“Ge40.0Te5.3I8: synthesis, crystal structure, and properties of a new clathrate-I compound”. Kovnir KA, Abramchuk NS, Zaikina JV, Baitinger M, Burkhardt U, Schnelle W, Olenev AV, Lebedev OI, Van Tendeloo G, Dikarev EV, Shevelkov AV, Zeitschrift für Kristallographie 221, 527 (2006). http://doi.org/10.1524/zkri.2006.221.5-7.527
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.179
Times cited: 16
DOI: 10.1524/zkri.2006.221.5-7.527
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“Highly disordered crystal structure and thermoelectric properties of Sn3P4”. Zaikina JV, Kovnir KA, Sobolev AN, Presniakov IA, Kytin VG, Kulbachinskii VA, Olenev AV, Lebedev OI, Van Tendeloo G, Dikarev EV, Shevelkov AV, Chemistry of materials 20, 2476 (2008). http://doi.org/10.1021/cm702655g
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 9.466
Times cited: 33
DOI: 10.1021/cm702655g
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“Cationic clathrate of type-III Ge172-xPxTey (y\approx21,5, x\approx2y) : synthesis, crystal structure and thermoelectric properties”. Kirsanova MA, Mori T, Maruyama S, Abakumov AM, Van Tendeloo G, Olenev A, Shevelkov AV, Inorganic chemistry 52, 8272 (2013). http://doi.org/10.1021/ic401203r
Abstract: A first germanium-based cationic clathrate of type-III, Ge129.3P42.7Te21.53, was synthesized and structurally characterized (space group P42/mnm, a = 19.948(3) Å, c = 10.440(2) Å, Z = 1). In its crystal structure, germanium and phosphorus atoms form three types of polyhedral cages centered with Te atoms. The polyhedra share pentagonal and hexagonal faces to form a 3D framework. Despite the complexity of the crystal structure, the Ge129.3P42.7Te21.53 composition corresponds to the Zintl counting scheme with a good accuracy. Ge129.3P42.7Te21.53 demonstrates semiconducting/insulating behavior of electric resistivity, high positive Seebeck coefficient (500 μV K1 at 300 K), and low thermal conductivity (<0.92 W m1 K1) within the measured temperature range.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 4.857
Times cited: 3
DOI: 10.1021/ic401203r
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“Extension of the clathrate family : the type X clathrate Ge79P29S18Te6”. Kirsanova MA, Olenev AV, Abakumov AM, Bykov MA, Shevelkov AV, Angewandte Chemie: international edition in English 50, 2371 (2011). http://doi.org/10.1002/anie.201007483
Abstract: Now they are 10! The title compound displays a new type of crystal structure and is labeled clathrate X according to the general classification of clathrate structures. In contrast to typical clathrates, this compound has three-coordinate atoms within the framework and combines distorted 24-vertex polyhedra (see picture, green) centered around tellurium guest atoms with very irregular 10-vertex polyhedra around sulfur atoms (yellow).
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 11.994
Times cited: 23
DOI: 10.1002/anie.201007483
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“Semiclathrates of the GePTe system : synthesis and crystal structures”. Kirsanova MA, Reshetova LN, Olenev AV, Abakumov AM, Shevelkov AV, Chemistry: a European journal 17, 5719 (2011). http://doi.org/10.1002/chem.201003553
Abstract: Novel compounds [Ge46−xPx]Tey (13.9≤x≤15.6, 5.92≤y≤7.75) with clathrate-like structures have been prepared and structurally characterized. They crystallize in the space group Fmequation image with the unit cell parameter changing from 20.544(2) to 20.698(2) Å (Z=8) on going from x=13.9 to x=15.6. Their crystal structure is composed of a covalently bonded Ge[BOND]P framework that hosts tellurium atoms in the guest positions and can be viewed as a peculiar variant of the type I clathrate superstructure. In contrast to the conventional type I clathrates, [Ge46−xPx]Tey contain tricoordinated (3b) atoms and no vacancies in the framework positions. As a consequence of the transformation of the framework, the majority of the guest tellurium atoms form a single covalent bond with the host framework and thus the title compounds are the first representative of semiclathrates with covalent bonding. A comparison is made with silicon clathrates and the evolution of the crystal structure upon changing the tellurium content is discussed.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 5.317
Times cited: 17
DOI: 10.1002/chem.201003553
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“Synthesis, structure, and transport properties of type-I derived clathrate Ge46-xPxSe8-y (x=15.4(1), y=0-2.65) with diverse host-guest bonding”. Kirsanova MA, Mori T, Maruyama S, Matveeva, Batuk D, Abakumov AM, Gerasimenko AV, Olenev AV, Grin Y, Shevelkov AV, Inorganic chemistry 52, 577 (2013). http://doi.org/10.1021/ic3011025
Abstract: A first clathrate compound with selenium guest atoms, [Ge46-xPx]Se8-y square(y) (x = 15.4(1); y = 0-2.65; square denotes a vacancy), was synthesized as a single-phase and structurally characterized. It crystallizes in the space group Fm (3) over bar with the unit cell parameter a varying from 20.310(2) to 20.406(2) angstrom and corresponding to a 2 x 2 x 2 supercell of a usual clathrate-I structure. The superstructure is formed due to the symmetrical arrangement of the three-bonded framework atoms appearing as a result of the framework transformation of the parent clathrate-I structure. Selenium guest atoms occupy two types of polyhedral cages inside the positively charged framework; all selenium atoms in the larger cages form a single covalent bond with the framework atoms, relating the title compounds to a scanty family of semiclathrates. According to the measurements of electrical resistivity and Seebeck coefficient, [Ge46-xPx]Se8-y square(y) is an n-type semiconductor with E-g = 0.41 eV for x = 15.4(1) and y = 0; it demonstrates the maximal thermoelectric power factor of 2.3 x 10(-5) W K-2 m(-1) at 660 K.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 4.857
Times cited: 14
DOI: 10.1021/ic3011025
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“Sn20.5-3.5As22I8: a largely disordered cationic clathrate with a new type of superstructure and abnormally low thermal conductivity”. Zaikina JV, Kovnir KA, Sobolev AV, Presniakov IA, Prots Y, Baitinger M, Schnelle W, Olenev AV, Lebedev OI, Van Tendeloo G, Grin Y, Shevelkov AV, Chemistry: a European journal 13, 5090 (2007). http://doi.org/10.1002/chem.200601772
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 5.317
Times cited: 44
DOI: 10.1002/chem.200601772
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