and heavy metal deposition for North Sea aerosols using micro and trace analysis techniques |
Type |
H3 Book chapter |
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Year |
2000 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
105-110
T2 - Exchange and transport of air polluta |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Notes ![sorted by Notes field, ascending order (up)](img/sort_asc.gif) |
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no |
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Call Number |
UA @ admin @ c:irua:31676 |
Serial |
8599 |
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Permanent link to this record |
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Author |
Worobiec, A.; de Hoog, J.; Osán, J.; Szalóki, I.; Joos, P.; Van Grieken, R. |
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Title |
Unconventional microanalysis for low-Z, volatile and organic aerosol compounds |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
Journal of aerosol science |
Abbreviated Journal |
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Volume |
31 |
Issue |
S1 |
Pages |
384-385 |
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Keywords |
A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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ISSN |
0021-8502; 1879-1964 |
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UA library record |
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Notes ![sorted by Notes field, ascending order (up)](img/sort_asc.gif) |
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no |
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Call Number |
UA @ admin @ c:irua:31639 |
Serial |
8704 |
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Permanent link to this record |
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Author |
Szalóki, I.; Török, S.B.; Ro, C.-U.; Injuk, J.; Van Grieken, R.E. |
![find record details (via OpenURL) openurl](img/xref.gif)
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Title |
X-ray spectrometry |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
Analytical chemistry |
Abbreviated Journal |
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Volume |
72 |
Issue |
12 |
Pages |
211-233 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000087661500018 |
Publication Date |
2002-07-26 |
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Abbreviated Series Title |
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Edition |
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ISSN |
0003-2700; 5206-882x |
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UA library record; WoS full record; WoS citing articles |
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Notes ![sorted by Notes field, ascending order (up)](img/sort_asc.gif) |
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Call Number |
UA @ admin @ c:irua:27850 |
Serial |
8774 |
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Author |
Van Grieken, R.E. |
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Title |
X-ray spectrometry |
Type |
H3 Book chapter |
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Year |
2000 |
Publication |
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Abbreviated Journal |
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Volume |
15 |
Issue |
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Pages |
13269-13443
T2 - Encyclopedia of analytical chemis |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Call Number |
UA @ admin @ c:irua:31650 |
Serial |
8775 |
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Author |
Fedina, L.; Lebedev, O.I.; Van Tendeloo, G.; van Landuyt, J.; Mironov, O.A.; Parker, E.H.C. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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Title |
In situ HREM irradiation study of point-defect clustering in MBE-grown strained Si1-xGex/(001)Si structures |
Type |
A1 Journal article |
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Year |
2000 |
Publication |
Physical review : B : condensed matter and materials physics |
Abbreviated Journal |
Phys Rev B |
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Volume |
61 |
Issue |
15 |
Pages |
10336-10345 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
We present a detailed analysis of the point-defect clustering in strained Si/Si(1-x)Ge(x)/(001)Si structures, including the interaction of the point defects with the strained interfaces and the sample surface during 400 kV electron irradiation at room temperature. Point-defect cluster formation is very sensitive to the type and magnitude of the strain in the Si and Si(1-x)Ge(x) layers. A small compressive strain (-0.3%) in the SiGe alloy causes an aggregation of vacancies in the form of metastable [110]-oriented chains. They are located on {113} planes and further recombine with interstitials. Tensile strain in the Si layer causes an aggregation of interstitial atoms in the forms of additional [110] rows which are inserted on {113} planes with [001]-split configurations. The chainlike configurations are characterized by a large outward lattice relaxation for interstitial rows (0.13 +/-0.01 nm) and a very small inward relaxation for vacancy chains (0.02+/-0.01 nm). A compressive strain higher than -0.5% strongly decreases point-defect generation inside the strained SiGe alloy due to the large positive value of the formation volume of a Frenkel pair. This leads to the suppression of point-defect clustering in a strained SiGe alloy so that SiGe relaxes via a diffusion of vacancies from the Si layer, giving rise to an intermixing at the Si/SiGe interface. In material with a 0.9% misfit a strongly increased flow of vacancies from the Si layer to the SiGe layer and an increased biaxial strain in SiGe bath promote the preferential aggregation of vacancies in the (001) plane, which relaxes to form intrinsic 60 degrees dislocation loops. |
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Wos |
000086606200082 |
Publication Date |
2002-07-27 |
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ISSN |
0163-1829;1095-3795; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
3.836 |
Times cited |
27 |
Open Access |
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Notes ![sorted by Notes field, ascending order (up)](img/sort_asc.gif) |
Conference Name: Microsc. Semicond. Mater. Conf. |
Approved |
Most recent IF: 3.836; 2000 IF: NA |
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Call Number |
UA @ lucian @ c:irua:103456 |
Serial |
1577 |
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Author |
Van Tendeloo, G.; Lebedev, O.I.; Amelinckx, S. |
![find record details (via OpenURL) openurl](img/xref.gif)
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Title |
Atomic and microstructure of CMR materials |
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A1 Journal article |
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Year |
2000 |
Publication |
Journal of magnetism and magnetic materials |
Abbreviated Journal |
J Magn Magn Mater |
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Volume |
211 |
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Pages |
73-83 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Amsterdam |
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000085772100013 |
Publication Date |
2002-07-25 |
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ISSN |
0304-8853; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.63 |
Times cited |
48 |
Open Access |
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Notes ![sorted by Notes field, ascending order (up)](img/sort_asc.gif) |
Iuap 4-10 |
Approved |
Most recent IF: 2.63; 2000 IF: 0.996 |
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Call Number |
UA @ lucian @ c:irua:54773 |
Serial |
165 |
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Author |
Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S.; Ju, H.L.; Krishnan, K.M. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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Title |
High-resolution electron microscopy study of strained epitaxial La0.7Sr0.3MnO3 thin films |
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A1 Journal article |
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Year |
2000 |
Publication |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
Abbreviated Journal |
Philos Mag A |
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Volume |
80 |
Issue |
3 |
Pages |
673-691 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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London |
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000085873500011 |
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2007-07-08 |
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0141-8610;1460-6992; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
52 |
Open Access |
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Notes ![sorted by Notes field, ascending order (up)](img/sort_asc.gif) |
IUAP 4-10; reprint |
Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:54751 |
Serial |
1456 |
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