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Title
Year
Publication
Volume
Times cited
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Schryvers, D.
;
Salje, E.K.H.
;
Nishida, M.
;
De Backer, A.
;
Idrissi, H.
;
Van Aert, S.
Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations
2017
Ultramicroscopy
176
1
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