| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Raveau, B.; Hervieu, M.; Michel, C.; Martin, C.; Maignan, A.; Van Tendeloo, G. |
Crystal chemistry of mercury based layered cuprates and oxycarbonates |
1995 |
|
|
|
UA library record |
|
|
|
Lebedev, O.; Van Tendeloo, G.; Marezio, M.; Licci, F.; Gilioli, E.; Gauzzi, A.; Prodi, A. |
The crystal structure of YSr2Cu3O6+x determined by HREM |
2002 |
|
|
|
UA library record |
|
|
|
Colomer, J.-F.; Van Tendeloo, G. |
Electron diffraction and microscopy of single-walled carbon nanotube bundles |
2003 |
|
|
|
UA library record |
|
|
|
Amelinckx, S.; Nistor, L.C.; Van Tendeloo, G. |
Electron microscopic study of long period ordering in complex oxides |
1994 |
|
|
|
UA library record |
|
|
|
Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of fullerenes and related materials |
2000 |
|
|
|
UA library record |
|
|
|
Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J. |
Electron microscopy of interfaces in new materials |
1991 |
|
|
|
UA library record |
|
|
|
Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of C60 and C70 fullerites |
1993 |
|
|
|
UA library record |
|
|
|
van Landuyt, J. |
High resolution electron microscopy for materials |
1992 |
|
|
7 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Landuyt, J.; Vanhellemont, J. |
High-resolution electron microscopy for semiconducting materials science |
1994 |
|
|
|
UA library record |
|
|
|
Van Tendeloo, G.; Krekels, T. |
Identification of new superconducting compounds by electron microscopy |
2000 |
|
|
|
UA library record |
|
|
|
Goessens, C.; Schryvers, D.; de Keyzer, R.; van Landuyt, J. |
In situ HREM study of electron irradiation effects in AgCl microcrystals |
1992 |
|
|
|
UA library record |
|
|
|
Schuddinck, W.; Van Tendeloo, G.; Martin, C.; Hervieu, M.; Raveau, B. |
Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3 |
2000 |
|
|
|
UA library record |
|
|
|
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation |
1997 |
|
|
|
UA library record |
|
|
|
de Hosson, J.T.M.; Van Tendeloo, G. |
Metals and alloys |
1997 |
|
|
|
UA library record |
|
|
|
Schryvers, D.; Van Tendeloo, G. |
Metals and alloys: 2: phase transformations |
1997 |
|
|
|
UA library record |
|
|
|
van Landuyt, J.; Kuypers, S.; van Heurck, C.; Van Tendeloo, G.; Amelinckx, S. |
Methods of structural analysis of modulated structures and quasicrystals |
1993 |
|
|
|
UA library record |
|
|
|
Van Tendeloo, G.; Krekels, T.; Amelinckx, S. |
Micro-structure of fullerites and high Tc superconductors |
1992 |
|
|
|
UA library record |
|
|
|
van Landuyt, J.; van Bockstael, M.H.G.; van Royen, J. |
Microscopy of gemmological materials |
1997 |
|
|
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Seo, J.W.; Perret, J.; Fompeyrine, J.; Van Tendeloo, G.; Loquet, J.-P. |
Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE |
1998 |
|
|
|
UA library record; WoS full record; |
|
|
|
Schryvers, D. |
Multiply twinned phases and microstructures in Ni-Al: a transmission electron microscopy study |
1991 |
|
|
|
UA library record |
|
|
|
Mitchell, T.E.; Gronsky, R.; Van Tendeloo, G. |
Oxide superconductors: electron microscopy |
1992 |
|
|
|
UA library record |
|
|
|
Vlasov, I.I.; Turner, S.; Van Tendeloo, G.; Shiryaev, A.A. |
Recent results on characterization of detonation nanodiamonds |
2012 |
|
|
|
UA library record |
|
|
|
Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S. |
Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM |
2000 |
|
|
|
UA library record |
|
|
|
Lebedev, O.; Verbeeck, J.; Van Tendeloo, G.; Shapoval, O.; Belenchuk, A.; Moshnyaga, V.; Damaschke, B.; Samwer, K. |
Structural phase transition in (La0.67Ca0.33MnO3)1-x: (MgO)x composite film |
2002 |
|
|
|
UA library record |
|
|
|
de Hosson, J.T.M.; Van Tendeloo, G. |
Superconducting ceramics |
1997 |
|
|
|
UA library record |
|
|
|
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
High resolution electron microscopy from imaging towards measuring |
2001 |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
|
|
UA library record |
|
|
|
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Atom column detection |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
|
|
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
Atom counting |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
|
|
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
General conclusions and future perspectives |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
|
|
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
Image-quality evaluation and model selection with maximum a posteriori probability |
2021 |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
|
|
UA library record |
|
