Record |
Author |
Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. |
Title |
Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range |
Type |
A1 Journal article |
Year |
2006 |
Publication |
Physical review letters |
Abbreviated Journal |
Phys Rev Lett |
Volume |
96 |
Issue |
9 |
Pages |
096106,1-4 |
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
Abstract |
The local structure of Bi4W2/3Mn1/3O8Cl is determined using quantitative transmission electron microscopy. The electron exit wave, which is closely related to the projected crystal potential, is reconstructed and used as a starting point for statistical parameter estimation. This method allows us to refine all atomic positions on a local scale, including those of the light atoms, with a precision in the picometer range. Using this method one is no longer restricted to the information limit of the electron microscope. Our results are in good agreement with x-ray powder diffraction data demonstrating the reliability of the method. Moreover, it will be shown that local effects can be interpreted using this approach. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
New York, N.Y. |
Editor |
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Language ![sorted by Language field, ascending order (up)](img/sort_asc.gif) |
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Wos |
000235905700042 |
Publication Date |
2006-03-10 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0031-9007;1079-7114; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
8.462 |
Times cited |
69 |
Open Access |
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Notes |
Fwo; Iap V |
Approved |
Most recent IF: 8.462; 2006 IF: 7.072 |
Call Number |
UA @ lucian @ c:irua:56977 |
Serial |
3154 |
Permanent link to this record |