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“Methodology for light element analysis of individual aerosol particles using thin-window EPMA”. Osán J, Ro C-U, Szalóki I, Worobiec A, de Hoog J, Joos P, Van Grieken R, Journal of aerosol science 31, 765 (2000)
Keywords: A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Optimisation of light element analysis of individual particles using UTW-EPMA”. de Hoog J, Osán J, Worobiec A, Ro C-U, Szalóki I, Joos P, Van Grieken R, Journal of aerosol science 31, 388 (2000)
Keywords: A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Quantification problems in light element determination by grazing emission X-ray fluorescence”. Kuczumow A, Claes M, Schmeling M, Van Grieken R, de Gendt S, Journal of analytical atomic spectrometry 15, 415 (2000). http://doi.org/10.1039/A908724I
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1039/A908724I
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“Quantitative characterisation of the leaching of lead and other elements from glazed surfaces of historical ceramics”. Szalóki I, Braun M, Van Grieken R, Journal of analytical atomic spectrometry 15, 843 (2000). http://doi.org/10.1039/B000746N
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1039/B000746N
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“Quantitative characterization of individual aerosol particles by thin-window electron probe microanalysis combined with iterative simulation”. Szalóki I, Osán J, Ro C-U, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 55, 1017 (2000). http://doi.org/10.1016/S0584-8547(00)00174-9
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0584-8547(00)00174-9
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“Sample preparation for X-ray fluorescence analysis”. Injuk J, Van Grieken R page 13338 (2000).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Single particle analysis of aerosols, observed in the marine boundary layer during the Monterey Area Ship Tracks Experiment (MAST), with respect to cloud droplet formation”. de Bock LA, Joos PE, Noone KJ, Pockalny RA, Van Grieken RE, Journal of atmospheric chemistry 37, 299 (2000). http://doi.org/10.1023/A:1006416600722
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1023/A:1006416600722
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“Single particle and inorganic characterization of rainwater collected above the North Sea”. Jambers W, Dekov V, Van Grieken R, The science of the total environment 256, 133 (2000). http://doi.org/10.1016/S0048-9697(00)00477-0
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0048-9697(00)00477-0
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“The size distribution and surface area of soot emitted by different sources”. Smekens A, Berghmans P, Van Grieken R, Journal of aerosol science 31, 706 (2000)
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Spectrometric determination of silicon in food and biological samples: an interlaboratory trial”. van Dyck K, Robberecht H, van Cauwenbergh R, Deelstra H, Arnaud J, Willemyns L, Benijts F, Centeno JA, Taylor H, Soares ME, Bastos ML, Ferreira MA, d'Haese PC, Lamberts LV, Hoenig M, Knapp G, Lugowski SJ, Moens L, Riondato J, Van Grieken R, Claes M, Verheyen R, Clement L, Uytterhoeven M, Journal of analytical atomic spectrometry 15, 735 (2000). http://doi.org/10.1039/B000572J
Abstract: Accuracy and precision of silicon determination in biological matrices (serum, urine, water, beer and spinach) by spectrometric techniques (when necessary after acid destruction) were assessed by means of a collaborative interlaboratory trial. The trial was set up in accordance with ISO 5725-2 (1994). The relative overall repeatability standard deviation was acceptable. It varied between 4% for spinach powder (mean content: 176 mg kg(-1)) and 11% for serum (mean content: 5.33 mg L-1). On the other hand, the relative overall between-laboratory standard deviation was found to vary from a satisfactorily 15% for spinach after destruction (mean content: 3.32 mg L-1) to an unacceptable 107% for spinach powder (mean content: 176 mg kg(-1)). The overall conclusion of the trial was that silicon determination in biological matrices can properly be performed by spectrometric techniques. However, when sample pretreatment (i.e., acid destruction) is needed prior to silicon determination problems still remain.
Keywords: A1 Journal article; Behavioural Ecology & Ecophysiology; Pathophysiology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1039/B000572J
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“Study of individual particle types and heavy metal deposition for North Sea aerosols using micro and trace analysis techniques”. Van Grieken R, Injuk J, de Bock L, van Malderen H page 105 (2000).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Unconventional microanalysis for low-Z, volatile and organic aerosol compounds”. Worobiec A, de Hoog J, Osán J, Szalóki I, Joos P, Van Grieken R, Journal of aerosol science 31, 384 (2000)
Keywords: A1 Journal article; Laboratory Experimental Medicine and Pediatrics (LEMP); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“X-ray spectrometry”. Szalóki I, Török SB, Ro C-U, Injuk J, Van Grieken RE, Analytical chemistry 72, 211 (2000). http://doi.org/10.1021/A1000018H
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1021/A1000018H
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“X-ray spectrometry”. Van Grieken RE page 13269 (2000).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“In situ HREM irradiation study of point-defect clustering in MBE-grown strained Si1-xGex/(001)Si structures”. Fedina L, Lebedev OI, Van Tendeloo G, van Landuyt J, Mironov OA, Parker EHC, Physical review : B : condensed matter and materials physics 61, 10336 (2000). http://doi.org/10.1103/PhysRevB.61.10336
Abstract: We present a detailed analysis of the point-defect clustering in strained Si/Si(1-x)Ge(x)/(001)Si structures, including the interaction of the point defects with the strained interfaces and the sample surface during 400 kV electron irradiation at room temperature. Point-defect cluster formation is very sensitive to the type and magnitude of the strain in the Si and Si(1-x)Ge(x) layers. A small compressive strain (-0.3%) in the SiGe alloy causes an aggregation of vacancies in the form of metastable [110]-oriented chains. They are located on {113} planes and further recombine with interstitials. Tensile strain in the Si layer causes an aggregation of interstitial atoms in the forms of additional [110] rows which are inserted on {113} planes with [001]-split configurations. The chainlike configurations are characterized by a large outward lattice relaxation for interstitial rows (0.13 +/-0.01 nm) and a very small inward relaxation for vacancy chains (0.02+/-0.01 nm). A compressive strain higher than -0.5% strongly decreases point-defect generation inside the strained SiGe alloy due to the large positive value of the formation volume of a Frenkel pair. This leads to the suppression of point-defect clustering in a strained SiGe alloy so that SiGe relaxes via a diffusion of vacancies from the Si layer, giving rise to an intermixing at the Si/SiGe interface. In material with a 0.9% misfit a strongly increased flow of vacancies from the Si layer to the SiGe layer and an increased biaxial strain in SiGe bath promote the preferential aggregation of vacancies in the (001) plane, which relaxes to form intrinsic 60 degrees dislocation loops.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 27
DOI: 10.1103/PhysRevB.61.10336
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“Atomic and microstructure of CMR materials”. Van Tendeloo G, Lebedev OI, Amelinckx S, Journal of magnetism and magnetic materials 211, 73 (2000). http://doi.org/10.1016/S0304-8853(99)00716-7
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.63
Times cited: 48
DOI: 10.1016/S0304-8853(99)00716-7
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“High-resolution electron microscopy study of strained epitaxial La0.7Sr0.3MnO3 thin films”. Lebedev OI, Van Tendeloo G, Amelinckx S, Ju HL, Krishnan KM, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 80, 673 (2000). http://doi.org/10.1080/01418610008212075
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 52
DOI: 10.1080/01418610008212075
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