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Author | Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. | ||||
Title | Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling | Type | P3 Proceeding | ||
Year | 2000 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | 213-216 | ||
Keywords | P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Elsevier | Place of Publication | Amsterdam | Editor | |
Language | Wos | Publication Date | 0000-00-00 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record | ||
Impact Factor | Times cited | Open Access | |||
Notes | Approved | Most recent IF: NA | |||
Call Number | UA @ lucian @ c:irua:34081 | Serial | 353 | ||
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