toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
List View
 |   | 
   print
  Author Title Year Publication Volume Times cited Additional Links Links
Lenaerts, J.; Gijbels, R.; van Vaeck, L.; Verlinden, G.; Geuens, I. Imaging TOF-SIMS for the surface analysis of silver halide microcrystals 2003 Applied surface science 203/204 7 UA library record; WoS full record; WoS citing articles doi
Coghe, F.; Tirry, W.; Rabet, L.; Schryvers, D.; Van Houtte, P. Importance of twinning in static and dynamic compression of a Ti-6Al-4V titanium alloy with an equiaxed microstructure 2012 Materials science and engineering: part A: structural materials: properties, microstructure and processing 537 35 UA library record; WoS full record; WoS citing articles pdf doi
Berdiyorov, G.R.; Savel'ev, S.E.; Kusmartsev, F.V.; Peeters, F.M. In-phase motion of Josephson vortices in stacked SNS Josephson junctions : effect of ordered pinning 2013 Superconductor science and technology 26 5 UA library record; WoS full record; WoS citing articles pdf doi
Tirry, W.; Schryvers, D. In situ transmission electron microscopy of stress-induced martensite with focus on martensite twinning 2008 Materials science and engineering: part A: structural materials: properties, microstructure and processing 481 22 UA library record; WoS full record; WoS citing articles pdf doi
Jehanathan, N.; Georgieva, V.; Saraiva, M.; Depla, D.; Bogaerts, A.; Van Tendeloo, G. The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg―Y―O thin films 2011 Thin solid films : an international journal on the science and technology of thin and thick films 519 4 UA library record; WoS full record; WoS citing articles pdf doi
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. The influence of crystal thickness on the image tone 2003 Journal of imaging science 47 UA library record; WoS full record; WoS citing articles
Bogaerts, A.; Naylor, J.; Hatcher, M.; Jones, W.J.; Mason, R. Influence of sticking coefficients on the behavior of sputtered atoms in an argon glow discharge: modeling and comparison with experiment 1998 Journal of vacuum science and technology: A: vacuum surfaces and films 16 12 UA library record; WoS full record; WoS citing articles doi
Mahieu, S.; Ghekiere, P.; de Winter, G.; Depla, D.; de Gryse, R.; Lebedev, O.I.; Van Tendeloo, G. Influence of the Ar/O2 ratio on the growth and biaxial alignment of yttria stabilized zirconia layers during reactive unbalanced magnetron sputtering 2005 Thin solid films : an international journal on the science and technology of thin and thick films 484 23 UA library record; WoS full record; WoS citing articles pdf doi
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Bollen, D.; de Keyzer, R.; van Roost, C. Influence of twinning on the morphology of AgBr and AgCl microcrystals 2001 The journal of imaging science and technology 45 UA library record; WoS full record; WoS citing articles
Helm, M.; Peeters, F.M.; DeRosa, F.; Colas, E.; Harbison, J.P.; Florez, L.T. Infrared spectroscopy of subbands, minibands, and donors in GaAs/AlGaAs superlatices 1992 Surface science 263 5 UA library record; WoS full record; WoS citing articles
Helm, M.; Peeters, F.M.; de Rosa, F.; Colas, E.; Harbison, J.P.; Florez, L.T. Infrared-spectroscopy of subbands, minibands, and donors in GaAs/AlGaAs superlattices 1992 Surface science : a journal devoted to the physics and chemistry of interfaces T2 – 9TH INTERNATIONAL CONF ON THE ELECTRONIC PROPERTIES OF TWO-DIMENSIONAL, SYSTEMS ( EP2DS-9 ) / 5TH INTERNATIONAL CONF ON MODULATED SEMICONDUCTOR, STRUCTURES ( MSS-5 ), JUL 263 5 UA library record; WoS full record; WoS citing articles pdf doi
Ignatova, V.A.; Möller, W.; Conard, T.; Vandervorst, W.; Gijbels, R. Interpretation of TOF-SIMS depth profiles from ultrashallow high-k dielectric stacks assisted by hybrid collisional computer simulation 2005 Applied physics A : materials science & processing 81 4 UA library record; WoS full record; WoS citing articles doi
Veljkovic, D.; Tadić, M.; Peeters, F.M. Intersublevel absorption in stacked n-type doped self-assembled quantum dots 2005 Materials science forum 494 UA library record; WoS full record;
Saeed, A.; Khan, A.W.; Shafiq, M.; Jan, F.; Abrar, M.; Zaka-ul-Islam, M.; Zakaullah, M. Investigation of 50 Hz pulsed DC nitrogen plasma with active screen cage by trace rare gas optical emission spectroscopy 2014 Plasma science & technology 16 5 UA library record; WoS full record; WoS citing articles pdf doi
de Bleecker, K.; Bogaerts, A.; Goedheer, W.; Gijbels, R. Investigation of growth mechanisms of clusters in a silane discharge with the use of a fluid model 2004 IEEE transactions on plasma science 32 29 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Gijbels, R. The ion- and atom-induced secondary electron emission yield: numerical study for the effect of clean and dirty cathode surfaces 2002 Plasma sources science and technology 11 51 UA library record; WoS full record; WoS citing articles doi
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks 2003 Applied surface science 203 15 UA library record; WoS full record; WoS citing articles doi
Pereira, J.M.; Peeters, F.M.; Chaves, A.; Farias, G.A. Klein tunneling in single and multiple barriers in graphene 2010 Semiconductor science and technology 25 83 UA library record; WoS full record; WoS citing articles pdf doi
Teodorescu, V.S.; Mihailescu, I.N.; Dinescu, M.; Chitica, N.; Nistor, L.C.; van Landuyt, J.; Barborica, A. Laser induced phase transition in iron thin films 1994 Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation 4 2 UA library record; WoS full record; WoS citing articles doi
Floros, N.; Hervieu, M.; Van Tendeloo, G.; Michel, C.; Maignan, A.; Raveau, B. The layered manganate Sr4-xBaxMn3O10: synthesis, structural and magnetic properties 2000 Solid state sciences 2 29 UA library record; WoS full record; WoS citing articles doi
Malakho, A.P.; Morozov, V.A.; Pokholok, K.V.; Lazoryak, B.I.; Van Tendeloo, G. Layered ordering of vacancies of lead iron phosphate Pb3Fe2(PO4)4 2005 Solid state sciences 7 7 UA library record; WoS full record; WoS citing articles pdf doi
Hadermann, J.; Abakumov, A.M.; Nikolaev, I.V.; Antipov, E.V.; Van Tendeloo, G. Local structure of perovskite-based “Pb2Fe2O5 2008 Solid state sciences 10 29 UA library record; WoS full record; WoS citing articles doi
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; de Keyzer, R. Long period surface ordering of iodine ions in mixed tabular AgBr-AgBrI microcrystals 1995 Surface science : a journal devoted to the physics and chemistry of interfaces 337 10 UA library record; WoS full record; WoS citing articles doi
Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A. Low- or high-angle Ar ion-beam etching to create ramp-type Josephson junctions 1996 Superconductor science and technology 9 10 UA library record; WoS full record; WoS citing articles pdf doi
Kong, M.; Ferreira, W.P.; Partoens, B.; Peeters, F.M. Magnetic field dependence of the normal mode spectrum of a planar complex plasma cluster 2004 IEEE transactions on plasma science 32 4 UA library record; WoS full record; WoS citing articles doi
Blom, F.A.P.; Peeters, F.M.; van de Zanden, K.; van Hove, M. Magneto-oscillations of the gate current in a laterally modulated two-dimensional electron gas 1996 Surface science : a journal devoted to the physics and chemistry of interfaces 361/362 1 UA library record; WoS full record; WoS citing articles doi
Partoens, B.; Matulis, A.; Peeters, F.M. Magnetoplasma excitations in vertically coupled quantum dot systems 1999 Materials science forum 297/298 UA library record; WoS full record;
Schryvers, D.; Holland-Moritz, D. Martensitic transformations and microstructures in splat-cooled Ni-Al 1999 Materials science and engineering: part A: structural materials: properties, microstructure and processing 273/275 6 UA library record; WoS full record; WoS citing articles doi
Hendrich, C.; Favre, L.; Ievlev, D.N.; Dobrynin, A.N.; Bras, W.; Hörmann, U.; Piscopiello, E.; Van Tendeloo, G.; Lievens, P.; Temst, K. Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering 2007 Applied physics A : materials science & processing 86 11 UA library record; WoS full record; WoS citing articles doi
Schryvers, D.; Tirry, W.; Yang, Z.Q.; Measuring strain fields and concentration gradients around Ni4Ti3 precipitates 2006 Materials science and engineering A: structural materials properties microstructure and processing 438 35 UA library record; WoS full record; WoS citing articles pdf doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: